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Skandysys Interview Question

The document contains questions asked in an interview about scan insertion, testing techniques, and concepts like clock gating, fault modeling, and test procedures. Specifically, it asks about the steps in scan insertion, issues faced, requirements from architects, types of latches used, advantages of EDT over normal scan, test times, decompression, fault aliasing, effects of clock gating, differences between atspeed and stuck-at faults, improving test coverage, sources of X-propagation, detecting stuck-at faults with atspeed testing, issues with ATPG, contents of test proc files, measuring Pi and Po, test setup procedures, how ncp works, MBIST, the relationship between compression ratio and coverage, what Occ is

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Mayur Mestry
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294 views2 pages

Skandysys Interview Question

The document contains questions asked in an interview about scan insertion, testing techniques, and concepts like clock gating, fault modeling, and test procedures. Specifically, it asks about the steps in scan insertion, issues faced, requirements from architects, types of latches used, advantages of EDT over normal scan, test times, decompression, fault aliasing, effects of clock gating, differences between atspeed and stuck-at faults, improving test coverage, sources of X-propagation, detecting stuck-at faults with atspeed testing, issues with ATPG, contents of test proc files, measuring Pi and Po, test setup procedures, how ncp works, MBIST, the relationship between compression ratio and coverage, what Occ is

Uploaded by

Mayur Mestry
Copyright
© © All Rights Reserved
We take content rights seriously. If you suspect this is your content, claim it here.
Available Formats
Download as DOCX, PDF, TXT or read online on Scribd
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Skandysys Interview by Mithun 7 Friday 2020

1) Introduce yourself?

2) Explain about your project?

3) Explain the steps involved in scan insertion?

4) What are the issues faced during scan insertion?

5) What are the requirements required from architect team to perform scan insertion?

6) What is lockup latch? Why it is used?

7) What is the difference bw lockup latch & terminal lockup latch?

8) What is advantage of EDT compared to normal scan?

9) What is the test time of EDT?

10) Compression ratio?

11) What does decompressor contains & how does it work?

12) What is fault aliasing?

13) What is clock gating? How does it affect our design and what are the advantages?

14) What is the difference between atspeed and stuckat?

15) What is the difference LoS & LoC?

16) How did you improve the coverage?

17) What are the sources of X-propagation?

18) Does atspeed testing detects stuck at faults?

19) What are the issues faced during ATPG?

20) What does test proc file contains?

21) Why to measure measure Pi & measure Po?

22) What is test setup procedure?

23) Why we are using ncp. How does it work?

24) About MBIST?

25) What is the relation bw compression ratio & test coverage?

26) What is Occ ? Why we need Occ?

27) What are the inputs of Occ?

28) PLL lock?

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