Semiconductor Materials & Device Characterization

SEMICON-LAB Syllabus:-
The semiconductor industry appears to be at or near an inflection point within its history. It is
facing two discontinuities simultaneously. The industry is having to face the physical limits of
existing semiconductor materials and the potential end of Moore’s law. Semiconductor
technology continues to evolve rapidly, enabling the development of new and innovative
applications. This includes emerging fields such as nanotechnology, quantum computing, and
advanced sensor technology. As technology advances, semiconductor devices are becoming
increasingly integrated, efficient, and powerful, driving progress in various sectors and shaping
the future of electronics and information technology.
To understand the fundamentals of semiconductor physics, which includes the
electronic materials, semiconductors and its properties. To provide problem solving experience
and learning of concepts through it in semiconductor physics, in both the classroom and the
laboratory learning environment.
1. Keithley 4200A-SCS Parameter Analyzer

Experiments:
i. DC and pulsed IV measurements of transistors and diodes
ii. Capacitance-Voltage (CV) measurements of semiconductor devices
iii. Noise measurements and low-level signal characterization
iv. Time-domain measurements and pulsed testing
v. Temperature-dependent measurements using a temperature chuck
vi. Advanced scripting for automated testing and parameter sweeps
vii. Microwave and RF device characterization

Applications: Device characterization, Process development and Monitoring, DC and AC

parametric testing, Material Science Research, Reliability testing, Device modelling and
simulation, MEMS and NEMS Testing, Photovoltaic Device testing, Advanced process
control, Failure analysis.
2. Lake Shore Hall Measurement

Experiments:
i. Hall effect measurements on semiconductor wafers and thin films
ii. Characterization of Hall carriers in magnetic materials
iii. Determination of carrier type (n-type or p-type) and carrier concentration
iv. Investigation of mobility and resistivity under varying conditions
v. Temperature-dependent Hall effect studies
vi. Measurement of magnetoresistance and magneto transport properties
vii. Custom experiments based on participants' research interests
Applications: Semiconductor Characterization, Material analysis and Research, Magnetic
Field Measurement, Resistivity testing.

3. Resistivity Measurement (Source Meter (2450 SMU) and Signatone S302 Resistivity
Stand)

Experiments :
i. Sheet resistance measurements of semiconductor wafers and thin films
ii. Resistivity characterization of conductive and semiconductor materials
iii. Temperature-dependent resistivity measurements
iv. Resistivity mapping and spatial variations analysis
v. Customized test sequences for unique material characterization
vi. Material resistivity under variable conditions (e.g., temperature, humidity)
vii. Resistivity measurements on various sample geometries

Applications: Semiconductor device testing and characterization, Thin-flim and Nanomaterial

research, Electrochemical studies, Material Testing and characterization, LED and
Optoelectronic device testing, photovoltaic device testing, sensor calibration, Circuit and
component characterization, RF and Microwave device testing, Automated testing.
4. Conductivity Measurement (AC & DC Current Source (6221), and Nanovoltmeter
(2182A)).

Experiments:
i. Sheet resistance measurements using the 4-point probe technique
ii. DC and AC current sourcing for material testing
iii. Nanovolt measurements for low-level signal detection
iv. Temperature-dependent resistivity measurements
v. Noise measurements and signal-to-noise ratio analysis
vi. Impedance and frequency response measurements

Applications of AC & DC current source: Semiconductor device testing, material

characterization, electrochemical studies, electronic component testing, precision
measurements, nanotechnology research, sensor testing and calibration, Automated test
systems.

Applications of Nanovoltmeter: Low-level voltage measurement, Resistance measurements,

Tempearture sensor calibration, photodetector and sensor testing, low current measurement,
Metrology and calibration, Quantum research.

5. High Resistance Measurement (High Resistance Electrometer (Keithley 6517B))

Experiments:
i. High resistance measurements on insulating materials
ii. Characterization of resistivity in semiconductor materials
iii. Leakage current measurements in high resistivity devices
iv. Surface and volume resistivity measurements
v. Dielectric constant measurements using capacitance compensation
vi. Temperature-dependent resistivity studies
Applications: Material Characterization, Semiconductor Testing, Dielectric Strength Testing,
Surface Contamination Analysis, Leakage current testing, Ionization current measurement,
Battery and Fuel cell Research, Electrostatic charge measurement, Environmental Monitoring,
Nanotechnology and Thin films.
6. 2-Series and 5-Series Mixed Oscilloscope

Experiments:
i. Basic signal measurements (voltage, frequency, period, etc.)
ii. Digital signal analysis and debugging
iii. Timing analysis and eye diagram measurements
iv. Serial bus decoding and protocol analysis
v. Spectrum analysis and frequency domain measurements
vi. Power analysis for energy-efficient designs
vii. Optional: Exploring additional features specific to the model

2- Series MSO Applications: Digital circuit debugging, Analog signal analysis, embedded
system development, serial protocol analysis, power integrity testing, signal characterization,
automotive electronics.

5- Series MSO Applications: High speed signal analysis, RF and wireless communications,
Digital and mixed-signal debugging, Memory bus analysis, signal integrity and jitter analysis,
Electronic design validation, power electronics testing, embedded system analysis, Aerospace
and defence applications.

7 . Arbitrary Function Generator (Tektronix AFG31102):

Experiments:
i. Generating basic waveforms (sine, square, triangle, etc.)
ii. Creating and importing custom arbitrary waveforms
iii. Modulation techniques (AM, FM, PM) and their applications
iv. Noise generation for testing and debugging
v. Burst mode for simulating periodic events
vi. Frequency sweep and chirp experiments
vii. Coherent summing of channels for complex waveforms

Applications: Electronic circuit testing and debugging, Signal integrity testing, Frequency
Response analysis, Research and development, Characterization of components, Testing RF
and Microwave devices, Modulation and Demodulation studies, Noise and Jitter Injection,
Sensor and Actuators testing, sensors and Actuators testing, Vibration testing, Automotive
testing.

8. Digital Multimeter (DMM6500 and DMM7510 M)

Experiments:
i. DC voltage and current measurements with different load types
ii. Resistance measurements and 4-wire Kelvin sensing technique
iii. Temperature measurements using thermocouples
iv. Capacitance measurements and characterization of capacitors
v. Real-time data logging and visualization of measured values
vi. Automated testing using digital I/O (DMM7510)
vii. Statistical analysis of measurement data
viii. Front-panel bar graph application for visualizing dynamic signal
Applications: Electronic circuits and systems, High accuracy measurement, Data logging and
logging, Remote monitoring, Prototyping and testing, automated testing, production testing,
Automotive electronics, Aerospace testing, Temperature and Humidity testing.

9. Data Acquisition System (DAQ 6510)

Experiments:

i. Basic voltage and current measurements

ii. Resistance measurements and temperature sensing
iii. 2-wire and 4-wire resistance measurements
iv. Diode and transistor characterization
v. AC voltage and current measurements
vi. Data logging and automated scanning
vii. Real-time data visualization and analysis
viii. Remote control using SCPI commands

Applications: Measurement and logging, Process monitoring, quality control, Automated test
systems, Device characterization, Power consumption analysis, prototyping and testing,
process efficiency analysis, Automotive electronics, Aerospace testing.

10. Battery test equipment (Keithley 2281S Precision DC Supply & Battery Simulator
and 2302 Battery Simulators)

Experiments:
i. Battery charge and discharge performance testing
ii. Capacity and efficiency measurements of batteries
iii. Dynamic load testing for battery-powered devices (2302)
iv. Multi-step battery testing for real-world scenarios (2302)
v. Emulation of different battery chemistries for compatibility testing
vi. Real-time data logging and visualization of battery performance
vii. Automated battery testing and parameter sweeps

Applications: Battery Management systems testing, Battery charging and Discharging

simulation, Battery cycle testing, battery state of charge (SoC) Testing, Component
characterization, Power device testing, Power supply testing, Electronic system testing, Device
testing, Prototyping and validation.