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64Mb Synchronous DRAM Specification: P2V64S40ETP

This document provides specifications for the P2V64S40ETP 64Mb synchronous DRAM from Deutron Electronics Corp. The DRAM has a density of 67,108,864 bits organized as 4 banks of 1,048,576 words by 16 bits. It uses a 3.3V power supply and supports burst read, single write operations with programmable CAS latency, burst length, and burst type. The device has a 54-pin TSOPII package and is rated for maximum frequencies of 200MHz, 166MHz, or 143MHz depending on the specific part number.

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0% found this document useful (0 votes)
91 views37 pages

64Mb Synchronous DRAM Specification: P2V64S40ETP

This document provides specifications for the P2V64S40ETP 64Mb synchronous DRAM from Deutron Electronics Corp. The DRAM has a density of 67,108,864 bits organized as 4 banks of 1,048,576 words by 16 bits. It uses a 3.3V power supply and supports burst read, single write operations with programmable CAS latency, burst length, and burst type. The device has a 54-pin TSOPII package and is rated for maximum frequencies of 200MHz, 166MHz, or 143MHz depending on the specific part number.

Uploaded by

Jeferson Andrade
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© © All Rights Reserved
We take content rights seriously. If you suspect this is your content, claim it here.
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Download as PDF, TXT or read online on Scribd
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64Mb Synchronous DRAM Specification

P2V64S40ETP

Deutron Electronics Corp.


8F, 68, SEC. 3, NANKING E. RD., TAIPEI 104,
TAIWAN, R. O. C.
TEL : 886-2-2517-7768
FAX : 886-2-2517-4575
http: // www.deutron.com.tw
64Mb Synchronous DRAM
P2V64S40ETP (4-bank x 1,048,576-word x 16-bit)

General Description
The P2V64S40ETP is 67,108,864 bits synchronous high data rate Dynamic RAM organized as 4 x 1,048,576 words by
16 bits. Synchronous design allows precise cycle controls with the use of system clock I/O transactions are possible on
every clock cycle. Range of operating frequencies, programmable burst length and programmable latencies allow the same
device to be useful for a variety of high bandwidth, high performance memory system applications.

Features
• 3.3V power supply • All inputs are sampled at the positive going
• LVTTL compatible with multiplexed address edge of the system clock
• Four banks operation • Auto & self refresh
• MRS cycle with address key programs • 64ms refresh period (4K cycle)
- CAS latency (2 & 3) • Burst read single write operation
- Burst length (1, 2, 4, 8 & Full page) • LDQM & UDQM for masking
- Burst type (Sequential & Interleave)

Pin Configurations 54Pin TSOPII (400mil x 875mil)


Part No. Max. Frequency Supply Voltage
P2V64S40ETP-G5 200MHz (CL=3) 3.3V
P2V64S40ETP-G6 166MHz (CL=3) 3.3V
P2V64S40ETP-G7 143MHz (CL=3) 3.3V
G: Lead Free Package

Ordering Information

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64Mb Synchronous DRAM
P2V64S40ETP (4-bank x 1,048,576-word x 16-bit)

Pin Descriptions

SYMBOL TYPE DESCRIPTION

Clock: CLK is driven by the system clock. All SDRAM input signals are sampled on the positive
CLK Input edge of CLK. CLK also increments the internal burst counter and controls the output registers.

Clock Enable: CKE activates (HIGH) and deactivates (LOW) the CLK signal. Deactivating the
clock provides PRECHARGE POWER-DOWN and SELF REFRESH operation (all banks idle),
ACTIVE POWER-DOWN (row active in any bank), DEEP POWER DOWN (all banks idle), or
CLOCK SUSPEND operation (burst/access in progress). CKE is synchronous except after the
CKE Input device enters power-down and self refresh modes, where CKE becomes asynchronous until
after exiting the same mode. The input buffers, including CLK, are disabled during power-down
and self refresh modes, providing low standby power. CKE may be tied HIGH.

Chip Select: /CS enables (registered LOW) and disables (registered HIGH) the command
decoder. All commands are masked when /CS is registered HIGH. /CS provides for external
/CS Input bank selection on systems with multiple banks. /CS is considered part of the command code.

/CAS, Command Inputs: /CAS, /RAS, and /WE (along with /CS) define the command being entered.
/RAS, Input
/WE
Input/Output Mask: DQM is sampled HIGH and is an input mask signal for write accesses and an
output enable signal for read accesses. Input data is masked during a WRITE cycle. The output
LDQM, buffers are placed in a High-Z state (two-clock latency) when during a READ cycle. LDQM
Input corresponds to DQ0–DQ7, UDQM corresponds to DQ8–DQ15. LDQM and UDQM are
UDQM,
considered same state when referenced as DQM.

Bank Address Input(s): BA0 and BA1 define to which bank the ACTIVE, READ, WRITE or
PRECHARGE command is being applied. These pins also select between the mode register and
BA0, BA1 Input the extended mode register.

Address Inputs: A0–A11 are sampled during the ACTIVE command (row address A0–A11) and
READ/WRITE command (column-address A0–A7; with A10 defining auto precharge) to select
one location out of the memory array in the respective bank. A10 is sampled during a
A0–A11 Input PRECHARGE command to determine if all banks are to be precharged (A10 HIGH) or bank
selected by BA0, BA1 (LOW). The address inputs also provide the op-code during a LOAD
MODE REGISTER command.

Data Input/Output: Data bus.


DQ0–DQ15 I/O
Internally Not Connected: These could be left unconnected, but it is recommended they be
NC – connected or VSS.

DQ Power: Provide isolated power to DQs for improved noise immunity.


VDDQ Supply
DQ Ground: Provide isolated ground to DQs for improved noise immunity.
VSSQ Supply
Core Power Supply.
VDD Supply
Ground.
VSS Supply

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64Mb Synchronous DRAM
P2V64S40ETP (4-bank x 1,048,576-word x 16-bit)

ABSOLUTE MAXIMUM RATINGS


Parameter Symbol Value Unit

Voltage on any pin relative to Vss VIN,VOUT -1.0 ~ 4.6 V

Voltage on VDD supply relative to Vss VDD, VDDQ -1.0 ~ 4.6 V

Storage temperature TSTG -55 ~ +150 °C

Power dissipation PD 1.0 W

Short circuit current IOS 50 mA

NOTES:
Permanent device damage may occur if ABSOLUTE MAXIMUM RATINGS are exceeded.
Functional operation should be restricted to recommended operating condition.
Exposure to higher than recommended voltage for extended periods of time could affect device reliability.

DC OPERATING CONDITIONS
Recommended operating conditions (Voltage referenced to VSS = 0V, TA = -25 to 85°C for Extended, 0 to 70°C for Commercial)

Parameter Symbol Min Typ Max Unit Note

VDD 3.0 3.3 3.6 V


Supply voltage
VDDQ 3.0 3.3 3.6 V

Input logic high voltage VIH 2.0 VDDQ + 0.3 V 1

Input logic low voltage VIL -0.3 0 0.8 V 2

Output logic high voltage VOH 2.4 - - V IOH = -0.1mA

Output logic low voltage VOL - - 0.4 V IOL = 0.1mA

Input leakage current ILI -5 - 5 uA 3

Output leakage current IoL -5 - 5 uA 3

Note:
1. VIH(max) = 4.6V AC for pulse width ≤ 10ns acceptable.
2. VIL(min) = -1.5V AC for pulse width ≤ 10ns acceptable.
3. Any input 0V ≤ VIN ≤ VDD + 0.3V, all other pins are not under test = 0V.
4. Dout is disabled , 0V ≤ VOUT ≤ VDD.

CAPACITANCE ( Vdd =3.3V, TA = 23°C, f = 1MHz, Vref = 0.9V ± 50mV)

Parameter Symbol Min Max Unit Note

Clock Cclk 2.0 4.0 pF

/CAS,/RAS,/WE,/CS,CKE,L/UDQM Cin 2.0 4.0 pF

Address CADD 2.0 4.0 pF

DQ0~DQ15 COUT 3.0 6.0 pF

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64Mb Synchronous DRAM
P2V64S40ETP (4-bank x 1,048,576-word x 16-bit)

DC CHARACTERISTICS
Recommended operating conditions (Voltage referenced to VSS = 0V, TA = -25 to 85°C for Extended, 0 to 70°C for Commercial)
Version
Parameter Symbol Test Condition Unit Note
-5 -6 -7

Burst length = 1
Operating Current
ICC1 tRC ≧ tRC(min) 80 70 60 mA 1
(One Bank Active)
IO = 0 mA

ICC2P CKE ≦ VIL(max), tCC = 10ns 2 2 2


Precharge Standby Current in
mA
power-down mode
ICC2PS CKE & CLK ≦ VIL(max), tCC = ∞ 1 1 1

CKE ≧ VIH(min), CS ≧ VIH(min), tCC = 10ns


ICC2N Input signals are changed one time during 10 10 10
Precharge Standby Current 20ns
mA
in non power-down mode
CKE ≧ VIH(min), CLK ≦ VIL(max), tCC = ∞
ICC2NS 15 15 15
Input signals are stable

ICC3P CKE ≦ VIL(max), tCC = 10ns 10 10 10


Active Standby Current mA
in power-down mode
ICC3PS CKE & CLK ≦ VIL(max), tCC = ∞ 10 10 10

CKE ≧ VIH(min), CS ≧ VIH(min), tCC = 10ns


ICC3N Input signals are changed one time during 30 25 20
Active Standby Current 20ns
in non power-down mode mA
(One Bank Active)
CKE ≧ VIH(min), CLK ≦ VIL(max), tCC = ∞
ICC3NS 10 10 10
Input signals are stable

IO = 0 mA
Operating Current Page burst
ICC4 100 90 80 mA 1
(Burst Mode) 4Banks Activated
tCCD = 2CLKs

Refresh Current ICC5 tARFC ≧ tARFC(min) 150 130 110 mA 2

Self Refresh Current ICC6 CKE ≦ 0.2V 1.5 1.5 1.5 mA

NOTES:
1. Measured with outputs open.
2. Refresh period is 64ms.
3. Unless otherwise noted, input swing IeveI is CMOS(VIH /VIL=VDDQ/VSSQ).

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64Mb Synchronous DRAM
P2V64S40ETP (4-bank x 1,048,576-word x 16-bit)

AC OPERATING TEST CONDITIONS(VDD = 3.3V, TA = -25 to 85°C for Extended, 0 to 70°C for Commercial)
Parameter Value Unit

AC input levels (Vih/Vil) 2.4 / 0.4 V

Input timing measurement reference level 1.4 V

Input rise and fall time tr/tf = 1/1 ns

Output timing measurement reference level 1.4 V

Output load condition See Figure 2

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64Mb Synchronous DRAM
P2V64S40ETP (4-bank x 1,048,576-word x 16-bit)

OPERATING AC PARAMETER
(AC operating conditions unless otherwise noted)

Version
Parameter Symbol Unit Note
-5 -6 -7

Row active to row active delay tRRD(min) 10 12 14 ns 1

RAS to CAS delay tRCD(min) 15 18 21 ns 1

Row precharge time tRP(min) 15 18 21 ns 1

tRAS(min) 40 42 ns 1
Row active time
tRAS(max) 100 100 100 us

Row cycle time tRC(min) 58 63 ns 1

Last data in to row precharge tRDL(min) 2 2 2 CLK 2

Last data in to Active delay tDAL(min) -

Last data in to new col. address delay tCDL(min) 1 1 1 CLK 2

Last data in to burst stop tBDL(min) 1 1 1 CLK 2

Auto refresh cycle time tARFC(min) 60 70 ns

NOTES:
1. The minimum number of clock cycles is determined by dividing the minimum time required with clock cycle time and then rounding off to the next
higher integer.
2. Minimum delay is required to complete write.

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64Mb Synchronous DRAM
P2V64S40ETP (4-bank x 1,048,576-word x 16-bit)

AC CHARACTERISTICS(AC operating conditions unless otherwise noted)


-5 -6 -7
Parameter Symbol Unit Note
Min Max Min Max Min Max

CAS latency=3 tCC (3) 5 6 7


CLK cycle time ns 1
CAS latency=2 tCC (2) 10 10 10

CAS latency=3 tSAC (3) 5 6


CLK to valid output delay ns 1,2
CAS latency=2 tSAC (2) 6 6

CAS latency=3 tOH (3) 2.5 3


Output data hold time ns 2
CAS latency=2 tOH (2) 3 3

CLK high pulse width tCH 2.5 3 ns 3

CLK low pulse width tCL 2.5 3 ns 3

Input setup time tSS 1.5 2 ns 3

Input hold time tSH 1 1 ns 3

CLK to output in Low-Z tSLZ 1 1 ns 2

CAS latency=3 5 6
CLK to output in Hi-Z tSHZ ns
CAS latency=2 6 6

NOTES :
1. Parameters depend on programmed CAS latency.
2. If clock rising time is longer than 1ns, (tr/2-0.5)ns should be added to the parameter.
3. Assumed input rise and fall time (tr & tf) = 1ns.
If tr & tf is longer than 1ns, transient time compensation should be considered,
i.e., [(tr + tf)/2-1]ns should be added to the parameter.

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64Mb Synchronous DRAM
P2V64S40ETP (4-bank x 1,048,576-word x 16-bit)

TRUTH TABLE

Command Truth Table


A10/ A11,
COMMAND Symbol CKEn-1 CKEn /CS /RAS /CAS /WE BA1 BA0
AP A9 ~ A0
Device deselect DSL H X H X X X X X X X
No operation NOP H X L H H H X X X X
Burst stop BST H H L H H L X X X X
Read RD H X L H L H V V L V
Read with auto precharge RDA H X L H L H V V H V
Write WR H X L H L L V V L V
Write with auto precharge WRA H X L H L L V V H V
Bank activate ACT H X L L H H V V V V
Precharge select bank PRE H X L L H L V V L X
Precharge all banks PALL H X L L H L X X H X
Mode register set MRS H X L L L L L L L X
Extended mode register set EMRS H X L L L L H L L V
(V=Valid, X=Don′t Care, H=Logic High, L=Logic Low)

CKE Truth Table


Current state Function Symbol CKEn-1 CKEn /CS /RAS /CAS /WE /Address
Activating Clock suspend mode entry H L X X X X X
Any Clock suspend mode L L X X X X X
Clock suspend Clock suspend mode exit L H X X X X X
Idle Auto refresh command REF H H L L L H X
Idle Self refresh entry SREF H L L L L H X
Idle Power down entry PD H L L H H H X
H L H X X X X
Idle Deep power down entry DPD H L L H H L X
Self refresh Self refresh exit L H L H H H X
L H H X X X X
Power down Power down exit L H L H H H X
L H H X X X X
Deep power down Deep power down exit L H X X X X X
(V=Valid, X=Don′t Care, H=Logic High, L=Logic Low)

Aug. 2005 Rev. 1.1


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64Mb Synchronous DRAM
P2V64S40ETP (4-bank x 1,048,576-word x 16-bit)

Function Truth Table


Current state /CS /RAS /CAS /WE /Address Command Action Notes
Idle H X X X X DESL NOP
L H H H X NOP NOP
L H H L X BST NOP
L H L H BA,CA,A10 RD/RDA ILLEGAL 1
L H L L BA,CA,A10 WR/WRA ILLEGAL 1
L L H H BA,RA ACT Row activating
L L H L BA,A10 PRE/PALL NOP
L L L H X REF Auto refresh
L L L L OC,BA1=L MRS Mode register set
L L L L OC,BA1=H EMRS Extended mode register set
Row active H X X X X DESL NOP
L H H H X NOP NOP
L H H L X BST NOP
L H L H BA,CA,A10 RD/RDA Begin read 2
L H L L BA,CA,A10 WR/WRA Begin write 2
L L H H BA,RA ACT ILLEGAL 1
L L H L BA,A10 PRE/PALL Precharge / Precharge all banks 3
L L L H X REF ILLEGAL
L L L L OC,BA MRS / EMRS ILLEGAL
Read H X X X X DESL Continue burst to end → Row active
L H H H X NOP Continue burst to end → Row active
L H H L X BST Burst stop → Row active
L H L H BA,CA,A10 RD/RDA Terminate burst,begin new read 4
L H L L BA,CA,A10 WR/WRA Terminate burst,begin write 4,5
L L H H BA,RA ACT ILLEGAL 1
L L H L BA,A10 PRE/PALL Terminate burst → Precharging
L L L H X REF ILLEGAL
L L L L OC,BA1=L MRS / EMRS ILLEGAL
Write H X X X X DESL Continue burst to end → Write recovering
L H H H X NOP Continue burst to end → Write recovering
L H H L X BST Burst stop → Row active
L H L H BA,CA,A10 RD/RDA Terminate burst, start read : Determine AP 4,5
L H L L BA,CA,A10 WR/WRA Terminate burst,new write : Determine AP 4
L L H H BA,RA ACT ILLEGAL 1
L L H L BA,A10 PRE/PALL Terminate burst → Precharging 6
L L L H X REF ILLEGAL
L L L L OC,BA1=L MRS / EMRS ILLEGAL
Read with auto H X X X X DESL Continue burst to end → Precharging
precharge L H H H X NOP Continue burst to end → Precharging
L H H L X BST ILLEGAL
L H L H BA,CA,A10 RD/RDA ILLEGAL 1
L H L L BA,CA,A10 WR/WRA ILLEGAL 1
L L H H BA,RA ACT ILLEGAL 1
L L H L BA,A10 PRE/PALL ILLEGAL 1
L L L H X REF ILLEGAL
L L L L OC,BA1=L MRS / EMRS ILLEGAL
Write with auto H X X X X DESL Continue burst to end → Write recovering
precharge L H H H X NOP Continue burst to end → Write recovering
L H H L X BST ILLEGAL
L H L H BA,CA,A10 RD/RDA ILLEGAL 1
L H L L BA,CA,A10 WR/WRA ILLEGAL 1
L L H H BA,RA ACT ILLEGAL 1
L L H L BA,A10 PRE/PALL ILLEGAL 1
L L L H X REF ILLEGAL
L L L L OC,BA1=L MRS / EMRS ILLEGAL

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64Mb Synchronous DRAM
P2V64S40ETP (4-bank x 1,048,576-word x 16-bit)

Current state /CS /RAS /CAS /WE /Address Command Action Notes
Precharging H X X X X DESL Nop → Enter idle after tRP
L H H H X NOP Nop → Enter idle after tRP
L H H L X BST ILLEGAL
L H L H BA,CA,A10 RD/RDA ILLEGAL 1
L H L L BA,CA,A10 WR/WRA ILLEGAL 1
L L H H BA,RA ACT ILLEGAL 1
L L H L BA,A10 PRE/PALL Nop → Enter idle after tRP
L L L H X REF ILLEGAL
L L L L OC,BA MRS/EMRS ILLEGAL
Row activating H X X X X DESL Nop → Enter bank active after tRCD
L H H H X NOP Nop → Enter bank active after tRCD
L H H L X BST ILLEGAL
L H L H BA,CA,A10 RD/RDA ILLEGAL 1
L H L L BA,CA,A10 WR/WRA ILLEGAL 1
L L H H BA,RA ACT ILLEGAL 1,7
L L H L BA,A10 PRE/PALL ILLEGAL 1
L L L H X REF ILLEGAL
L L L L OC,BA MRS / EMRS ILLEGAL
Write H X X X X DESL Nop → Enter row active after tDPL
recovering L H H H X NOP Nop → Enter row active after tDPL
L H H L X BST Nop → Enter row active after tDPL
L H L H BA,CA,A10 RD/RDA Begin read 5
L H L L BA,CA,A10 WR/WRA Begin new write
L L H H BA,RA ACT ILLEGAL 1
L L H L BA,A10 PRE/PALL ILLEGAL 1
L L L H X REF ILLEGAL
L L L L OC,BA1=L MRS / EMRS ILLEGAL
Write H X X X X DESL Nop → Enter precharge after tDPL
recovering with L H H H X NOP Nop → Enter precharge after tDPL
auto precharge
L H H L X BST Nop → Enter precharge after tDPL
L H L H BA,CA,A10 RD/RDA ILLEGAL
L H L L BA,CA,A10 WR/WRA ILLEGAL 1,5
L L H H BA,RA ACT ILLEGAL 1
L L H L BA,A10 PRE/PALL ILLEGAL 1
L L L H X REF ILLEGAL
L L L L OC,BA1=L MRS / EMRS ILLEGAL
Refresh H X X X X DESL Nop → Enter idle after tRC1
L H H H X NOP Nop → Enter idle after tRC1
L H H L X BST Nop → Enter idle after tRC1
L H L H BA,CA,A10 RD/RDA ILLEGAL
L H L L BA,CA,A10 WR/WRA ILLEGAL
L L H H BA,RA ACT ILLEGAL
L L H L BA,A10 PRE/PALL ILLEGAL
L L L H X REF ILLEGAL
L L L L OC,BA1=L MRS / EMRS ILLEGAL
Mode register H X X X X DESL Nop → Enter idle after tRSC
accessing L H H H X NOP Nop → Enter idle after tRSC
L H H L X BST Nop → Enter idle after tRSC
L H L H BA,CA,A10 RD/RDA ILLEGAL
L H L L BA,CA,A10 WR/WRA ILLEGAL
L L H H BA,RA ACT ILLEGAL
L L H L BA,A10 PRE/PALL ILLEGAL
L L L H X REF ILLEGAL
L L L L MODE MRS ILLEGAL

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64Mb Synchronous DRAM
P2V64S40ETP (4-bank x 1,048,576-word x 16-bit)

Notes: 1. Illegal to bank in specified states; Function may be legal in the bank indicated by Bank Address (BA), depending on
the state of that bank.
2. Illegal if tRCD is not satisfied.
3. Illegal if tRAS is not satisfied.
4. Must satisfy burst interrupt condition.
5. Must satisfy bus contention, bus turn around, and/or write recovery requirements.
6. Must mask preceding data which don't satisfy tDPL.
7. Illegal if tRRD is not satisfied

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64Mb Synchronous DRAM
P2V64S40ETP (4-bank x 1,048,576-word x 16-bit)

A. MODE REGISTER FIELD TABLE TO PROGRAM MODES


Register Programmed with Normal MRS
A11 ~
Address BA0 ~ BA1 A9*2 A8 A7 A6 A5 A4 A3 A2 A1 A0
A10/AP

"0" Setting for


Function RFU*1 W.B.L Test Mode CAS Latency BT Burst Length
Normal MRS

Normal MRS Mode


Test Mode CAS Latency Burst Type Burst Length
A8 A7 Type A6 A5 A4 Latency A3 Type A2 A1 A0 BT=0 BT=1
0 0 Mode Register Set 0 0 0 Reserved 0 Sequential 0 0 0 1 1
0 1 Reserved 0 0 1 1 1 Interleave 0 0 1 2 2
1 0 Reserved 0 1 0 2 Mode Select 0 1 0 4 4
1 1 Reserved 0 1 1 3 BA1 BA0 Mode 0 1 1 8 8
Write Burst Length 1 0 0 Reserved 1 0 0 Reserved Reserved
Setting for
A9 Length 1 0 1 Reserved 1 0 1 Reserved Reserved
0 0 Normal
0 Burst 1 1 0 Reserved 1 1 0 Reserved Reserved
MRS
1 Single Bit 1 1 1 Reserved 1 1 1 Full Page Reserved

B. POWER UP SEQUENCE
1. Apply power and attempt to maintain CKE at a high state and all other inputs may be undefined.
- Apply VDD before or at the same time as VDDQ.
2. Maintain stable power, stable clock and NOP input condition for a minimum of 200us.
3. Issue precharge commands for all banks of the devices.
4. Issue 2 or more auto-refresh commands.
5. Issue a mode register set command to initialize the mode register.

C. BURST SEQUENCE
STARTING COLUMN ORDER OF ACCESSES WITHIN A BURST
BURST LENGTH
ADDRESS
TYPE=SEQUENTIAL TYPE=INTERLEAVED
A0
2 0 0-1 0-1
1 1-0 1-0
A1 A0
0 0 0-1-2-3 0-1-2-3
4 0 1 1-2-3-0 1-0-3-2
1 0 2-3-0-1 2-3-0-1
1 1 3-0-1-2 3-2-1-0
A2 A1 A0
0 0 0 0-1-2-3-4-5-6-7 0-1-2-3-4-5-6-7
0 0 1 1-2-3-4-5-6-7-0 1-0-3-2-5-4-7-6
0 1 0 2-3-4-5-6-7-0-1 2-3-0-1-6-7-4-5
8 0 1 1 3-4-5-6-7-0-1-2 3-2-1-0-7-6-5-4
1 0 0 4-5-6-7-0-1-2-3 4-5-6-7-0-1-2-3
1 0 1 5-6-7-0-1-2-3-4 5-4-7-6-1-0-3-2
1 1 0 6-7-0-1-2-3-4-5 6-7-4-5-2-3-0-1
1 1 1 7-0-1-2-3-4-5-6 7-6-5-4-3-2-1-0
Cn, Cn+1, Cn+2, Cn+3,
Full Page (y) N=A0 – A8 (location 0 – y) Not Supported
Cn+4..., …Cn-1, Cn…

NOTE:
1. For full-page accesses: y = 512.
2. For a burst length of two, A1–A8 select the block-of-two burst; A0 selects the starting column within the block.
3. For a burst length of four, A2–A8 select the block-of-four burst; A0–A1 select the starting column within the block.
4. For a burst length of eight, A3–A8 select the block-of-eight burst; A0–A2 select the starting column within the block.
5. For a full-page burst, the full row is selected and A0–A8 select the starting column.
6. Whenever a boundary of the block is reached within a given sequence above, the following access wraps within the block.
7. For a burst length of one, A0–A8 select the unique column to be accessed, and mode register bit M3 is ignored.

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64Mb Synchronous DRAM
P2V64S40ETP (4-bank x 1,048,576-word x 16-bit)

Power-up sequence
Power-up sequence
The SDRAM should be goes on the following sequence with power up.
The CLK, CKE, /CS, DQM and DQ pins keep low till power stabilizes.
The CLK pin is stabilized within 100 µs after power stabilizes before the following initialization sequence.
The CKE and DQM is driven to high between power stabilizes and the initialization sequence.
This SDRAM has VDD clamp diodes for CLK, CKE, address, /RAS, /CAS, /WE, /CS, DQM and DQ pins. If the sepins go high
before power up, the large current flows from these pins to VDD through the diodes.

Initialization sequence
When 200 µs or more has past after the above power-up sequence, all banks must be precharged using the precharge
command (PALL). After tRP delay, set 8 or more auto refresh commands (REF). Set the mode register set command (MRS)
to initialize the mode register. We recommend that by keeping DQM and CKE to High, the output buffer becomes High-Z
during Initialization sequence, to avoid DQ bus contention on memory system formed with a number of device.

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64Mb Synchronous DRAM
P2V64S40ETP (4-bank x 1,048,576-word x 16-bit)

Operation of the SDRAM

Read/Write Operations

Bank active
Before executing a read or write operation, the corresponding bank and the row address must be activated by the bank
active (ACT) command. An interval of tRCD is required between the bank active command input and the following read/write
command input.

Read operation
A read operation starts when a read command is input. Output buffer becomes Low-Z in the (/CAS Latency - 1) cycle after
read command set. The SDRAM can perform a burst read operation.
The burst length can be set to 1, 2, 4 and 8. The start address for a burst read is specified by the column address and the
bank select address at the read command set cycle. In a read operation, data output starts after the number of clocks
specified by the /CAS Latency. The /CAS Latency can be set to 2 or 3.
When the burst length is 1, 2, 4 and 8 the DOUT buffer automatically becomes High-Z at the next clock after the successive
burst-length data has been output.
The /CAS latency and burst length must be specified at the mode register.

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64Mb Synchronous DRAM
P2V64S40ETP (4-bank x 1,048,576-word x 16-bit)

Write operation

Burst write or single write mode is selected

1. Burst write: A burst write operation is enabled by setting OPCODE (A9, A8) to (0, 0). A burst write starts in the same clock
as a write command set. (The latency of data input is 0 clock.) The burst length can be set to 1, 2, 4 and 8, like burst read
operations. The write start address is specified by the column address and the bank select address at the write command
set cycle.
.

2. Single write: A single write operation is enabled by setting OPCODE (A9, A8) to (1, 0). In a single write operation, data is
only written to the column address and the bank select address specified by the write command set cycle without regard to
the burst length setting. (The latency of data input is 0 clock).

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64Mb Synchronous DRAM
P2V64S40ETP (4-bank x 1,048,576-word x 16-bit)

Auto Precharge

Read with auto-precharge


In this operation, since precharge is automatically performed after completing a read operation, a precharge
command need not be executed after each read operation. The command executed for the same bank after the
execution of this command must be the bank active (ACT) command. In addition, an interval defined by lAPR is
required before execution of the next command.

[Clock cycle time]

/CAS latency Precharge start cycle


3 2 cycle before the final data is output
2 1 cycle before the final data is output

Write with auto-precharge


In this operation, since precharge is automatically performed after completing a burst write or single write operation, a
precharge command need not be executed after each write operation. The command executed for the same bank after the
execution of this command must be the bank active (ACT) command. In addition, an interval of lDAL is required between the
final valid data input and input of next command.

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64Mb Synchronous DRAM
P2V64S40ETP (4-bank x 1,048,576-word x 16-bit)

Burst Stop Command


During a read cycle, when the burst stop command is issued, the burst read data are terminated and the data bus goes to
High-Z after the /CAS latency from the burst stop command.

During a write cycle, when the burst stop command is issued, the burst write data are terminated and data bus goes to
High-Z at the same clock with the burst stop command.

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64Mb Synchronous DRAM
P2V64S40ETP (4-bank x 1,048,576-word x 16-bit)

Command Intervals

Read command to Read command interval


1. Same bank, same ROW address: When another read command is executed at the same ROW address of the same bank
as the preceding read command execution, the second read can be performed after an interval of no less than 1 clock.
Even when the first command is a burst read that is not yet finished, the data read by the second command will be valid.

2. Same bank, different ROW address: When the ROW address changes on same bank, consecutive read commands
cannot be executed; it is necessary to separate the two read commands with a precharge command and a bank active
command.
3. Different bank: When the bank changes, the second read can be performed after an interval of no less than 1 clock,
provided that the other bank is in the bank active state. Even when the first command is a burst read that is not yet finished,
the data read by the second command will be valid.

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64Mb Synchronous DRAM
P2V64S40ETP (4-bank x 1,048,576-word x 16-bit)

Write command to Write command interval

1. Same bank, same ROW address: When another write command is executed at the same ROW address of the same bank
as the preceding write command, the second write can be performed after an interval of no less than 1 clock. In the case of
burst writes, the second write command has priority.

2. Same bank, different ROW address: When the ROW address changes, consecutive write commands cannot be executed;
it is necessary to separate the two write commands with a precharge command and a bank active command.
3. Different bank: When the bank changes, the second write can be performed after an interval of no less than 1 clock,
provided that the other bank is in the bank active state. In the case of burst write, the second write command has priority.

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64Mb Synchronous DRAM
P2V64S40ETP (4-bank x 1,048,576-word x 16-bit)

Read command to Write command interval

1. Same bank, same ROW address: When the write command is executed at the same ROW address of the same bank as
the preceding read command, the write command can be performed after an interval of no less than 1 clock. However,
UDQM and LDQM must be set High so that the output buffer becomes High-Z before data input.

2. Same bank, different ROW address: When the ROW address changes, consecutive write commands cannot be executed;
it is necessary to separate the two commands with a precharge command and a bank active command.
3. Different bank: When the bank changes, the write command can be performed after an interval of no less than 1 cycle,
provided that the other bank is in the bank active state. However, UDQM and LDQM must be set High so that the output
buffer becomes High-Z before data input.

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64Mb Synchronous DRAM
P2V64S40ETP (4-bank x 1,048,576-word x 16-bit)

Write command to Read command interval:

1. Same bank, same ROW address: When the read command is executed at the same ROW address of the same bank as
the preceding write command, the read command can be performed after an interval of no less than 1 clock. However, in
the case of a burst write, data will continue to be written until one clock before the read command is executed.

2. Same bank, different ROW address: When the ROW address changes, consecutive read commands cannot be executed;
it is necessary to separate the two commands with a precharge command and a bank active command.
3. Different bank: When the bank changes, the read command can be performed after an interval of no less than 1 clock,
provided that the other bank is in the bank active state. However, in the case of a burst write, data will continue to be
written until one clock before the read command is executed (as in the case of the same bank and the same address).

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64Mb Synchronous DRAM
P2V64S40ETP (4-bank x 1,048,576-word x 16-bit)

Read with auto precharge to Read command interval

1. Different bank: When some banks are in the active state, the second read command (another bank) is executed. Even
when the first read with auto-precharge is a burst read that is not yet finished, the data read by the second command is
valid. The internal auto-precharge of one bank starts at the next clock of the second command.

2. Same bank: The consecutive read command (the same bank) is illegal.

Write with auto precharge to Write command interval

1. Different bank: When some banks are in the active state, the second write command (another bank) is executed. In the
case of burst writes, the second write command has priority. The internal auto-precharge of one bank starts 2 clocks later
from the second command.

2. Same bank: The consecutive write command (the same bank) is illegal.

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64Mb Synchronous DRAM
P2V64S40ETP (4-bank x 1,048,576-word x 16-bit)

Read with auto precharge to Write command interval


1. Different bank: When some banks are in the active state, the second write command (another bank) is executed. However,
UDQM and LDQM must be set High so that the output buffer becomes High-Z before data input. The internal
auto-precharge of one bank starts at the next clock of the second command.

2. Same bank: The consecutive write command from read with auto precharge (the same bank) is illegal. It is necessary to
separate the two commands with a bank active command.

Write with auto precharge to Read command interval


1. Different bank: When some banks are in the active state, the second read command (another bank) is executed. However,
in case of a burst write, data will continue to be written until one clock before the read command is executed. The internal
auto-precharge of one bank starts at 2 clocks later from the second command.

2. Same bank: The consecutive read command from write with auto precharge (the same bank) is illegal. It is necessary to
separate the two commands with a bank active command.

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64Mb Synchronous DRAM
P2V64S40ETP (4-bank x 1,048,576-word x 16-bit)

Read command to Precharge command interval (same bank)


When the precharge command is executed for the same bank as the read command that preceded it, the minimum interval
between the two commands is one clock. However, since the output buffer then becomes High-Z after the clocks defined by
lHZP, there is a case of interruption to burst read data output will be interrupted, if the precharge command is input during
burst read. To read all data by burst read, the clocks defined by lEP must be assured as an interval from the final data output
to precharge command execution.

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64Mb Synchronous DRAM
P2V64S40ETP (4-bank x 1,048,576-word x 16-bit)

Write command to Precharge command interval (same bank)


When the precharge command is executed for the same bank as the write command that preceded it, the minimum interval
between the two commands is 1 clock. However, if the burst write operation is unfinished, the input data must be masked by
means of UDQM and LDQM for assurance of the clock defined by tDPL.

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64Mb Synchronous DRAM
P2V64S40ETP (4-bank x 1,048,576-word x 16-bit)

Bank active command interval


1. Same bank: The interval between the two bank active commands must be no less than tRC.
2. In the case of different bank active commands: The interval between the two bank active commands must be no less than
tRRD.

Mode register set to Bank active command interval


The interval between setting the mode register and executing a bank active command must be no less than lMRD.

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64Mb Synchronous DRAM
P2V64S40ETP (4-bank x 1,048,576-word x 16-bit)

DQM Control
The UDQM and LDQM mask the upper and lower bytes of the DQ data, respectively. The timing of UDQM and LDQM is
different during reading and writing.

Reading
When data is read, the output buffer can be controlled by UDQM and LDQM. By setting UDQM and LDQM to Low, the output
buffer becomes Low-Z, enabling data output. By setting UDQM and LDQM to High, the output buffer becomes High-Z, and
the corresponding data is not output. However, internal reading operations continue. The latency of UDQM and LDQM
during reading is 2 clocks.

Writing
Input data can be masked by UDQM and LDQM. By setting DQM to Low, data can be written. In addition, when UDQM and
LDQM are set to High, the corresponding data is not written, and the previous data is held. The latency of UDQM and LDQM
during writing is 0 clock.

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64Mb Synchronous DRAM
P2V64S40ETP (4-bank x 1,048,576-word x 16-bit)

Refresh

Auto-refresh
All the banks must be precharged before executing an auto-refresh command. Since the auto-refresh command updates the
internal counter every time it is executed and determines the banks and the ROW addresses to be refreshed, external
address specification is not required. The refresh cycles are required to refresh all the ROW addresses within tREF (max.).
The output buffer becomes High-Z after auto-refresh start. In addition, since a precharge has been completed by an internal
operation after the auto-refresh, an additional precharge operation by the precharge command is not required.

Self-refresh
After executing a self-refresh command, the self-refresh operation continues while CKE is held Low. During selfrefresh
operation, all ROW addresses are refreshed by the internal refresh timer. A self-refresh is terminated by a self-refresh exit
command. Before and after self-refresh mode, execute auto-refresh to all refresh addresses in or within tREF (max.) period
on the condition 1 and 2 below.
1. Enter self-refresh mode within time as below* after either burst refresh or distributed refresh at equal interval to all refresh
addresses are completed.
2. Start burst refresh or distributed refresh at equal interval to all refresh addresses within time as below*after exiting from
self-refresh mode.

Note: tREF (max.) / refresh cycles.

Others

Power-down mode
The SDRAM enters power-down mode when CKE goes Low in the IDLE state. In power down mode, power consumption is
suppressed by deactivating the input initial circuit. Power down mode continues while CKE is held Low. In addition, by setting
CKE to High, the SDRAM exits from the power down mode, and command input is enabled from the next clock. In this mode,
internal refresh is not performed.

Clock suspend mode


By driving CKE to Low during a bank active or read/write operation, the SDRAM enters clock suspend mode. During clock
suspend mode, external input signals are ignored and the internal state is maintained. When CKE is driven High, the
SDRAM terminates clock suspend mode, and command input is enabled from the next clock. For details, refer to the "CKE
Truth Table".

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64Mb Synchronous DRAM
P2V64S40ETP (4-bank x 1,048,576-word x 16-bit)

Timing Waveforms
Read Cycle

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Write Cycle

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Mode Register Set Cycle

Read Cycle/Write Cycle

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Read/Single Write Cycle

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Read/Burst Write Cycle

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Auto Refresh Cycle

Self Refresh Cycle

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Clock Suspend Mode

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64Mb Synchronous DRAM
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Power Down Mode

Initialization Sequence

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Page- 36

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