Renishaw touch-trigger

probing technology
Rugged and flexible solutions for
discrete point measurement on CMMs
Touch-trigger probe technologies
Resistive
• Simple
• Compact
• Rugged

Strain-gauge
• Solid-state switching
• High accuracy and repeatability
• Long operating life
Kinematic resistive probe operation
A trigger signal is generated A spring holds the stylus
on contact with the component against the kinematic contacts
surface and is used to stop and returns the probe to a
the machine seated position following
contact between the stylus
and the part
Three rods, each resting on two
balls, providing six points of contact
in a kinematic location
The stylus ball is uniquely located,
returning to the same position to
within 0.00004 “ (1 micron)
Kinematic resistive probe operation
• Probe in seated position All kinematics in contact

Motion of
machine
Kinematic resistive probe operation
• Probe in seated position

• Stylus makes contact with component

Kinematic resistive probe operation
• Probe in seated position Reactive force
• Stylus makes contact with component

• Contact force resisted by reactive force in probe

mechanism resulting in bending of the stylus

Contact
force
Kinematic resistive probe operation
• Probe in seated position Pivot about Contacts
these contacts separate
• Stylus makes contact with component

• Contact force resisted by reactive force in probe

mechanism resulting in bending of the stylus

• Stylus assembly pivots about kinematic contacts,

resulting in one or two contacts moving apart
• Trigger generated before contacts separate
Kinematic resistive probe operation
• Probe in seated position

• Stylus makes contact with component

• Contact force resisted by reactive force in probe

mechanism resulting in bending of the stylus

• Stylus assembly pivots about kinematic contacts,

resulting in one or two contacts moving apart
• Trigger generated before contacts separate

• Machine backs off surface and probe reseats

Kinematic resistive probe operation
Kinematic
Electrical switching Section through kinematics: attached
• Electrical circuit through contacts to stylus

• Resistance measured
Current flows
• Contact patches reduce in through kinematics
size as stylus forces build
Kinematics bonded to (and
Close-up view Resistance rises as
insulated from) probe body
of kinematics: area reduces (R = /A)

Contact patch shrinks as Elastic deformation

stylus force balances
spring force
Kinematic resistive probe operation
Electrical switching Resistance

• Resistance breaches
threshold and probe triggers Force on kinematics
when stylus is in
• Kinematics are still in free space
contact when probe triggers
• Stylus in defined position
Trigger
• Current cut before threshold
kinematics separate to
avoid arcing

Trigger signal generated Force on kinematics

Factors in measurement performance
Pre-travel
• Stylus bending under contact loads before trigger
threshold is reached
• Pre-travel depends on FC and L
• Trigger is generated a short distance after the stylus
first touches the component
FC × L = FS × R
L and FS are constant
FC is proportional to R
Factors in measurement performance
Pre-travel variation - ‘lobing’ Top view
• Trigger force depends on probing
direction, since pivot point varies
• FC is proportional to R
• Therefore, pre-travel varies around
the XY plane
Factors in measurement performance
Pre-travel variation - ‘lobing’

High force Low force

direction: direction:

R1 > R2
FC1 > FC2

Pivot Pivot
point point
Factors in measurement performance
Pre-travel variation - ‘lobing’
• Trigger force in Z direction is higher than in XY plane
• No mechanical advantage over spring
• FC = FS
• Kinematic resistive probes exhibit 3D (XYZ) pre-travel variation
• Combination of Z and XY trigger effects
• Low XYZ PTV useful for contoured part inspection
Test data:
• ISO 10360-2 3D form
• TP20 with 50 mm stylus: 4.0 µm (0.00016 in)
Factors in measurement performance
Probe calibration
• Pre-travel can be compensated by probe calibration
• A datum feature (of known size and position) is measured to
establish the average pre-travel
• Key performance factor is repeatability

Limitations
• On complex parts, many probing directions may be needed
• Low PTV means simple calibration can be used for complex
measurements
• If PTV is significant compared to allowable measurement error,
may need to qualify the probe / stylus in each probing direction
Factors in measurement performance
Typical pre-travel variation
Scale in µm
• XY plane

Probe: TP6
Stylus: 50 mm
Pre-travel variation: 3.28 µm
Trigger force: 15 gram
Repeatability (2 Sigma): 0.5 µm
Factors in measurement performance
Repeatability
• The ability of a probe to trigger at the same point each time
• A random error with a normal distribution
• For a given probe and probing condition, repeatability is
equal to twice the standard deviation (2) of the normal
distribution
• 95% confidence level that all readings taken in this
mode will repeat within ±2 from a mean value
Factors in measurement performance
Hysteresis
• Error arising from the direction of the preceding probing move
• Maximum hysteresis occurs when a measurement follows a probing
moves in opposite directions to each other in the probe’s XY plane
• Hysteresis error increases linearly with trigger force and stylus length
• Kinematic mechanism minimises hysteresis
Factors in measurement performance
Ranked in terms of importance
Repeatability
• Key requirement of any trigger probe
• Fundamental limit on system measurement performance
• Hysteresis contributes to measurement repeatability
Pre-travel variation
• Can be calibrated, provided all probing directions are known
• Measurement accuracy will be reduced if probe used in un-qualified direction and PTV is high
• Increases rapidly with stylus length
Hysteresis
• Small error factor for probes with kinematic mechanisms
Kinematic resistive probe technology
Simple electro-mechanical switching

• Resistive probes use the probe kinematics as an

electrical trigger circuit

• Pre-travel variation is significant due to the

arrangement of the kinematics
Kinematic resistive probe characteristics
• Extremely robust • Universal fitment
• Compact • Simple interfacing
• Good part access • Cost-effective
• Suitable for long extensions • Finite operating life
• Good repeatability • Electro-mechanical
switching
• Excellent performance with
shorter styli
• Low contact and overtravel
forces minimise stylus
bending and part deflection
TP20 stylus changing probe
Concept
• Direct replacement for TP2
• Ultra-compact probe at just Ø13.2 mm
• TP20 features fast and highly repeatable stylus changing
• Manual or automatic
• Enhanced functionality through extended force and
extension modules
TP20 stylus changing probe
Benefits
• Reduced cycle times achieved by fast stylus changing
without re-qualification
• Optimised probe and stylus performance with seven
specialised probe modules
• Easily retrofitted to all Renishaw standard probe heads
(M8 or autojoint coupling)
• Compatible with existing touch-trigger probe interfaces
• Metrology performance equivalent to industry proven TP2
system but with greater flexibility of operation
TP20 stylus modules
Optimal measuring performance
• Seven specialised probe modules allow
optimisation of stylus arrangement for best
accuracy and feature access in all user
applications
• Module attaches to probe body via a quick
release, highly repeatable kinematic coupling
• Module range covers all forces supported by TP2
TP20
• 6-way module replaces TP2-6W
probe
body
Comparative module and stylus lengths
Soft materials

General use

Longer or heavier styli

Grooves and undercuts

Reach up to 125 mm (5 in)

Strain-gauge probe technology
• Solid state switching
• Silicon strain gauges measure contact forces transmitted through the stylus
• Trigger signal generated once a threshold force is reached
• Consistent, low trigger force in all directions
• Kinematics retain the stylus / not used for triggering
Strain-gauge probe operation
Force sensing
Silicon strain gauges
• Four strain gauges are mounted on webs
mounted on webs
inside the probe body
(1 out of 4 shown)
• X, Y and Z directions, plus one control
gauge to counter thermal drift
• Low contact forces from the stylus tip is
transmitted via the kinematics, which remain
seated at these low forces Kinematics remain
seated at low FC
• Gauges measure force in each direction and
trigger once force threshold is breached (before
kinematics are unseated)
Strain-gauge probe operation
Low lobing measurement
Scale in µm
• Trigger force is uniform in all directions
• Very low pre-travel variation

Probe: TP7M
Stylus: 50 mm M4
Maximum variation: 0.34 µm
Sensitivity: HIGH
Strain-gauge probe operation
Lobing comparison
• Plots at same scale

Strain-gauge
XY PTV = 0.34 m

Kinematic resistive
XY PTV = 3.28 m
Strain-gauge probe characteristics
High accuracy and repeatability
• Probe accuracy even better than standard kinematic probes
• Minimal lobing (very low pre-travel variation)
Reliable operation
• No reseat failures
• Suitable for intensive "peck" or "stitch” scanning
• Life greater than 10 million triggers
Flexibility
• Long stylus reach
• Suitable for mounting on articulating heads and extension bars
• Stylus changing available on some models
TP7M strain-gauge probe
Concept
• 25 mm (1 in) diameter probe
• Autojoint mounted for use with PH10M PLUS
• Multi-wire probe output
TP7M strain-gauge probe
Benefits
• Highest accuracy, even when used with long styli - up to
180 mm long ("GF" range)
• Compatible with full range of multi-wired probe heads and
extension bars for flexible part access
• Plus general strain-gauge benefits:
• Non-lobing
• No reseat failures
• Extended operating life
• 6-way measuring capability
TP7M performance
Uni - directional repeatability

0.3

0.25

0.2
Microns

0.15 Test results from

five probes
0.1

0.05

0
0

10

12

14

16

18

20
No. of triggers (*1,000,000)
TP7M performance
XY (2D) form measurement deviation

0.6

0.5

0.4
Microns

0.3 Test results from

five probes
0.2

0.1

0
0

10

12

14

16

18

20
No. of triggers (*1,000,000)
TP200 stylus changing probe
Concept
• TP2-sized probe, with strain gauge accuracy
• Stylus changing for greater flexibility and measurement automation
• 2-wire probe output (like TP20)
Benefits
• Long stylus reach - up to 100 mm long ("GF" range)
• Match stylus to the workpiece using high-speed stylus changing
• Improve accuracy for each feature
• No re-qualification
• Manual or automatic changing with SCR200
• Compatible with full range of heads and extension bars
TP200 stylus modules
Optimal sensor performance
• 6-way operation ±X, ±Y and ±Z
• Two types of module:
• SF (standard force)
• LF (low force) provides lower overtravel force option
for use with small ball styli and for probing soft
materials
• Detachable from probe sensor via a highly repeatable
magnetic coupling
• Provides overtravel capability
• Suitable for both automatic and manual stylus changing
• Module life of >10 million triggers
Trigger probe measurement performance comparison
Renishaw touch-trigger
probing technology

Thank you for your attention…

 SP25M
The world’s most compact
and versatile scanning
probe system

Issue 10 technology
SP25M brings exciting new
benefits

SP25M encompasses
™ technology

System components - a
highly modular concept

Design characteristics,
performance & specification

Ordering information
• Two sensors in one!
– a SCANNING probe for form measurement
and reverse engineering applications,
capable of high-accuracy scanning across a
stylus length range of 20 mm to 200 mm
– a TOUCH TRIGGER probe, using the
versatile TP20 range of stylus modules

Flexibility through
modular design

Scanning with SP25M

is fast, accurate and
flexible
• Unmatched flexibility
– highly modular design permits the perfect
measurement solution to suit the application
– the most flexible change rack system ever!
• Cost effectiveness
– low priced entry-level scanning kits with easy
upgrade to include other system elements

Flexibility through
modular design

Flexible module and

stylus changing
• Feature access
– ultra-compact at Ø25 mm for superior
part accessibility (small enough to be
inserted into many features) Probe
small
enough to
enter the
part

Compact size
enhances feature
access
• Feature access
– total reach of nearly
400 mm (15.7 in) is
100 mm
possible by using a extensi
probe extension bar on
– three scanning
modules each Carbon fibre extensions for
optimised for a accuracy and long EWL
specific range of
stylus lengths
– stiff carbon fibre
stylus extensions
for excellent effective
working length
– uses M3 styli up to
200 mm (7.9 in)
Feature access - SP25M
• probe can be mounted on an
articulating head means that
many features can be
accessed with fewer styli
• lower stylus costs
• shorter cycle times
SP25M brings exciting new
benefits

SP25M encompasses
™ technology

System components - a
highly modular concept

Design characteristics,
performance & specification

Ordering information
Our innovative ™ technology
scanning philosophy is encompassed by
the SP25M probe system ...
• Speed and accuracy
– sensors with high dynamic response to provide high
accuracy data at high speed
– accuracy through sophisticated probe calibration
– match styli materials to applications for best results

• Flexibility
– probe changing, stylus changing, articulation

• Cost effectiveness
– innovative hardware and scanning techniques reduce
complexity
– robust designs and responsive service for lower lifetime
costs
SP25M’s specific design objectives have
been met ...
• the most compact scanning and touch
trigger probe available
• innovative pivoting sensor design optimised
for high accuracy across 20mm to 200 mm
stylus range
• system modularity to provide unmatched
user flexibility
• passive design to avoid unnecessary system
complexity
• isolated optical metrology to avoid stacked
axis errors
• compact and light, with excellent dynamic
response
SP25M brings exciting new
benefits

SP25M encompasses
™ technology

System components - a
highly modular concept

Design characteristics,
performance & specification

Ordering information
SP25M - product naming ... SP25M
Probe Body
SM25-1/2/3

TM25-20

TP20
FCR25 module

PA25-20 PA25-SH SH25-1/2/3

SP25M - as a SCANNING PROBE ...
• the probe body has Autojoint mounting
for compatibility with PH10M/Q, PM6M
and PHS1 heads, extensions bars and
ACR1/2 sensor changers
• there are three scanning modules
(SM25-1/2/3), which have matching
stylus holders (SH25-1/2/3)

20-50 mm
– each has a design optimised to
maintain high accuracy and low

50-105 mm
contact forces over the following
dedicated range of stylus lengths:
SM25-1 + SH25-1 (20mm - 50mm)
SM25-2 + SH25-2 (50mm - 105mm)

120-200 mm
SM25-3 + SH25-3 (120mm - 200mm)
SP25M - as a TOUCH TRIGGER PROBE ...
• the probe body - would have the SM25-#
scanning module replaced by the...
• TTP module adaptor (TM25-20) which
directly carries any of Renishaw’s TP20
range of stylus modules:
– TP20 LF/SF/MF/EF
– TP20 EM1/EM2
– TP20-6W
FCR25 - the most flexible change rack FCR25
ever from Renishaw …
• rapidly change between scanning and
touch trigger mode to match the ideal
solution to the application
• FCR25 is a triple-port unit, each port is
easily configured to carry any system PA25-20/SH
element of the system:
SM25-1/2/3 SH25-1/2/3

TM25-20 TP20 modules

• FCR25’s are mounted to the MRS to

thus provide 3, 6, 9, 12, 15 etc port
systems MRS
• provides unmatched versatility !!!
FCR25 - will also be used with an integral
leg to provide compact 3/6 port
standalone racks…
FCR25-L6 - the 6 port version
FCR25-L6
FCR25-L3 - the 3 port version
• ideally suited to vision CMM’s and smaller
traditional CMM’s where working volume is
restricted
• lowest possible height
• can hold SM25-2 + SH25-2 (with 100 mm
stylus length)
FCR25-L3
• overtravel protection (as for MCR20)
• provides unmatched versatility !!!
Interfacing options - SP25M can be
integrated by different methods...

• OEM’s controller
– AC3 interface card (ISA Bus) is
provided

• Renishaw’s UCC1 controller

– UCC1 with full scanning upgrade is
required plus a daughter card for the
SP25M
SP25M brings exciting new
benefits

SP25M encompasses
™ technology

System components - a
highly modular concept

Design characteristics,
performance & specification

Ordering information
 Autojoint
SP25M probe body houses
the optical transducer ...
• isolated optical transducer uses
proven IRED beams and PSD
sensor technology (see later slide)
• Autojoint provides compatibility
with all Renishaw’s multiwired
heads and extension bars Optical
• The SM25-1/2/3 scanning transducer
system
modules and TM25-20 touch
trigger adaptor mount directly to
the body via repeatable
kinematic joint Kinematic mount for
SM25-# or TM25-20
• ultra-compact mechanism - fits
inside Ø25 mm (Ø1 in) probe
SM25-1/2/3 scanning modules
house the motion system ...
• patented, pivoting mechanism
featuring two diaphragm springs
• optimised to give very low
inertia, low spring rates of
< 0.6 N/mm and high accuracy
over dedicated stylus range
‘Isle of Man’
• high natural frequency (rigid spring creates
member) when in contact XY pivot point
with the component
• ultra-compact mechanism - fits
inside Ø25 mm (Ø1 in) probe
Second spring
• 0.5 mm spherical radius allows translation
measuring range in all directions
SP25M designed for “isolated 2 PSDs (in body)
optical metrology” detect stylus 2 IRED sources
deflection (in body)
• IREDs in probe body reflect light
off mirrors in scanning module
IRED
back onto PSDs beams
• highly integrity performance -
2 Mirrors (in
motion is faithfully translated to scan module)
PSD’s reflect beams
back to PSD’s
• non-linear outputs are
compensated by sophisticated
3rd order polynomial algorithms
• no moving wires Kinematic joint line
between probe
body and scanning
module
 2. Swept area
Why are there 3 scan modules to cover the across PSD is
optimised over
stylus range? - traditionally, increasing specified
stylus length leads to reducing accuracy stylus range

SP25M addresses this characteristic … Module lengths

increase as spring
gap changes to
• scan modules designed for optimum output achieve desired
from PSD sensors when using shortest stylus pivot motion

at max operating deflection (resulting in largest pivot

motion/swept area over PSD’s by IRED beams - so giving best
whilst
gain, resolution and highest accuracy metrology)
restricting loss of performance as longer stylus Specified
stylus
is used (by ensuring sufficient coverage of sensor is maintained range
1. Design optimised
resulting in low degradation of accuracy performance)
such that max
operating deflection
• if excessive stylus length is used, the pivot results in highest
motion angle rapidly reduces (resulting in less swept performance of
optical transducer
area over PSD’s and non optimised transducer performance giving
reduced accuracy)
3. Reduced performance of
sensor if longer stylus is used
Why are there 3 scan modules to cover the
stylus range? - traditionally, increasing
stylus length leads to reducing accuracy
SP25M addresses this characteristic … Module lengths
increase as spring
• the dedicated range for each stylus module gap changes to
achieve desired
also means that contact forces at the tip can be pivot motion
closely maintained (if we were to use excessive stylus
lengths the force would reduce, reducing stability and accuracy)

• the fixed extension design of SH25-2/3

Specified
prevents use of illegally short stylus stylus
range
• high accuracy data maintained as stylus length 4. Design optimised to
maintain a nominal
increases (see next slide) deflection force of 60
g/mm across all three
• unique design of SP25M can result in 2-3 times modules
better accuracy than SP600
5. Possible unsatisfactory
contact force if longer stylus
is used
 Superior scanning performance ...
• accurate form measurement, even with long
styli
ISO Tij
• excellent reach capability
m ISO 10360-4 test data
3.5
Test conditions:
CMM spec: 0.5 + L / 1000
Test speed: 5 mm/sec
3.0 Controller: UCC1
Filter: None / 60 Hz
2.5 Values: Unknown path

2.0
Filtered (60 Hz harmonic)
1.5
No filter (raw data)
1.0 Module/Stylus used:
0.5 21 = SM25-1 with 21 x 3 mm, SS stem
50 = SM25-1 with 50 x 5 mm, Ceramic
0 stem
21 50 100 200 100 = SM25-2 with 100 x 6 mm, GF stem
Stylus length (mm) 200 = SM25-3 with 200 x 6 mm, GF stem
Design characteristics, performance and specification

Noise comparison - SP600M typical plot

Date Time : 11-Oct-01 9:45
30
Ring Gauge Ø 49.9982 mm Deflection 0.20 mm Major unit = 5 µm
Stylus ball Ø 6.0000 mm Speed 5.0 mm/s Minor unit = 1 µm
Theorical Radius 21.9991 mm

Best Fitted Circle

x 264.2450 mm
20
y 341.6805 mm
z -62.8915 mm
Radius 21.9974 mm

Radius Error
1.72 µm
10

Normal errors (µm)

RMS 1.25 0.43
Max 4.4 1.4
Min -4.0 -1.5
Span 8.5 2.9
0
Harmonic filter Order = 60 upr
-30 -20 -10 0 10 20 30
Cut off wc = 376.99 rad
( upr = Undulation Per Revolution )
Form identification
Ellipse 0.28 µm 356.85 °
Tri lobe 0.05 µm 208.54 °
-10

Circle Plane Normal

nx 0
ny 0
nz 1
-20
Data collected with 2673 points
2 turns
Circle
Data
Max
Min
Harmonic 60 -30
Design characteristics, performance and specification
Noise comparison - SP25M has lower noise and better gain
SP25M specification:
Mounting Autojoint mount (compatible with PH10M, PH6M, PHS1)
- may also be mounted using an extension bar

Probe physical size 25mm - length variable (see dimensional slide)

Probe mass SP25M probe body 65g

SM25-1 + SH25-1 35g (excl stylus)
SM25-2 + SH25-2 40g (excl stylus)
SM25-3 + SH25-3 49g (excl stylus)
TM25-20 40g (excl TP20
module)

Measurement range ±0.5mm spherical radius in all orientations

Overtravel range X,Y = ±2.0mm (min) +Z = 1.7mm -Z = 1.2mm

SP25M specification:
Spring rate 60 - 20 g/mm nominal (dependant on stylus length)

Stylus range M3, standard range - new GF styli available

Stylus carrying range SM25-1 + SH25-1 Use 21-50mm stylus

(EWL =
21-50mm)

SM25-1 + SH25-1 Use 21-75mm stylus

(EWL =
50-105mm)

SM25-1 + SH25-1 Use 21-100mm stylus

(EWL =
120-200mm)

Crash protection X&Y via break-off of module/stylus holder

Z via bumpstop design
SP25M specification:
Power supply +12V to -12V, 5V (±5%) DC

Signal outputs Non-linear and non-orthogonal analogue

outputs. Rate, gain and
resolution are not fixed

Calibration method Non-linear, 3rd order polynomial method is required

Automatic changer(s) FCR25 (triple ported unit for mounting to MRS - each port can
be configured to accept any system
element)
FCR25-L3 (3 port standalone rack with single leg)
FCR25-L6 (6 port standalone rack with single leg)
 Rev 02
45.55

typ
Ø25

62.5
TP20
module
Ø13.25

Use stylus 16.95

range 21 - 50mm
EWL = 21-50 74.05

SP25M basic dimensions (mm)

SH25-1

Use stylus 26.25

range 21 - 75mm
EWL = 50-105 111.65
SH25-2

Use stylus 33.85

range 21 - 100mm
EWL = 120-200 195.4
SH25-3

48.05 2.0 typ

Ø4 typ
(on SH25-2/3)
Design characteristics, performance and specification

FCR25 basic dimensions (mm)

SP25M brings exciting new
benefits

SP25M encompasses
™ technology

System components - a
highly modular concept

Design characteristics,
performance & specification

Ordering information
Please contact your local Renishaw supplier for
pricing details
SAVES 20%
OFF LIST

Part No. Description

A-2237-1015 SP25M special SCAN/TTP full combination kit

The full scanning system plus the capability to use TP20 modules -
this kit includes all the equipment in these separate kits (see later slide)
and is supplied as one complete kit:

- 1 x A-2237-1001 SP25M scanning kit #1 - includes SM25-

1/SH25-1
- 1 x A-2237-1102 SM25-2 scanning module kit
Please contact your local Renishaw supplier for pricing details

LOW COST ENTRY

LEVEL SCAN
PROBE KITS
Part No. Description

A-2237-1001 SP25M scanning probe kit #1

1 x SP25M body, 1 x SM25-1 scanning module kit (see later slide)

A-2237-1002 SP25M scanning probe kit #2

1 x SP25M body, 1 x SM25-2 scanning module kit (see later slide)

A-2237-1003 SP25M scanning probe kit #3

1 x SP25M body, 1 x SM25-3 scanning module kit (see later slide)
Please contact your local Renishaw supplier for
pricing details
SCAN MODULE
KITS

Part No. Description

A-2237-1101 SM25-1 scanning module kit

1 x SM25-1, 2 x SH25-1

A-2237-1102 SM25-2 scanning module kit

1 x SM25-2, 2 x SH25-2

A-2237-1103 SP25M scanning probe kit #3

1 x SM25-3, 2 x SH25-3
Please contact your local Renishaw supplier for pricing
details

TOUCH
TRIGGER
MODULE
KITS
Part No. Description

A-2237-1200 TM25-20 TTP module adaptor only

1 x TM25-20

A-2237-1201 TM25-20 TTP module adaptor kit #1

1 x TM25-20, 2 x TP20 ‘STD’ modules
Please contact your local Renishaw supplier for pricing details

CHANGE RACK
Part No. Description OPTIONS

A-2237-1401 FCR25 flexible change rack (mounts to MRS)

1 x FCR25, 3 x PA25-SH, 3 x PA25-20
(PA25-SH/20 are Port Adaptor inserts for SH25-1/2/3 stylus holders and TP20 modules)

A-2237-tbc 3 port FCR25 rack with leg (standalone rack)

1 x FCR25 with integral leg, 3 x PA25-SH, 3 x PA25-20

A-2237-tbc 6 port FCR25 rack with leg (standalone rack)

2 x FCR25 with integral leg, 3 x PA25-SH, 3 x PA25-20

Note - the standalone racks will be available later

Please contact your local Renishaw supplier for
pricing details
CONTROLLER
INTERFACING

Part No. Description

A-2237-1601 AC3 interface card

A-1333-0022 UCC1 SP25M daughter card

SP25M
The world’s most compact
and versatile scanning
probe system

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