ISO224 Reinforced Isolated Amplifier With Single-Ended Input of 12 V and Differential Output of 4 V
ISO224 Reinforced Isolated Amplifier With Single-Ended Input of 12 V and Differential Output of 4 V
ISO224
SBAS738A – JUNE 2018 – REVISED OCTOBER 2018
Simplified Schematic
ISO224
OUTP
optional
Reinforced Isolation
IN ADS7945
Up to ±12 V Clamp
OUTN 14-Bit ADC
optional
Isolated
VDD1 VDD2 4.5 V to 5.5 V
4.5 V to 18 V
GND1 GND2
GND1 GND2
VCAP
An IMPORTANT NOTICE at the end of this data sheet addresses availability, warranty, changes, use in safety-critical applications,
intellectual property matters and other important disclaimers. PRODUCTION DATA.
ISO224
SBAS738A – JUNE 2018 – REVISED OCTOBER 2018 www.ti.com
Table of Contents
1 Features .................................................................. 1 8.1 Overview ................................................................. 17
2 Applications ........................................................... 1 8.2 Functional Block Diagram ....................................... 17
3 Description ............................................................. 1 8.3 Feature Description................................................. 18
8.4 Device Functional Modes........................................ 21
4 Revision History..................................................... 2
5 Device Comparison Table..................................... 3 9 Application and Implementation ........................ 22
9.1 Application Information............................................ 22
6 Pin Configuration and Functions ......................... 3
9.2 Typical Application .................................................. 22
7 Specifications......................................................... 4
9.3 What to Do and What Not to Do ............................. 24
7.1 Absolute Maximum Ratings ...................................... 4
10 Power Supply Recommendations ..................... 25
7.2 ESD Ratings.............................................................. 4
7.3 Recommended Operating Conditions....................... 4 11 Layout................................................................... 26
11.1 Layout Guidelines ................................................. 26
7.4 Thermal Information .................................................. 5
11.2 Layout Example .................................................... 26
7.5 Power Ratings........................................................... 5
7.6 Insulation Specifications............................................ 6 12 Device and Documentation Support ................. 27
7.7 Safety-Related Certifications..................................... 7 12.1 Documentation Support ........................................ 27
7.8 Safety Limiting Values .............................................. 7 12.2 Receiving Notification of Documentation Updates 27
7.9 Electrical Characteristics........................................... 7 12.3 Community Resources.......................................... 27
7.10 Switching Characteristics ........................................ 9 12.4 Trademarks ........................................................... 27
7.11 Insulation Characteristics Curves ......................... 10 12.5 Electrostatic Discharge Caution ............................ 27
7.12 Typical Characteristics .......................................... 11 12.6 Glossary ................................................................ 27
8 Detailed Description ............................................ 17 13 Mechanical, Packaging, and Orderable
Information ........................................................... 28
4 Revision History
Changes from Original (June 2018) to Revision A Page
DWV Package
8-Pin SOIC
Top View
VCAP 1 8 VDD2
IN 2 7 OUTP
VDD1 3 6 OUTN
GND1 4 5 GND2
Not to scale
Pin Functions
PIN
I/O DESCRIPTION
NO. NAME
Supply decoupling capacitor.
1 VCAP —
Connect a 0.22-µF capacitor between this pin and the high-side analog ground.
2 IN I Analog input
High-side power supply, 4.5 V to 18 V.
3 VDD1 —
See the Power Supply Recommendations section for decoupling recommendations.
4 GND1 — High-side analog ground
5 GND2 — Low-side analog ground
6 OUTN O Inverting analog output
7 OUTP O Noninverting analog output
Low-side power supply, 4.5 V to 5.5 V.
8 VDD2 —
See the Power Supply Recommendations section for decoupling recommendations.
7 Specifications
7.1 Absolute Maximum Ratings
(1)
see
MIN MAX UNIT
VDD1 to GND1 –0.3 26
Power-supply voltage V
VDD2 to GND2 –0.3 6.5
Input voltage IN to GND1 (2) –15 15 V
Input current Continuous, at IN pin (3) –10 10 mA
Output voltage OUTP, OUTN GND2 – 0.3 VDD2 + 0.3 V
Junction, TJ 150
Temperature °C
Storage, Tstg –65 150
(1) Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings
only, which do not imply functional operation of the device at these or any other conditions beyond those indicated under Recommended
Operating Conditions. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
(2) Exposure to absolute-maximum-rated condition for extended periods may increase input leakage current.
(3) Limit the input current at IN pin to prevent permanent damage to the device. The IN pin is internally protected by a voltage clamp. See
Figure 42 for a typical current versus voltage characteristic curve of the input clamp.
(1) JEDEC document JEP155 states that 500-V HBM allows safe manufacturing with a standard ESD control process.
(2) JEDEC document JEP157 states that 250-V CDM allows safe manufacturing with a standard ESD control process.
(1) For more information about traditional and new thermal metrics, see the Semiconductor and IC Package Thermal Metrics application
report.
(1) See the Electrical Characteristics table for maximum supply current specifications.
(1) Apply creepage and clearance requirements according to the specific equipment isolation standards of an application. Care must be
taken to maintain the creepage and clearance distance of a board design to ensure that the mounting pads of the isolator on the printed
circuit board (PCB) do not reduce this distance. Creepage and clearance on a PCB become equal in certain cases. Techniques such as
inserting grooves and ribs on the PCB are used to help increase these specifications.
(2) This coupler is suitable for safe electrical insulation only within the safety ratings. Compliance with the safety ratings shall be ensured by
means of suitable protective circuits.
(3) Testing is carried out in air or oil to determine the intrinsic surge immunity of the isolation barrier.
(4) Apparent charge is electrical discharge caused by a partial discharge (pd).
(5) All pins on each side of the barrier are tied together, creating a two-pin device.
(1) The maximum safety temperature, TS, has the same value as the maximum junction temperature, TJ, specified for the device. The IS
and PS parameters represent the safety current and safety power, respectively. Do not exceed the maximum limits of IS and PS. These
limits vary with the ambient temperature, TA.
The junction-to-air thermal resistance, RθJA, in the Thermal Information table is that of a device installed on a high-K test board for
leaded surface-mount packages. Use these equations to calculate the value for each parameter:
TJ = TA + RθJA × P, where P is the power dissipated in the device.
TJ(max) = TS = TA + RθJA × PS, where TJ(max) is the maximum junction temperature.
PS = IS × VDD1max + IS × VDD2max, where VDD1max is the maximum high-side supply voltage and VDD2max is the maximum low-side
supply voltage.
12 V
50%
0V
IN -12 V
50% - 90%
50% - 50%
50% - 10%
OUTN
90%
50%
VCMout
10%
OUTP
tr tf
250 1600
VDD1 = VDD2 = 5.5 V
225 VDD1 = 18 V, VDD2 = 5.5 V 1400
200
1200
175
150 1000
PS (mW)
IS (mA)
125 800
100 600
75
400
50
25 200
0 0
0 25 50 75 100 125 150 0 25 50 75 100 125 150
TA (°C) D001
TA (°C) D002
Figure 2. Thermal Derating Curve for Safety-Limiting Figure 3. Thermal Derating Curve for Safety-Limiting
Current per VDE Power per VDE
1.E+11 Safety Margin Zone: 1800 VRMS, 254 Years
Operating Zone: 1500 VRMS, 135 Years
1.E+10 TDDB Line (<1 PPM Fail Rate)
87.5%
1.E+9
1.E+8
Time to Fail (s)
1.E+7
1.E+6
1.E+5
1.E+4
1.E+3
20%
1.E+2
1.E+1
500 1500 2500 3500 4500 5500 6500 7500 8500 9500
Stress Voltage (VRMS)
TA up to 150°C, stress-voltage frequency = 60 Hz,
isolation working voltage = 1500 VRMS, operating lifetime = 135 years
60 5
4
50
3
40 2
Devices (%)
VOS (mV)
30 0
-1
20
-2
10 -3
-4
0
-5
-5
-4.5
-4
-3.5
-3
-2.5
-2
-1.5
-1
-0.5
0
0.5
1
1.5
2
2.5
3
3.5
4
4.5
5
4.5 6 7.5 9 10.5 12 13.5 15 16.5 18
D003 VDD1 (V)
VOS (mV) D004
ISO224B
Figure 5. Input Offset Voltage Histogram Figure 6. Input Offset Voltage vs High-Side Supply Voltage
5 5
4 4
3 3
2 2
1 1
VOS (mV)
VOS (mV)
0 0
-1 -1
-2 -2
-3 -3 Device 1
-4 -4 Device 2
Device 3
-5 -5
4.5 4.6 4.7 4.8 4.9 5 5.1 5.2 5.3 5.4 5.5 -55 -40 -25 -10 5 20 35 50 65 80 95 110 125
VDD2 (V) D005
Temperature (°C) D006
ISO224B
Figure 7. Input Offset Voltage vs Low-Side Supply Voltage Figure 8. Input Offset Voltage vs Temperature
60 -13
-13.5
50
-14
40
-14.5
Devices (%)
IIB (nA)
30 -15
-15.5
20
-16
10
-16.5
0 -17
-15
-13
-11
-9
-7
-5
-3
-1
11
13
15
1
3
5
7
9
Figure 9. Input Offset Drift Histogram Figure 10. Input Bias Current vs High-Side Supply Voltage
-13.5
-14.5
IIB (nA)
-15 10
-15.5
-16 1
-16.5
-17 0.1
-55 -40 -25 -10 5 20 35 50 65 80 95 110 125 0.01 0.1 1 10 100 1000
Temperature (°C) D009
Frequency (kHz) D010
ISO224B
Figure 11. Input Bias Current vs Temperature Figure 12. Input-Referred Noise Density vs Frequency
60 70
50 60
50
40
Devices (%)
Devices (%)
40
30
30
20
20
10 10
0 0
-0.3
-1
-0.25
-0.2
-0.15
-0.1
-0.05
-0.8
-0.6
-0.4
-0.2
0
0
0.1
0.2
0.3
0.2
0.4
0.6
0.8
1
0.05
0.15
0.25
D011 D012
EG (%) EG (%)
ISO224B ISO224A
Figure 13. Gain Error Histogram Figure 14. Gain Error Histogram
1 1
0.8 0.8
0.6 0.6
0.4 0.4
0.2 0.2
EG (%)
EG (%)
0 0
-0.2 -0.2
-0.4 -0.4
-0.6 -0.6
-0.8 ISO224A -0.8 ISO224A
ISO224B ISO224B
-1 -1
4.5 6 7.5 9 10.5 12 13.5 15 16.5 18 4.5 4.6 4.7 4.8 4.9 5 5.1 5.2 5.3 5.4 5.5
VDD1 (V) D013
VDD2 (V) D014
Figure 15. Gain Error vs High-Side Supply Voltage Figure 16. Gain Error vs Low-Side Supply Voltage
0.8
60
0.6
50
0.4
Devices (%)
0.2 40
EG (%)
0
30
-0.2
-0.4 20
-0.6 Device 1 10
-0.8 Device 2
Device 3 0
-1
-35
-30
-25
-20
-15
-10
-5
10
15
20
25
30
35
5
-40 -25 -10 5 20 35 50 65 80 95 110 125
Temperature (°C) D016
D015 TCEG (ppm/qC)
ISO224B ISO224B
Figure 17. Gain Error vs Temperature Figure 18. Gain Error Drift Histogram
5 0°
0
-45°
-5
-90°
Normalized Gain (dB)
-10
Output Phase
-15 -135°
-20
-180°
-25
-30 -225°
-35 -270°
-40
ISO224A -315° ISO224A
-45
ISO224B ISO224B
-50 -360°
0.1 1 10 100 1000 0.1 1 10 100 1000
fIN (kHz) D017
fIN (kHz) D018
Figure 19. Normalized Gain vs Input Frequency Figure 20. Output Phase vs Input Frequency
7 0.01
VOUTP
VOUTN 0.008
6
0.006
5 0.004
Nonlinearity (%)
0.002
VOUTx (V)
4
0
3
-0.002
2 -0.004
-0.006
1
-0.008
0 -0.01
-16 -12 -8 -4 0 4 8 12 16 -12 -10 -8 -6 -4 -2 0 2 4 6 8 10 12
VIN (V) D019
VIN (V) D020
Figure 21. Output Voltage vs Input Voltage Figure 22. Nonlinearity vs Input Voltage
0.015 0.015
0.01 0.01
Nonlinearity (%)
Nonlinearity (%)
0.005 0.005
0 0
-0.005 -0.005
-0.01 -0.01
-0.015 -0.015
-0.02 -0.02
4.5 6 7.5 9 10.5 12 13.5 15 16.5 18 4.5 4.6 4.7 4.8 4.9 5 5.1 5.2 5.3 5.4 5.5
VDD1 (V) D021
VDD2 (V) D022
Figure 23. Nonlinearity vs High-Side Supply Voltage Figure 24. Nonlinearity vs Low-Side Supply Voltage
0.02 -74
0.015 -76
-78
0.01
-80
Nonlinearity (%)
0.005 -82
THD (dB)
0 -84
-0.005 -86
-88
-0.01
Device 1 -90
-0.015 Device 2 -92
Device 3
-0.02 -94
-55 -40 -25 -10 5 20 35 50 65 80 95 110 125 4.5 6 7.5 9 10.5 12 13.5 15 16.5 18
Temperature (°C) D023
VDD1 (V) D024
-80 -80
-82 -82
THD (dB)
THD (dB)
-84 -84
-86 -86
-88 -88
-90 -90
-92 -92
-94 -94
4.5 4.6 4.7 4.8 4.9 5 5.1 5.2 5.3 5.4 5.5 -55 -40 -25 -10 5 20 35 50 65 80 95 110 125
VDD2 (V) D025
Temperature (°C) D026
Figure 27. Total Harmonic Distortion Figure 28. Total Harmonic Distortion vs Temperature
vs Low-Side Supply Voltage
2.8
-20
2.7
-40
2.6
PSRR (dB)
VCMout (V)
-60 2.5
2.4
-80
2.3
-100
vs VDD2 2.2
vs VDD1
-120 2.1
0.1 1 10 100 1000 4.5 4.6 4.7 4.8 4.9 5 5.1 5.2 5.3 5.4 5.5
Ripple Frequency (kHz) D027
VDD2 (V) D028
Figure 29. Power-Supply Rejection Ratio Figure 30. Output Common-Mode Voltage
vs Ripple Frequency vs Low-Side Supply Voltage
2.9 8
2.8 7.5
2.7
7
2.6
IDD1 (mA)
VCMout (V)
6.5
2.5
6
2.4
5.5
2.3
2.2 5
2.1 4.5
-55 -40 -25 -10 5 20 35 50 65 80 95 110 125 4.5 6 7.5 9 10.5 12 13.5 15 16.5 18
Temperature (°C) D029
VDD1 (V) D030
Figure 31. Output Common-Mode Voltage vs Temperature Figure 32. High-Side Supply Current
vs High-Side Supply Voltage
10 10
IDD2
9.5 9.5 IDD1
9 9
8.5 8.5
IDD2 (mA)
IDDx (mA)
8 8
7.5 7.5
7 7
6.5 6.5
6 6
5.5 5.5
4.5 4.6 4.7 4.8 4.9 5 5.1 5.2 5.3 5.4 5.5 -55 -40 -25 -10 5 20 35 50 65 80 95 110 125
VDD2 (V) D031
Temperature (°C) D032
Figure 33. Low-Side Supply Current Figure 34. Supply Current vs Temperature
vs Low-Side Supply Voltage
2 2
1.9 1.9
1.8 1.8
tr, tf (Ps)
tr, tf (Ps)
1.7 1.7
1.6 1.6
1.5 1.5
Figure 35. Output Rise and Fall Time Figure 36. Output Rise and Fall Time vs Temperature
vs Low-Side Supply Voltage
3.5 5
4.5
3
4
Signal Delay (Ps)
2.5 3.5
3
2
2.5
1.5 2
1.5
1 50% - 90% 50% - 90%
50% - 50% 1 50% - 50%
50% - 10% 50% - 10%
0.5 0.5
4.5 4.6 4.7 4.8 4.9 5 5.1 5.2 5.3 5.4 5.5 4.5 4.6 4.7 4.8 4.9 5 5.1 5.2 5.3 5.4 5.5
VDD2 (V) D035
VDD2 (V) D036
ISO224B ISO224A
Figure 37. VIN to VOUT Signal Delay Figure 38. VIN to VOUT Signal Delay
vs Low-Side Supply Voltage vs Low-Side Supply Voltage
3.5 5
4.5
3
4
Signal Delay (Ps)
Signal Delay (Ps)
2.5 3.5
3
2
2.5
1.5 2
1.5
1 50% - 90% 50% - 90%
50% - 50% 1 50% - 50%
50% - 10% 50% - 10%
0.5 0.5
-55 -40 -25 -10 5 20 35 50 65 80 95 110 125 -55 -40 -25 -10 5 20 35 50 65 80 95 110 125
Temperature (°C) D037
Temperature (°C) D038
ISO224B ISO224A
Figure 39. VIN to VOUT Signal Delay vs Temperature Figure 40. VIN to VOUT Signal Delay vs Temperature
8 Detailed Description
8.1 Overview
The ISO224 is a precision, isolated amplifier with a high input impedance and wide input voltage range suitable
for wide range of industrial applications. The input stage of the device drives a delta-sigma (ΔΣ) modulator. The
modulator uses the internal voltage reference and clock generator to convert the analog input signal to a digital
bitstream. The drivers (called TX in the Functional Block Diagram section) transfer the output of the modulator
across the isolation barrier that separates the high-side and low-side voltage domains. The received bitstream
and clock are synchronized and processed by a digital-to-analog conversion stage on the low-side and presented
as a differential analog output.
The SiO2-based, double-capacitive isolation barrier supports a high level of magnetic field immunity, as described
in ISO72x Digital Isolator Magnetic-Field Immunity. The digital modulation used in the ISO224 and the isolation
barrier characteristics result in high reliability and high common-mode transient immunity.
VDD1 VDD2
Reinforced
Voltage Regulator VDD1 Isolation Bandgap
VCAP
(LDO) Detection Barrier Reference
Data OUTP
û
Clamp TX RX
IN Modulator
OUTN
Bandgap CLK
RX TX Oscillator
Reference
ISO224
GND1 GND2
5
VCLIPPING
VFSR
4
VOUTx (V)
VCMout
0
-15 -10 -5 0 5 10 15
VIN (V)
There are two restrictions on the analog input signal at the IN pin. First, if the input voltage VIN exceeds the
range of –15 V to 15 V, the current must be limited to 10 mA to prevent damage to the input clamp, see the Input
Clamp Protection Circuit section for further information. In addition, the linearity and noise performance of the
ISO224 are ensured only when the analog input voltage remains within the specified linear full-scale range
(VFSR).
20
10
0
-10
-20
-30
-40
-50
-20 -15 -10 -5 0 5 10 15 20
Input Voltage (V) D007
Figure 43 shows a simple method to limit the input current with an external series resistor that is also used as
part of the input low-pass filter.
ISO224
RFLT IN
Clamp
CFLT
Input
Signal
GND1
GND1
Figure 43. Series Resistor-Based Input Current Limitation on the Analog Inputs of ISO224
The input overvoltage protection clamp on the ISO224 is intended to control transient excursions on the input
pins. Leaving the device in a state such that the clamp circuit is activated for extended periods of time in normal
or power-down mode is not recommended because this fault condition can degrade device performance and
reliability.
Transmitter Receiver
OOK
Modulation
SiO2-Based
TX IN Capacitive
TX Signal RX Signal Envelope
Reinforced RX OUT
Conditioning Conditioning Detection
Isolation
Barrier
Oscillator
TX IN
RX OUT
2.5
2
VOUTx (V)
0.5
VFAILSAFEmax
0
0 0.5 1 1.5 2 2.5 3 3.5 4 4.5 5 5.5
VDD1 (V)
The ISO224 Fail-Safe Output Feature application report describes an example of a comparator-based circuit that
detects the missing high-side supply in a system.
NOTE
Information in the following applications sections is not part of the TI component
specification, and TI does not warrant its accuracy or completeness. TI’s customers are
responsible for determining suitability of components for their purposes. Customers should
validate and test their design implementation to confirm system functionality.
VDD1 VDD2
RFLTout
R1
AC RFLTin
Voltage VAC IAC CFLTout ADC
CFLTin RFLTout
Source VIN
R2
GND1 GND2
GND2
GND1
For systems using single-ended input ADCs with a 5-V supply, Figure 48 shows an example of a TLV6001-based
signal conversion and filter circuit. Tailor the bandwidth of this filter stage to the bandwidth requirement of the
system and use NP0-type capacitors for best performance.
ISO224 VCMADC
VDD1 VDD2
TLV6001
VIN VOUTP +
To ADC
VCAP VOUTN ±
GND1 GND2
GND2
Figure 48. Connecting the ISO224 Output to a Single-Ended Input 5-V ADC
For systems using single-ended, ±10-V input ADCs, the ISO224EVM offers a signal path based on an OPA277
that converts the differential output of the ISO224 and limits the signal bandwidth to 50 kHz.
For more information on the general procedure to design the filtering and driving stages of SAR ADCs, consult
the 18-Bit, 1MSPS Data Acquisition Block (DAQ) Optimized for Lowest Distortion and Noise and 18-Bit Data
Acquisition Block (DAQ) Optimized for Lowest Power TI Precision Designs, available for download at
www.ti.com.
VIN
VOUTN
VOUTP
Figure 50 shows the typical AC response of the device with a full-scale sine wave with a frequency of 20 kHz
applied at the input.
VIN
VOUTP
VOUTN
ISO224
VDD1
Detection
OUTP
Reinforced Isolation
IN
VDD1
OUTN
VDD1 VDD2
1 …F 0.1 …F
VCAP VDD2
0.1 …F 1 …F
0.22 µF
GND1 GND2
GND1
GND2
TLV70450 VDD2
VDD2
OUT IN SN6501
10 …F 0.1 …F 10 …F 20 V D1 VCC
0.1 …F
GND
D2 GND2
GND1
20 V 10 …F
GND2
GND1
GND2
11 Layout
To Input
Signal
Source ISO224 To Filter
or ADC
To Isolated
VDD1 Power
Supply Source
LEGEND
Top-Layer Traces
Bottom-Layer (or Inner-Layer) GND1 and GND2 Copper Pour
Clearance Area to be kept free of conductive materials on all layers
12.4 Trademarks
E2E is a trademark of Texas Instruments.
All other trademarks are the property of their respective owners.
12.5 Electrostatic Discharge Caution
These devices have limited built-in ESD protection. The leads should be shorted together or the device placed in conductive foam
during storage or handling to prevent electrostatic damage to the MOS gates.
12.6 Glossary
SLYZ022 — TI Glossary.
This glossary lists and explains terms, acronyms, and definitions.
www.ti.com 10-Dec-2020
PACKAGING INFORMATION
Orderable Device Status Package Type Package Pins Package Eco Plan Lead finish/ MSL Peak Temp Op Temp (°C) Device Marking Samples
(1) Drawing Qty (2) Ball material (3) (4/5)
(6)
ISO224ADWV ACTIVE SOIC DWV 8 64 RoHS & Green NIPDAU Level-3-260C-168 HR -55 to 125 ISO224A
ISO224ADWVR ACTIVE SOIC DWV 8 1000 RoHS & Green NIPDAU Level-3-260C-168 HR -55 to 125 ISO224A
ISO224BDWV ACTIVE SOIC DWV 8 64 RoHS & Green NIPDAU Level-3-260C-168 HR -55 to 125 ISO224B
ISO224BDWVR ACTIVE SOIC DWV 8 1000 RoHS & Green NIPDAU Level-3-260C-168 HR -55 to 125 ISO224B
(1)
The marketing status values are defined as follows:
ACTIVE: Product device recommended for new designs.
LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect.
NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in a new design.
PREVIEW: Device has been announced but is not in production. Samples may or may not be available.
OBSOLETE: TI has discontinued the production of the device.
(2)
RoHS: TI defines "RoHS" to mean semiconductor products that are compliant with the current EU RoHS requirements for all 10 RoHS substances, including the requirement that RoHS substance
do not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered at high temperatures, "RoHS" products are suitable for use in specified lead-free processes. TI may
reference these types of products as "Pb-Free".
RoHS Exempt: TI defines "RoHS Exempt" to mean products that contain lead but are compliant with EU RoHS pursuant to a specific EU RoHS exemption.
Green: TI defines "Green" to mean the content of Chlorine (Cl) and Bromine (Br) based flame retardants meet JS709B low halogen requirements of <=1000ppm threshold. Antimony trioxide based
flame retardants must also meet the <=1000ppm threshold requirement.
(3)
MSL, Peak Temp. - The Moisture Sensitivity Level rating according to the JEDEC industry standard classifications, and peak solder temperature.
(4)
There may be additional marking, which relates to the logo, the lot trace code information, or the environmental category on the device.
(5)
Multiple Device Markings will be inside parentheses. Only one Device Marking contained in parentheses and separated by a "~" will appear on a device. If a line is indented then it is a continuation
of the previous line and the two combined represent the entire Device Marking for that device.
(6)
Lead finish/Ball material - Orderable Devices may have multiple material finish options. Finish options are separated by a vertical ruled line. Lead finish/Ball material values may wrap to two
lines if the finish value exceeds the maximum column width.
Important Information and Disclaimer:The information provided on this page represents TI's knowledge and belief as of the date that it is provided. TI bases its knowledge and belief on information
provided by third parties, and makes no representation or warranty as to the accuracy of such information. Efforts are underway to better integrate information from third parties. TI has taken and
Addendum-Page 1
PACKAGE OPTION ADDENDUM
www.ti.com 10-Dec-2020
continues to take reasonable steps to provide representative and accurate information but may not have conducted destructive testing or chemical analysis on incoming materials and chemicals.
TI and TI suppliers consider certain information to be proprietary, and thus CAS numbers and other limited information may not be available for release.
In no event shall TI's liability arising out of such information exceed the total purchase price of the TI part(s) at issue in this document sold by TI to Customer on an annual basis.
Addendum-Page 2
PACKAGE MATERIALS INFORMATION
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Pack Materials-Page 1
PACKAGE MATERIALS INFORMATION
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Pack Materials-Page 2
PACKAGE MATERIALS INFORMATION
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TUBE
Pack Materials-Page 3
PACKAGE OUTLINE
SEATING PLANE
11.5 0.25
PIN 1 ID TYP 0.1 C
AREA
6X 1.27
8
1
5.95 2X
5.75 3.81
NOTE 3
4
5
0.51
8X
0.31
7.6 0.25 C A B
A B 2.8 MAX
7.4
NOTE 4
0.33
TYP
0.13
SEE DETAIL A
(2.286)
0.25
GAGE PLANE
0.46
0.36
0 -8
1.0
0.5 DETAIL A
(2) TYPICAL
4218796/A 09/2013
NOTES:
1. All linear dimensions are in millimeters. Dimensions in parenthesis are for reference only. Dimensioning and tolerancing
per ASME Y14.5M.
2. This drawing is subject to change without notice.
3. This dimension does not include mold flash, protrusions, or gate burrs. Mold flash, protrusions, or gate burrs shall not
exceed 0.15 mm, per side.
4. This dimension does not include interlead flash. Interlead flash shall not exceed 0.25 mm, per side.
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EXAMPLE BOARD LAYOUT
8X (0.6) SYMM
6X (1.27)
(10.9)
4218796/A 09/2013
NOTES: (continued)
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EXAMPLE STENCIL DESIGN
8X (1.8) SYMM
8X (0.6)
SYMM
6X (1.27)
(10.9)
4218796/A 09/2013
NOTES: (continued)
7. Laser cutting apertures with trapezoidal walls and rounded corners may offer better paste release. IPC-7525 may have alternate
design recommendations.
8. Board assembly site may have different recommendations for stencil design.
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