LS1028A
LS1028A
Rev. 0 — 12/2019
• LS1028A has two cores and LS1018A has a single core. • Graphics processing unit
• Two 32/64-bit ARM® Cortex®-A72 cores with the — Supports Geometry rate 100 Mtri/sec, Pixel rate
following capabilities: 650 Mpixel/sec, GFLOPS(32-bit high precision) =
10.4
— Up to 1.5 GHz operation
— Supports OpenGL ES 3.0, 2.0, 1.1
— Single-threaded cores with 48KB L1 instruction
cache and 32KB L1 data cache — Supports OpenCL 1.1, 1.2
— Single cluster of two cores sharing 1MB L2 cache • TSN-capable Ethernet Switch with four external ports
• Cache Coherent Interconnect (CCI-400) • Ethernet Controller (ENETC) with TSN functionality
— Up to 400 MHz operation — One RGMII interface
• One 32-bit DDR3L/DDR4 SDRAM memory controller — One 1G/2.5G SerDes-based interface with TSN
with ECC support support
— Up to 1.6 GT/s • Additional peripheral interfaces
• Four SerDes lanes for high-speed peripheral interfaces — Two high-speed USB 2.0/3.0 controllers with
integrated PHY
— Two PCI Express 3.0 controllers
— Two Enhanced Secure Digital Host Controllers
— One Serial ATA (SATA 6 Gbit/s) controller
(eSDHC) supporting SD 3.0, eMMC 4.4 and eMMC
— Up to four SGMII interfaces supporting four switch 4.5 and eMMC 5.1
ports at 1000 Mbps
— Two Controller Area Network (CAN) modules,
— Up to one 2.5G-SGMII, supporting one Ethernet optionally supporting Flexible Data-rate
controller
— Three Serial Peripheral Interface (SPI) controllers
— Up to four 2.5G-SGMII supporting four switch ports
— Eight I2C controllers
at 2.5 Gbps
— One 16550-compliant DUART
— Up to one QSGMII interface, supporting four switch
ports — Six LPUARTs
— Supports 1000Base-KX — One FlexSPI controller
— Up to one 10G-SXGMII, supporting one Ethernet — General Purpose IO (GPIO)
controller at 2.5 Gbps, 1000 Mbps, 100 Mbps, and
— Eight FlexTimers/PWM controllers
10 Mbps
— Six Synchronous Audio Interface (SAI)
— Up to one 10G-QXGMII, supporting four switch
ports with independent rates of 2.5 Gbps, 1000 • One Queue Direct Memory Access Controller (qDMA)
Mbps, 100 Mbps, and 10 Mbps • One Enhanced Direct Memory Access Controller (eDMA)
• One LCD controller and Display port/eDP interface • Generic Interrupt Controller (GIC)
— Supports Display port 1.3 and eDP 1.4 • Thermal Monitor Unit (TMU)
— Supports link transfer rates up to HBR2 (5.4Gbit/s) • FC-PBGA package, 17 mm x 17 mm
and display resolution upto 4Kp60
NXP reserves the right to change the detail specifications as may be required to
permit improvements in the design of its products.
Contents
1 Introduction
LS1028A is a cost-effective, power-efficient, and highly integrated system-on-chip (SoC) design that extends the reach of the
NXP value-performance line of QorIQ communications processors. Featuring extremely power-efficient 64-bit Arm® Cortex®-
A72 cores with ECC-protected L1 and L2 cache memories for high reliability, running up to 1.5 GHz.
This chip can be used for networking and wireless access points, industrial gateways, industrial automation, printing, imaging,
and M2M for enterprise and consumer networking and router applications.
This figure shown below represents the block diagram of the chip.
TSN Switch
FlexSPI PCle 3.0 2.5 GbE
8x Flex Timer
USB 3.0 2.5 GbE
w/PHY
2.5 GbE
Multimedia Interfaces 3D GPU
EDP/DP PHY PCle 3.0 USB 3.0 2.5 TSN GbE
4K LCD Controller w/PHY 1 GbE
2 Pin assignments
1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 27 28 29 30
A A
B B
C C
D D
E E
F F
SEE DETAIL A SEE DETAIL B
G G
H H
J J
K K
L L
M M
N N
P P
R R
T T
U U
V V
W W
Y Y
AA AA
SEE DETAIL C SEE DETAIL D
AB AB
AC AC
AD AD
AE AE
AF AF
AG AG
AH AH
AJ AJ
AK AK
1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 27 28 29 30
Power Ground
1 2 3 4 5 6 7 8 9 10 11 12 13 14 15
USB2_ USB2_ USB2_ DP_ DP_ DP_
A RX_
M
TX_
P
D_
P
GND001 LANE0_
N
LANE1_
N
LANE2_
N
A
TA_
J GND034 GND035 SPI3_
SOUT
USB_
SDVDD1
USB_
HVDD1
USB_
HVDD2
PROG_
MTR PROG_
SFP
J
USB1_
K RX_
M
SPI3_
SIN
SPI3_
SCK
USB_
SDVDD2
USB_
SVDD1
USB_
SVDD2
VDD01 K
USB1_
L RX_
P
GND040
SDHC1_
DAT3 GND041 GND042 GND043 VDD02 GND044 L
M GND047
SDHC1_
VSEL
SDHC1_
CLK VDD06 VDD07 VDD08 GND048 M
N SDHC1_
DAT2
SDHC1_
DAT0 GND051
SDHC1_
CMD GND052 VDD10 GND053 VDD11 N
FA_
P IIC5_
SCL
SDHC1_
DAT1 ANALOG_
PIN
EVDD VDD14 GND057 VDD15 P
R IIC5_
SDA GND061
IIC1_
SCL
TH_
VDD VDD17 GND062 VDD18 GND063 R
1 2 3 4 5 6 7 8 9 10 11 12 13 14 15
Power Ground
Figure 4. Detail A
16 17 18 19 20 21 22 23 24 25 26 27 28 29 30
DP_ DP_
A LANE3_
N
AUX_
N
GND002 D1_
MDM8
GND003
D1_
MDQ20
FA_
VL A
DP_ DP_
B LANE3_
P
AUX_
P
SDHC2_
DS
D1_
MECC1
D1_
MDQS8
D1_
MECC3
D1_
MDQ16 GND005 B
C GND014 GND015
D1_
MECC0 GND016
D1_
MDQS8_B GND017
D1_
MDQ21 C
XSPI1_
D _A_DATA SDHC2_
DAT1
SDHC2_
DAT5
D1_
MDQ28
D1_
MDQ29
D1_
MECC2
D1_
MDQ17
D1_
MDM2 D
E SDHC2_
DAT0
GND022 GND023
D1_
MDQ24 GND024
D1_
MDQS3 GND025 E
F IIC6_
SCL
SDHC2_
DAT3
SDHC2_
CLK
D1_
MDQ25
D1_
MDM3
D1_
MDQS3_B
D1_
MDQ30
D1_
MDQS2 F
G GND031 SDHC2_
DAT4
SDHC2_
CMD
GND032
D1_
MDQ26
GND033
D1_
MDQS2_B G
H IIC6_
SDA
SDHC2_
DAT2
SDHC2_
DAT6
SDHC2_
DAT7
D1_
MDQ27
D1_
MDQ31
D1_
MDQ22
D1_
MDQ18 H
J OVDD1 DP_
OVDD GND036 D1_
MDQ08 GND037 D1_
MDQ12 GND038 J
M VDD09 GND049
PIXEL_
DVDD GND050 G1VDD02
D1_
MDM1
D1_
MDQ00
D1_
MDQ05 M
16 17 18 19 20 21 22 23 24 25 26 27 28 29 30
Power Ground
Figure 5. Detail B
1 2 3 4 5 6 7 8 9 10 11 12 13 14 15
IIC2_ IIC1_ IIC4_
OVDD3 GND066 VDD21 GND067
SDA SDA SDA
T T
IIC2_ IIC3_ GND070 IIC4_ GND071 VDD24 GND072 VDD25
SCL SDA SCL
U U
IIC3_
SCL TDI TMS OVDD4 VDD28 GND076 VDD29
V V
TDO GND080 TBSCAN_ TCK VDD31 GND081 VDD32 GND082
EN_B
W W
TRST_B TEST_ PORESET_B VDD35 GND085 VDD36 GND086
SEL_B
Y Y
SCAN_ TA_
ASLEEP MODE_B
GND089 TMP_ GND090 VDD39 GND091 SVDD1
AA DETECT_B
AA
HRESET_B CLK_ UART1_ AVDD_ AVDD_ GND092 SVDD4
OUT SOUT PLAT CGA2
AB AB
RESET_ GND094 UART2_ AVDD_ AVDD_
REQ_B SOUT TA_BB_TMP_DETECT_B CGA1 GND095 PIXEL XVDD1
AC AC
EC1_ SD1_
RX_ EC1_ UART2_ GND096 TD1_ TA_BB_
IMP_
TXD2 SIN ANODE VDD
AD CLK CAL_RX
AD
EC1_ EC1_ GND097 UART1_ TD1_ SD_ SD_ SD_
RXD3 RXD2 SIN CATHODE GND05 GND06 GND07
AE AE
SD1_ SD1_ SD1_
EC1_ EC1_ EC1_ SENSE
RXD1 TXD1 TXD0 VDD REF_C TX0_ TX1_
AF LK1_P P P
AF
EC1_ EC1_ SENSE SD1_ SD_ SD1_ SD1_
GND098 REF_C TX0_ TX1_
RXD0 TXD3 GND GND11
AG LK1_N N N
AG
EC1_ EC1_ DIFF_
RX_ GTX_ GND099 SD_ SD_ SD_
SYSCLK_ GND12 GND13 GND14
AH DV CLK N
AH
EC1_ DIFF_ SD_ SD1_ SD1_ SD1_
GND100 TX_ GND101 SYSCLK_ RX0_ RX1_ RX2_
GND18
AJ EN P N N N
AJ
EC1_ SD1_ SD1_ SD1_
GTX_C EMI1_ EMI1_ GND102 RX0_ RX1_ RX2_
MDIO MDC
AK LK125 P P P
AK
1 2 3 4 5 6 7 8 9 10 11 12 13 14 15
Power Ground
Figure 6. Detail C
16 17 18 19 20 21 22 23 24 25 26 27 28 29 30
VDD22 GND068 VDD23 GND069 AVDD_ D1_ D1_ D1_
D1 MDQS1_B MDQ14 MDQ06
T T
D1_
GND073 VDD26 VDD27 G1VDD05 GND074 MDQ10 GND075
U U
GND077 VDD30 GND078 GND079 G1VDD06 D1_ D1_ D1_
MDQ15 MDQ07 MDQ02
V V
D1_ D1_
VDD33 GND083 VDD34 G1VDD07 MDQ11 GND084 MDQ03
W W
FA_
VDD37 GND087 VDD38 GND088 D1_ D1_ D1_ ANALOG_
MBG0 MA09 MDIC0
Y G_V
Y
SVDD2 SVDD3 VDD40 D1_ G1VDD08 D1_ G1VDD09
MODT1 MA02
AA AA
SD_ SD_ SD_ GND093 D1_ D1_ D1_ D1_
GND01 GND02 GND03 MA08 MA00 MCK1 MBG1
AB AB
XVDD2 XVDD3 SD_ D1_ D1_
G1VDD10
D1_
GND04 MALERT_B MA10 MCK1_B
AC AC
AVDD_ AVDD_ SD1_
_SD1_PLL _SD1_PLL IMP_ D1_ D1_ D1_ D1_ D1_
MWE_B MA07 MBA1 MBA0 MA06
AD CAL_TX
AD
SD_ SD_ G1VDD11
D1_
G1VDD12
D1_
G1VDD13
GND08 GND09 MCS0_B MODT0
AE AE
SD1_ SD1_
TX2_ TX3_ SD_ D1_ D1_ D1_ D1_ D1_
GND10 MCAS_B MA12 MA11 MCK0 MA03
AF P P
AF
SD1_ SD1_ D1_
TX2_ TX3_ G1VDD14 D1_ G1VDD15
D1_
MCS2_B MA04 MCK0_B
AG N N
AG
SD_ SD_ SD_ D1_ D1_ D1_ D1_ G1VDD16
GND15 GND16 GND17 MCKE1 MPAR MA05 MACT_B
AH AH
SD1_ SD1_ D1_ D1_ D1_
RX3_ REF_C G1VDD17 MCKE0 G1VDD18 MRAS_B MA13
AJ N LK2_N
AJ
SD1_ SD1_
RX3_ SD_ REF_C D1_ D1_ D1_ G1VDD19
GND19 MCS3_B MCS1_B MA01
AK P LK2_P
AK
16 17 18 19 20 21 22 23 24 25 26 27 28 29 30
Power Ground
Figure 7. Detail D
I2C1
I2C2
I2C3
I2C4
I2C5
I2C6
I2C7
I2C8
XSPI1
eSDHC 1
SDHC1_CMD / Command/Response N7 IO EV DD 26
GPIO1_DAT21 /SPI1_SOUT /
SAI1_TX_BCLK /
SAI1_RX_BCLK
SDHC1_DAT0 / Data N3 IO EV DD 4, 26
GPIO1_DAT17 /SPI1_SIN /
SAI2_TX_DATA /
SAI2_RX_DATA /cfg_gpinput0
SDHC1_DAT1 / Data P4 IO EV DD 4, 26
GPIO1_DAT18 /SPI1_PCS2 /
SAI2_TX_BCLK /
SAI2_RX_BCLK /cfg_gpinput1
SDHC1_DAT2 / Data N1 IO EV DD 4, 26
GPIO1_DAT19 /SPI1_PCS1 /
SAI1_TX_SYNC /
SAI1_RX_SYNC /
cfg_gpinput2
SDHC1_DAT3 / Data L5 IO EV DD 4, 26
GPIO1_DAT20 /SPI1_PCS0 /
SAI1_TX_DATA /
SAI1_RX_DATA /cfg_gpinput3
eSDHC 2
DUART
DUART
Trust
System Control
Clocking
Debug
DFT
JTAG
Analog Signals
Serdes 1
Ethernet Controller 1
Power-On-Reset Configuration
SPI1
SPI2
SPI 3
EC1_1588_TRIG_IN2/ Trigger In H6 I OV DD 1
SPI3_PCS0 /GPIO3_DAT15 /
SWITCH_1588_DAT2
LPUART
USB
Display
PIXEL_DVDD Pixel Clock PLL digital supply M20 --- PIXEL_DV DD ---
AVDD_PIXEL Pixel Clock PLL analog supply AC13 --- AVDD_PIXEL ---
USB_HVDD2 USB PHY 3.3V Analog and J11 --- USB_HV DD ---
Digital supply HS
DP_OVDD PMA 1.8V common I/O supply J19 --- DP_OV DD ---
1. Functionally, this pin is an output or an input, but structurally it is an I/O because it either sample configuration input
during reset, is a muxed pin, or has other manufacturing test functions. This pin will therefore be described as an I/O for
boundary scan.
2. This output is actively driven during reset rather than being tri-stated during reset.
3. MDIC[0] is grounded through an 237Ω precision 1% resistor and MDIC[1] is connected to GV DD through an 237Ω
precision 1% resistor. For either full or half driver strength calibration of DDR IOs, use the same MDIC resistor value of
237Ω. Memory controller register setting can be used to determine automatic calibration is done to full or half drive strength.
These pins are used for automatic calibration of the DDR3/DDR3L IOs. The MDIC[0:1] pins must be connected to 237Ω
precision 1% resistors. MDIC[0] is grounded through a 162Ω precision 1% resistor and MDIC[1] is connected to GV DD
through a 162Ω precision 1% resistor. For either full or half driver strength calibration of DDR IOs, use the same MDIC
resistor value of 162Ω. The memory controller register setting can be used to determine automatic calibration is done to
full or half drive strength. These pins are used for automatic calibration of the DDR IOs. The MDIC[0:1] pins must be
connected to 162Ω precision 1% resistors.
4. This pin is a reset configuration pin. It has a weak (~20 kΩ) internal pull-up P-FET that is enabled only when the processor
is in its reset state. This pull-up is designed such that it can be overpowered by an external 4.7 kΩ resistor. However, if
the signal is intended to be high after reset, and if there is any device on the net that might pull down the value of the net
at reset, a pull-up or active driver is needed.
5. Pin must NOT be pulled down during power-on reset. This pin may be pulled up, driven high, or if there are any externally
connected devices, left in tristate. If this pin is connected to a device that pulls down during reset, an external pull-up is
required to drive this pin to a safe state during reset.
6. Recommend that a weak pull-up resistor (2-10 kΩ) be placed on this pin to the respective power supply.
7. This pin is an open-drain signal.
8. Recommend that a weak pull-up resistor (1 kΩ) be placed on this pin to the respective power supply.
9. This pin has a weak (~20 kΩ) internal pull-up P-FET that is always enabled.
10. These are test signals for factory use only and must be pulled up (100Ω to 1-kΩ) to the respective power supply for
normal operation.
11. This pin requires a 200Ω ± 1% pull-up to respective power-supply.
14.This pin requires an external 1-kΩ pull-down resistor to prevent PHY from seeing a valid Transmit Enable before it is
actively driven.
15. These pins must be pulled to ground (GND).
16. This pin requires a 698Ω ± 1% pull-up to respective power-supply.
17. These pins should be tied to ground if the diode is not utilized for temperature monitoring.
18. This pin should be grounded through a 200Ω ± 1% 100-ppm/ 0C precision resistor.
19. In normal operation, this pin must be pulled high to OVDD with 1 kΩ.
20. SD_GND must be directly connected to GND.
21. This pin will not be tested using JTAG Boundary Scan operation.
22. This pin must be pulled to OVDD through a 100Ω to 1kΩ resistor.
23. PORESET_B should be asserted zero during the JTAG Boundary Scan Operation, and is required to be controllable
on board.
Warning
See "Connection Recommendations"in QorIQ LS1028A Design Checklist (AN12028)" for additional details on
properly connecting these pins for specific applications.
3 Electrical characteristics
This section describes the DC and AC electrical specifications for the chip. The chip is currently targeted to these specifications,
some of which are independent of the I/O cell but are included for a more complete reference. These are not purely I/O buffer
design specifications.
Input voltage for DDR4 and DDR3L GVIN -0.3 G1VDD x 1.05 V 3, 4
DRAM signals
Input voltage for main power supply for SVIN -0.3 SVDD x 1.05 V 5
internal circuitry of SerDes and
DIFF_SYSCLK
1. Supply voltage specified at the voltage sense pin. Voltage input pins should be regulated to provide specified voltage at the
sense pin.
2. Transceiver supply for USB PHY.
3. Caution: The input voltage level of the signals must not exceed corresponding Max value. For example DDR4 must not
exceed 5% of G1VDD.
4. Typical DDR interface uses ODT enabled mode. For tests purposes with ODT off mode, simulation should be done first so
as to make sure that the overshoot signal level at the input pin does not exceed GVDD by more than 10%. The Overshoot/
Undershoot period should comply with JEDEC standards.
5. (G1, O, S, E)VIN, USB_S*VIN and USB_HVIN may overshoot/undershoot to a voltage and for a maximum duration as shown
in the Overshoot/undershoot voltage figure at the end of this section.
6. Functional operating conditions are given in Recommended operating conditions table. Absolute maximum ratings are stress
ratings only, and functional operations at the maximums is not guaranteed. Stresses beyond those listed may affect device
reliability or cause permanent damange to the device.
7. Exposing device to Absolute Maximum Ratings conditions for long periods of time may affect reliability or cause permanent
damage.
8. When EVDD is powered with 3.3V supply.
9. When EVDD is powered with 1.8V supply.
WARNING
The values shown are the recommended operating conditions and proper device operation outside these
conditions is not guaranteed.
PMA common core supply (at 0.9 DP_AVDD 0.9 V - 30 mV 0.9 0.9 V + 50 mV V 3
V)
USB PHY 3.3V high supply USB_HVDD 3.3 - 165 mV 3.3 3.3 + 165 mV V 7
voltage
1. Supply voltage specified at the voltage sense pin. Voltage input pins should be regulated to provide specified voltage at the
sense pin.
2. Operation at 1.08V is allowable for up to 25 ms at initial power on.
3. For supported voltage requirement for a given part number, see the Orderable part numbers addressed by this document.
4. For additional information, see the Core and platform supply voltage filtering section in the chip design checklist.
5. AVDD_PLAT, AVDD_CGA1, AVDD_CGA2, and AVDD_D1 are measured at the input to the filter and not at the pin of the
device.
6. TA_PROG_SFP must be supplied 1.8V and the chip must operate in the specified fuse programming temperature range
only during secure boot fuse programming. For all other operating conditions, PROG_SFP must be tied to GND, subject to the
power sequencing constraints shown in Power Sequencing.
7. Transceiver supply for USB PHY.
8. Caution: The input voltage level of the signals must not exceed corresponding Max value. For example DDR4 must not
exceed 5% of G1VDD.
9. Typical DDR interface uses ODT enabled mode. For tests purposes with ODT off mode, simulation should be done first so
as to make sure that the overshoot signal level at the input pin does not exceed GVDD by more than 10%. The Overshoot/
Undershoot period should comply with JEDEC standards.
10. (G1, O, S, E)VIN, USB_S*VIN and USB_HVIN may overshoot/undershoot to a voltage and for a maximum duration as shown
in the Overshoot/undershoot voltage figure at the end of this section.
11. The Tj should not exceed 105°C. Proper thermal solution should be applied to meet this requirement.
This figure shows the undershoot and overshoot voltages at the interfaces of the chip.
Maximum overshoot
E/S/G1/O/USB*VDD
VIH
GND
VIL
Minimum undershoot
Overshoot/undershoot period
Notes:
The overshoot/undershoot period should be less than 10% of shortest possible toggling period of the input signal
or per input signal specific protocol requirement. For GPIO input signal overshoot/undershoot period, it should be
less than 10% of the SYSCLK period.
See the Recommended operating conditions table for actual recommended core voltage. Voltage to the processor interface I/Os
are provided through separate sets of supply pins and must be provided at the voltages shown in the Recommended operating
conditions table. The input voltage threshold scales with respect to the associated I/O supply voltage. EVDD and OVDD-based
receivers are simple CMOS I/O circuits and satisfy appropriate LVCMOS type specifications. The DDR SDRAM interface uses
differential receivers referenced by the externally supplied D1_MVREF signal (nominally set to G1VDD/2) as is appropriate for
the SSTL_1.35 electrical signaling standard and differential receivers referenced by the internally supplied reference signal as
is appropriate for the JEDEC DDR4 electrical signaling standard. The DDR DQS receivers cannot be operated in single-ended
fashion. The complement signal must be properly driven and cannot be grounded.
NOTE
These are estimated values.
1. The drive strength of the DDR4 interface in half-strength mode is at Tj = 105°C and at G1VDD (min).
2. Minimum values reflect estimated numbers based on best-case processed device.
3. Maximum values reflect estimated numbers based on worst-case processed device.
Items on the same step have no ordering requirement with respect to one another. Items on separate steps must be ordered
sequentially such that voltage rails on a previous step must reach 90% of their value before the voltage rails on the current step
reach 10% of their value.
All supplies must be at their stable values within 400 ms.
Negate PORESET_B input when the required assertion/hold time has been met per Table 13. RESET initialization timing
specifications on page 75.
NOTE
• While VDD is ramping up, current may be supplied from VDD through LS1028A to G1VDD.
• The 3.3V (USB_HVDD) in Step 1 and 1.0V/0.9V (USB_SDVDD, USB_SVDD) in Step 2 supplies should ramp
up within 95ms with respect to each other.
• 100us minimum spacing is required between Step 1 (DP_OVDD) and Step2 (DP_SVDD, DP_AVDD) supplies.
• If Trust Architecture Security Monitor battery backed feature is not used, TA_BB_VDD should be connected
with VDD.
• If using Trust Architecture Security Monitor battery backed features, prior to VDD ramping up to the 0.5 V
level, ensure that SVDD is ramped to recommended operational voltage and DIFF_SYSCLK_P/
DIFF_SYSCLK_N is running. These clocks should have a minimum frequency of 800 Hz and a maximum
frequency not greater than the supported system clock frequency for the device.
• Ramp rate requirements should be met per Table 9. Power supply ramp rate on page 72.
• While XVDD is ramping, current may be supplied from XVDD through chip to SVDD.
Differential System clock should meet DC and AC Specifications as per Differential system clock DC electrical characteristics on
page 73 and Differential system clock AC timing specifications on page 73 respectively.
Warning
Only 300,000 POR cycles are permitted per lifetime of a device. Note that this value is based on design estimates
and is preliminary.
Warning
No activity other than that required for secure boot fuse programming is permitted while TA_PROG_SFP is driven
to any voltage above GND, including the reading of the fuse block. The reading of the fuse block may only occur
while TA_PROG_SFP = GND.
Fuse programming
90% VDD
VDD tTA_PROG_SFP_VDD
This table provides information on the power-down and power-up sequence parameters for TA_PROG_SFP.
tTA_PROG_SFP_DELAY 10 — SYSCLKs 1
tTA_PROG_SFP_PROG 0 — us 2
tTA_PROG_SFP_VDD 0 — us 3
tTA_PROG_SFP_RST 0 — us 4
Notes:
1. Delay required from the deassertion of PORESET_B to driving TA_PROG_SFP ramp up. Delay measured from PORESET_B
deassertion at 90% OVDD to 10% TA_PROG_SFP ramp up.
2. Delay required from fuse programming completion to TA_PROG_SFP ramp down start. Fuse programming must complete
while TA_PROG_SFP is stable at 1.8 V. No activity other than that required for secure boot fuse programming is permitted
while TA_PROG_SFP is driven to any voltage above GND, including the reading of the fuse block. The reading of the fuse
block may only occur while TA_PROG_SFP = GND. After fuse programming is complete, it is required to return TA_PROG_SFP
= GND.
3. Delay required from TA_PROG_SFP ramp-down complete to VDD ramp-down start. TA_PROG_SFP must be grounded to
minimum 10% TA_PROG_SFP before VDD reaches 90% VDD.
4. Delay required from TA_PROG_SFP ramp-down complete to PORESET_B assertion. TA_PROG_SFP must be grounded
to minimum 10% TA_PROG_SFP before PORESET_B assertion reaches 90% OVDD.
5. Only six secure boot fuse programming events are permitted per lifetime of a device.
If performing secure boot fuse programming per Power sequencing on page 68, it is required that TA_PROG_SFP = GND before
the system is power cycled (PORESET_B assertion) or powered down (VDD ramp down) per the required timing specified in
Table 5. TA_PROG_SFP timing 5 on page 70.
NOTE
All input signals, including I/Os that are configured as inputs, driven into the chip need to monotonically increase/
decrease through entire rise/fall durations.
Table 6. LS1028A VDD power dissipation for the thermal design at 850C
Core Platform DDR data GPU and VDD (V) IOVDD4 (V) Power (W) Total Notes
frequency frequenc rate LCD Core and
(MHz) y(MHz) (MT/s) controller VDD (W) IOVDD (W) Platform
frequency Power
(MHz) (W)
Notes:
1. Thermal power assumes Dhrystone running with activity factor of 80% (on all cores) and executing DMA on the platform at
100% activity factor.
2. Thermal power are based on worst-case processed device.
3. Refer to AN12028 "QorIQ LS1028A Design Checklist":
"Maximum VDD Power and IO Power" shows the maximum power dissipation across junction temperature range. This should
be used as guide for power supply design and regulator sizing.
"Thermal Power" shows the thermal power across junction temperature range. This data should be used thermal solution design.
4. IOVDD includes SVDD, USB_SDVDD, USB_SVDD, PIXEL_DVDD, DP_SVDD and DP_AVDD
Table 7. LS1018A VDD power dissipation for the thermal design at 850C
Core Platform DDR data GPU and VDD (V) IOVDD4 (V) Power (W) Total Notes
frequency frequenc rate LCD Core and
(MHz) y(MHz) (MT/s) controller VDD (W) IOVDD (W) Platform
frequency Power
(MHz) (W)
Table 7. LS1018A VDD power dissipation for the thermal design at 850C (continued)
Core Platform DDR data GPU and VDD (V) IOVDD4 (V) Power (W) Total Notes
frequency frequenc rate LCD Core and
(MHz) y(MHz) (MT/s) controller VDD (W) IOVDD (W) Platform
frequency Power
(MHz) (W)
Notes:
1. Thermal power assumes Dhrystone running with activity factor of 90% on core and executing DMA on the platform at 100%
activity factor.
2. Thermal power are based on worst-case processed device.
3. Refer to AN12028 "QorIQ LS1028A Design Checklist":
"Maximum VDD Power and IO Power" shows the maximum power dissipation across junction temperature range. This should
be used as guide for power supply design and regulator sizing.
"Thermal Power" shows the thermal power across junction temperature range. This data should be used thermal solution design.
4. IOVDD includes SVDD, USB_SDVDD, USB_SVDD, PIXEL_DVDD, DP_SVDD and DP_AVDD
This table shows the estimated power dissipation on the TA_BB_VDD supply at allowable voltage levels.
Note: 1. When SoC is off, TA_BB_VDD may be supplied by battery power to retain the Zeroizable Master Key and other
trust architecture state. Board should implement a PMIC, which switches TA_BB_VDD to battery when SoC is powered
down. See the Device reference manual trust architecture chapter for more information.
Required ramp rate for all voltage supplies (including OVDD/G1VDD/SVDD/XVDD/ — 25 V/ms 1, 2
EVDD/PIXEL_DVDD, all core and platform VDD supplies and all AVDD supplies.)
Notes:
1. Ramp rate is specified as a linear ramp from 10% to 90%. If non-linear (for example, exponential), the maximum rate of
change from 200 to 500 mV is the most critical as this range might falsely trigger the ESD circuitry.
2. Over full recommended operating temperature range (see Recommended Operating Conditions).
3. From 10% to 90%
50 Ω
DIFF_SYSCLK_P
Input
amp
DIFF_SYSCLK_N
50 Ω
This section provides the differential system clock DC and AC timing specifications.
For AC timing specifications, see SerDes reference clocks AC timing specifications on page 128.
Spread-spectrum clocking is not supported on differential system clock pair input.
1. 1.5 MHz to Nyquist frequency. For example, for 100 MHz reference clock, the Nyquist frequency is 50 MHz.
2. The peak-to-peak Rj specification is calculated at 14.069 times the RJRMS for 10-12 BER.
3. DJ across all frequencies.
Notes:
1. For recommended operating conditions, see Recommended Operating Conditions.
2. The min VIL and max VIH values are based on the respective min and max VIN values found in Recommended Operating
Conditions.
3. The symbol VIN, in this case, represents the OVIN symbol referenced in Recommended Operating Conditions.
This table provides the Ethernet gigabit reference clock AC timing specifications.
EC_GTX_CLK125 frequency fG125 125 - 100 ppm 125 125 + 100 MHz —
ppm
Notes:
1. At recommended operating conditions with OVDD = 1.8 V ± 90mV. See Recommended Operating Conditions.
2. Rise times are measured from 20% of OVDD to 80% of OVDD. Fall times are measured from 80% of OVDD to 20% of OVDD.
3. EC_GTX_CLK125 is used to generate the GTX clock for the Ethernet transmitter.See RGMII AC timing specifications on
page 102 for duty cycle for the 10Base-T and 100Base-T reference clocks.
Input setup time for POR configs with respect to 4.0 - SYSCLK 2
negation of PORESET_B
Input hold time for all POR configs with respect to 2.0 - SYSCLK 2
negation of PORESET_B
1. PORESET_B must be driven asserted before the core and platform power supplies are powered up.
2. DIFF_SYSCLK_P/DIFF_SYSCLK_N is the primary clock input for the chip.
3. The device asserts HRESET_B as an output when PORESET_B is asserted to initiate the power-on reset process. The
device releases HRESET_B sometime after PORESET_B is deasserted. The exact sequencing of HRESET_B deassertion is
documented in the reference manual's "Power-on Reset Sequence" section.
4. The system/board must be designed to ensure the input requirement to the device is achieved. Proper device operation is
guaranteed for inputs meeting this requirement by design, simulation, characterization, or functional testing.
5. For HRESET_B the rise/fall time should not exceed 10 SYSCLKs. Rise time refers to signal transitions from 20% to 70% of
OVDD. Fall time refers to transitions from 70% to 20% of OVDD.
6. For PORESET_B the rise/fall time should not exceed 1 SYSCLK. Rise time refers to signal transitions from 20% to 70% of
OVDD. Fall time refers to transitions from 70% to 20% of OVDD.
7. See General A-050124 erratum.
I/O reference voltage MVREFn 0.49 * G1VDD 0.5 * G1VDD 0.51 * G1VDD V 2, 3, 4
Table 16. DDR3L SDRAM interface DC electrical characteristics (G1V DD = 1.35V) 1, 9 (continued)
This table provides the recommended opearting conditions for the DDR SDRAM controller when interfacing to DDR4 SDRAM.
Table 18. DDR4 SDRAM interface DC electrical characteristics (G1V DD = 1.2V) 1, 7 (continued)
This table provides the input AC timing specifications for the DDR controller when interfacing to DDR3L SDRAM.
This table provides the input AC timing specifications for the DDR controller when interfacing to DDR3L SDRAM.
1. tCISKEW represents the amount of skew consumed by the controller between MDQS[n] and any corresponding bit that will be
captured with MDQS[n]. This should be subtracted from the total timing budget.
2. The amount of skew that can be tolerated from MDQS to a corresponding MDQ signal is called tDISKEW. This can be
determined by the following equation: tDISKEW = +/-(T / 4 - abs(tCISKEW)), where T is the clock period and abs(tCISKEW) is the
absolute value of tCISKEW.
3. See Figure 12. on page 83.
This table contains the output AC timing targets for the DDR3L SDRAM interface.
1. All MCK/MCK_B and MDQS/MDQS_B referenced measurements are made from the crossing of the two signals.
2. ADDR/CMD/CNTL includes all DDR SDRAM output signals except MCK/MCK_B, and MDQ/MECC/MDM/MDQS/MDQS_B.
3. Note that tDDKHMH follows the symbol conventions described above. For example, tDDKHMH describes the DDR timing
(DD) from the rising edge of the MCK[n] clock (KH) until the MDQS signal is valid (MH). The timing parameters listed in this
table assume that the MCK and MDQS signals are programmed to launch from the controller using the same adjustment value.
4. Note that it is required to program the start value of the DQS adjust for write leveling.
5. Available eye for data (MDQ), ECC (MECC), and data mask (MDM) outputs at the pin of the processor. Memory controller
will center the strobe (MDQS) in the available data eye at the DRAM (end point) during the initialization.
6. See Figure 13. on page 83.
NOTE
For the ADDR/CMD setup and hold specifications in Table 22. DDR3L SDRAM interface output AC timing
specifications 6 on page 80, it is assumed that the clock control register is set to adjust the memory clockes by
1/2 applied cycle .
This table provides the input AC timing specifications for the DDR controller when interfacing to DDR4 SDRAM.
1. tCISKEW represents the amount of skew consumed by the controller between MDQS[n] and any corresponding bit that will be
captured with MDQS[n]. This should be subtracted from the total timing budget.
2. The amount of skew that can be tolerated from MDQS to a corresponding MDQ signal is called tDISKEW. This can be
determined by the following equation: tDISKEW = +/-(T / 4 - abs(tCISKEW)), where T is the clock period and abs(tCISKEW) is the
absolute value of tCISKEW.
3. See Figure 12. on page 83.
This table contains the output AC timing targets for the DDR4 SDRAM interface.
1. All MCK/MCK_B and MDQS/MDQS_B referenced measurements are made from the crossing of the two signals.
2. ADDR/CMD/CNTL includes all DDR SDRAM output signals except MCK/MCK_B, and MDQ/MECC/MDM/MDQS/MDQS_B.
3. Note that tDDKHMH follows the symbol conventions described above. For example, tDDKHMH describes the DDR timing
(DD) from the rising edge of the MCK[n] clock (KH) until the MDQS signal is valid (MH). The timing parameters listed in this
table assume that the MCK and MDQS signals are programmed to launch from the controller using the same adjustment value.
4. Note that it is required to program the start value of the DQS adjust for write leveling.
5. Available eye for data (MDQ), ECC (MECC), and data mask (MDM) outputs at the pin of the processor. Memory controller
will center the strobe (MDQS) in the available data eye at the DRAM (end point) during the initialization.
6. See Figure 13. on page 83.
NOTE
For the ADDR/CMD setup and hold specifications in Table 24. DDR4 SDRAM interface output AC timing
specifications 6 on page 82, it is assumed that the clock control register is set to adjust the memory clockes by
1/2 applied cycle .
MCK[n]_B
MCK[n]
tMCK
MDQS[n]
tDISKEW
MDQ[x] D0 D1
tDISKEW
tDISKEW
MCK_B
MCK
tMCK
tDDKHAS, tDDKHCS
tDDKHAX, tDDKHCX
tDDKHMP
tDDKHMH
MDQS[n]
tDDKHDS tDDKHME
tDDKLDS
MDQ[x] D0 D1
tDDKLDX
tDDKHDX
This table provides the DC electrical characteristics for the eSDHC interface.
1. The symbols used for timing specifications herein follow the pattern of t(first two letters of functional block)(signal)(state) (reference)(state)
for inputs and t(first two letters of functional block)(reference)(state)(signal)(state) for outputs. For example, tSHKHOX symbolizes eSDHC
highspeed mode device timing (SH) clock reference (K) going to the high (H) state, with respect to the output (O) reaching the
invalid state (X) or output hold time. Note that in general, the clock reference symbol is based on five letters representing the
clock of a particular functional. For rise and fall times, the latter convention is used with the appropriate letter: R (R for rise) or
F ( F for fall).
2. In full-speed mode, the clock frequency value can be 0-25MHz for an SD/SDIO card and 0-26MHz for an eMMC device.
3. CCARD ≤ 10 pF, (1 card), and CL = CBUS + CHOST + CCARD ≤ 40 pF.
4. SDHC_SYNC_OUT/IN loop back is recommended to compensate the clock delay. In case the SDHC_SYNC_OUT/IN
loopback is not used, to satisfy setup timing, one-way board-routing delay between host and card, on SDHC_CLK, SDHC_CMD,
and SDHC_DATx should not exceed 1ns for any high-speed eMMC . For any high-speed or default speed mode SD card, the
one-way board-routing delay between host and card, on SDHC_CLK, SDHC_CMD, and SDHC_DATx should not exceed 1.5ns.
5. See Figure 14. on page 86.
6. The AC timing specifications are based on the recommended operating conditions with EVDD =3.3V and OVDD=1.8V, see
Recommended Operating Conditions
This figure provides the eSDHC clock input timing diagram as shown here.
eSDHC
external clock
VM VM VM
operational mode
tSHSCKL tSHSCKH
tSHSCK
tSHSCKR tSHSCKF
This table provides the eSDHC AC timing specifications as defined in the eSDHC clock input timing diagram.
1. The symbols used for timing specifications herein follow the pattern of t(first two letters of functional block)(signal)(state) (reference)(state)
for inputs and t(first two letters of functional block)(reference)(state)(signal)(state) for outputs. For example, tSHKHOX symbolizes eSDHC
highspeed mode device timing (SH) clock reference (K) going to the high (H) state, with respect to the output (O) reaching the
invalid state (X) or output hold time. Note that in general, the clock reference symbol is based on five letters representing the
clock of a particular functional. For rise and fall times, the latter convention is used with the appropriate letter: R (R for rise) or
F ( F for fall).
2. In high-speed mode, the clock frequency value can be 0-50MHz for an SD/SDIO card and 0-52MHz for an MMC card.
3. CCARD ≤ 10 pF, (1 card), and CL = CBUS + CHOST + CCARD ≤ 40 pF.
4. SDHC_SYNC_OUT/IN loop back is recommended to compensate the clock delay. In case the SDHC_SYNC_OUT/IN
loopback is not used, to satisfy setup timing, one-way board-routing delay between host and card, on SDHC_CLK, SDHC_CMD,
and SDHC_DATx should not exceed 1ns for any high-speed eMMC . For any high-speed or default speed mode SD card, the
one-way board-routing delay between host and card, on SDHC_CLK, SDHC_CMD, and SDHC_DATx should not exceed 1.5ns.
5. See Figure 15. on page 87.
6. See Figure 16. on page 88.
7. The AC timing specifications are based on the recommended operating conditions with EVDD =3.3V and OVDD=1.8V, see
Recommended Operating Conditions
This figure provides the input AC timing diagram for high-speed mode.
VM VM VM VM
SDHC_CLK
t SHSIVKH t SHSIXKH
SDHC_DAT/SDHC_CMD
inputs
This figure provides the output AC timing diagram for high-speed mode.
VM VM VM VM
SDHC_CLK
SDHC_CMD/ SDHC_DAT
outputs
t SHSKHOV tSHSKHOX
This table provides the eSDHC AC timing specifications for SDR50 mode on devices without a voltage translator.
Table 29. eSDHC AC timing specifications (SDR50 mode without voltage translator) 2, 3, 4, 5
Table 29. eSDHC AC timing specifications (SDR50 mode without voltage translator) 2, 3, 4, 5 (continued)
This figure provides the eSDHC input AC timing diagram for SDR50 mode.
T CLK
SDHC_CLK_SYNC_IN
TSHSIVKH TSHSIXKH
SDHC_CMD/
SDHC_DAT
input
This figure provides the eSDHC output timing diagram for SDR50 mode.
T
CLK
SDHC_CLK
T
SHSKHOV
SDHC_CMD/
SDHC_DAT
output
T
SHSKHOX
This table provides the eSDHC AC timing specifications for DDR50/DDR mode.
Table 30. eSDHC AC timing specifications (DDR50/DDR mode without voltage translator) 3, 4, 5, 6
Table 30. eSDHC AC timing specifications (DDR50/DDR mode without voltage translator) 3, 4, 5, 6 (continued)
Table 30. eSDHC AC timing specifications (DDR50/DDR mode without voltage translator) 3, 4, 5, 6 (continued)
This figure provides the eSDHC DDR50/DDR mode input AC timing diagram.
T SHCK
SDHC_CLK_SYNC_IN
T T
SHDIVKH SHDIXKH
SDHC_DAT
input
T T
SHCIVKH SHCIXKH
SDHC_CMD
input
This figure provides the eSDHC DDR50/DDR mode output AC timing diagram.
T SHCK
SDHC_CLK
T
SHDKHOV
SDHC_DAT
output
T
SHDKHOX
T
SHCKHOV
SDHC_CMD
output
T
SHCKHOX
This table provides the eSDHC AC timing specifications for SDR104/eMMC HS200 mode (VDD=1.0V)
This table provides the eSDHC AC timing specifications for SDR104/eMMC HS200 mode (VDD=0.9V)
T
SHCK
SDHC_CLK
T
SHIDV
SDHC_CMD/
DATA
SDHC_DAT input
T
SHKHOV
SDHC_CMD/ SDHC_DAT
DATA DATA
output
T
SHKHOX
This table provides the eSDHC AC timing specifications for eMMC HS400 mode (VDD=1.0V).
This table provides the eSDHC AC timing specifications for eMMC HS400 mode (VDD=0.9V).
This figure provides the eSDHC HS400 mode input timing diagram.
Data Strobe
tSHDSPW tSHDSPW
VT
TSHRQV
TSHRQHX TSHRQV TSHRQHX
VOH
DAT[7:0]
VOL
TSHRQV_CMD TSHRQHX_CMD
VOH
CMD
OutPut
VOL
This figure provides the eSDHC HS400 mode output timing diagram.
Tclk
SDHC_CLK
TSHKHOV
SDHC_CMD/SDHC_DAT
output
TSHKHOX
1. This parameter is dependent on the Ethernet clock frequency. The EMDIO_CFG [MDIO_CLK_DIV] field determines the clock
frequency of the MgmtClk Clock EMI1_MDC.
2. tenet_clk is the Ethernet clock period.
3. MDIO timing is configurable by programming EMDIO_CFG register fields.
4. The default value of Y is 5. Y value is determined by EMDIO_CFG[NEG], EMDIO_CFG[MDIO_HOLD] and EMDIO[EHOLD].
It is recommended to use EMDIO_CFG[NEG]=1 for MDIO transactions.
5. The symbols used for timing specifications follow these patterns: t(first two letters of functional block)(signal)(state)(reference)(state) for inputs
and t(first two letters of functional block)(reference)(state)(signal)(state) for outputs. For example, tMDKHDX symbolizes management data timing
(MD) for the time tMDC from clock reference (K) high (H) until data outputs (D) are invalid (X) or data hold time. Also, tMDDVKH
symbolizes management data timing (MD) with respect to the time data input signals (D) reach the valid state (V) relative to
the tMDC clock reference (K) going to the high (H) state or setup time.
6. See Figure 24. on page 101.
tMDC
MDC
tMDCH
MDIO
(Input)
tMDDVKH
tMDDXKH
MDIO
(Output)
tMDKHDX
1. The frequency of ECn_RX_CLK (input) should not exceed the frequency of ECn_GTX_CLK (output) by more than 300 ppm.
2. This implies that PC board design will require clocks to be routed such that an additional trace delay of greater than 1.5 ns
is added to the associated clock signal. Many PHY vendors already incorporate the necessary delay inside their device. If so,
additional PCB delay is probably not needed.
3. For 10/100 Mbps, the max value is unspecified.
4. For 10 and 100 Mbps, tRGT scales to 400 ns ± 40 ns and 40 ns ± 4 ns, respectively.
5. Duty cycle may be stretched/shrunk during speed changes or while transitioning to a received packet's clock domains as
long as the minimum duty cycle is not violated and stretching occurs for no more than three tRGT of the lowest speed transitioned
between.
6. Applies to inputs and outputs.
7. The system/board must be designed to ensure this input requirement to the chip is achieved. Proper device operation is
guaranteed for inputs meeting this requirement by design, simulation, characterization, or functional testing.
8. In general, the clock reference symbol representation for this section is based on the symbols RGT to represent RGMII timing.
Note that the notation for rise (R) and fall (F) times follows the clock symbol that is being represented. For symbols representing
skews, the subscript is skew (SK) followed by the clock that is being skewed (RGT).
9. See Figure 25. on page 103.
tRGT
tRGTH
GTX_CLK
(At MAC, output)
tSKRGT_TX tSKRGT_TX
TXD[8:5][3:0] TXD[8:5]
TXD[3:0] TXD[7:4]
TXD[7:4][3:0]
(At MAC, output)
TX_CLK
(At PHY, input)
tRGT
tRGTH
RX_CLK
(At PHY, output)
RXD[8:5][3:0] RXD[8:5]
RXD[7:4][3:0] RXD[3:0] RXD[7:4]
(At PHY, output) PHY equivalent to tSKRGT_TX PHY equivalent to tSKRGT_TX
1. The maximum value of tT1588CLK is not only defined by the value of TRX_CLK, but also defined by the recovered clock. For
example, for 10/100/1000 Mbps modes, the maximum value of tT1588CLK will be 2800, 280, and 56 ns, respectively.
2. TRX_CLK is the maximum clock period of the ethernet receiving clock selected by TMR_CTRL[CKSEL]. See the chip reference
manual for a description of TMR_CTRL registers.
3. This needs to be at least two times the clock period of the clock selected by TMR_CTRL[CKSEL]. See the chip reference
manual for a description of TMR_CTRL registers.
4. There are two input clock sources: TSEC_1588_CLK_IN and ENETC system clock. When using TSEC_1588_CLK_IN, the
minimum clock period is 2 x t T1588CLK.
5. See Figure 26. on page 105.
6. See Figure 27. on page 105.
This figure shows the data and command output AC timing diagram.
tT1588CLKOUT
tT1588CLKOUTH
TSEC_1588_CLK_OUT
tT1588OV
TSEC_1588_PULSE_OUT1/2
TSEC_1588_ALARM_OUT1/2
Note: The output delay is counted starting at the rising edge if tT1588CLKOUT is non-inverting.
Otherwise, it is counted starting at the falling edge.
This figure shows the data and command input AC timing diagram.
tT1588CLK
TSEC_1588_CLK_IN tT1588CLKH
TSEC_1588_TRIG_IN1/2
tT1588TRIGH
1. Refer Flash Control Register 1 (FLSHxyCR1) in QorIQ LS1028ARM for more details, where x: A or B, y: 1 or 2.
2. See Figure 29. on page 110.
3. See Figure 30. on page 111.
4. See Figure 31. on page 111.
This table provides the FlexSPI timing in SDR mode where FlexSPIn_MCR0[RXCLKSRC] =0x1 or 0x2
1. Refer Flash Control Register 1 (FLSHxyCR1) in QorIQ LS1028ARM for more details, where x: A or B, y: 1 or 2.
2. See Figure 29. on page 110.
3. See Figure 30. on page 111.
4. See Figure 31. on page 111.
This table provides the FlexSPI timing in DDR mode where FlexSPIn_MCR0[RXCLKSRC] =0x1 or 0x2
1. Refer Flash Control Register 1 (FLSHxyCR1) in QorIQ LS1028ARM for more details, where x: A or B, y: 1 or 2.
2. For DDR, Unit Internval (UI) is half of period. For example, 5 ns for 100 MHz
3. See Figure 29. on page 110.
4. See Figure 30. on page 111.
5. See Figure 32. on page 112.
This table provides the FlexSPI timing in DDR mode where FlexSPIn_MCR0[RXCLKSRC] =0x3
1. Refer Flash Control Register 1 (FLSHxyCR1) in QorIQ LS1028ARM for more details, where x: A or B, y: 1 or 2.
2. See Figure 29. on page 110.
3. See Figure 30. on page 111.
4. See Figure 32. on page 112.
5. See Figure 28. on page 110.
This figure shows the FlexSPI data input timing in DDR mode with an external DQS.
XSPI_A_SCK
XSPI_B_SCK
XSPI_A_DQS
XSPI_B_DQS
tFSIVKH tFSIVKL tFSIIVKH
tFSIIVKL
Input Data
Figure 28. FlexSPI input AC timing - DDR mode with an external DQS
This figure shows the AC test load for the FlexSPI interface.
t HIGH
FlexSPI clock
t LOW
This figure shows the FlexSPI AC timing diagram for SDR mode.
XSPI_A_SCK
XSPI_B_SCK
tFSIXKH
tFSIVKH
Input S igna ls :
tFSKHOX
tFSKHOV
Output S igna ls :
tFSKHOV2 tFSKHOX2
XSPI_A_CS0
XSPI_A_CS1
XSPI_B_CS0
XSPI_B_CS1
This figure shows the FlexSPI AC timing diagram for DDR mode 1 and 2.
XSPI_A_SCK
XSPI_B_SCK
tFSIDVW
Input Signals:
tFSIDVW tFSKHOV
tFSKLOX
Output Signals:
tFSKLOV
tFSKHOV2 tFSKHOX tFSKHOX2
XSPI_A_CS0_B
XSPI_A_CS1_B
XSPI_B_CS0_B
XSPI_B_CS1_B
1. Flextimer inputs and outputs are asynchronous to any visible clock. Flextimer outputs should be synchronized before use by
any external synchronous logic. Flextimer inputs are required to be valid for at least tPIWID to ensure proper operation.
2. See Figure 33. on page 113.
RL = 50 Ω
1. GPIO inputs and outputs are asynchronous to any visible clock. GPIO outputs must be synchronized before use by any
external synchronous logic. GPIO inputs are required to be valid for at least tPIWID ns to ensure proper operation.
2. See Figure 34. on page 114.
The figure below provides the AC test load for the GPIO.
Table 57. eDP/DP AUX channel electrical specifications (DP_OV DD = 1.8V) 1, 3, 4 (continued)
Table 57. eDP/DP AUX channel electrical specifications (DP_OV DD = 1.8V) 1, 3, 4 (continued)
This figure illustrates the Aux CH EYE mask at the transmitting device's package pins and vertices values
2 3
1
4
6 5
1 0.01 0
2 0.11 90
3 0.89 90
4 0.99 0
5 0.89 -90
6 0.11 -90
Note: For eDP 1.4 at TP1
Figure 35. Aux CH EYE mask for manchester-II transactions at transmitting device's package
This figure illustrates mask vertices for Aux CH EYE at connector pins of TX device
2 3
1
4
6 5
Point Time (from Eye Center) (ns) Minimum Voltage Value at Six Vertices (mV)
1 -185 0
2 -135 145
3 135 145
4 185 0
5 135 -145
6 -135 -145
Note: For DP 1.3 at TP2
1. When the pulse width is narrower than this threshold, the upstream device must ignore the pulse as a glitch.
2. When the pulse width is narrower than this threshold, the upstream device must read the Link/Sink Device Status field and
take corrective action. When the pulse width is wider than this threshold, it is likely to be actual cable unplug/re-plug event.
Upon detecting HPD high, the upstream device must read the Link/Sink Device Status field, and if the link is unstable, read the
Link/Sink Capability field of the DPCD before initiating Link Training.
3. Minimum Time after asserting HPD at the end of IRQ_HPD before de-asserting HPD at the start of the following IRQ_HPD.
1. High Limit= +300ppm; Low Limit= -5300ppm. For constant (non-SSC) Frequency
2. Based on D10.2 pattern
3. The EYE diagram must be measured with a Compliance Test Load and a signal analyzer that includes a Link CDR emulation
function matching the DisplayPort receiver Jitter Tolerance Mask specifications
4. At TP1 (refer eDP spec 1.4)
5. Applies to all supported lanes.
6. D+ rise to D- fall mismatch and D+ fall to D- rise mismatch.
7. 20% to 80%
8. For RBR
9. For HBR
10. For HBR2
11. Straight loss line between 0.675 GHz and 1.35 GHz
12. Transmitter jitter must be measured at source connector pins using a signal analyzer that has a second-order PLL with
closed-loop tracking bandwidth of 20MHz (for D10.2 pattern) and damping factor of 1.428.
SD_TXn_P or
SD_RXn_P
A Volts
Vcm= (A + B)/2
SD_TXn_N or
SD_RXn_N
B Volts
Using this waveform, the definitions are as described in the following list. To simplify the illustration, the definitions assume that
the SerDes transmitter and receiver operate in a fully symmetrical differential signaling environment:
Single-Ended Swing The transmitter output signals and the receiver input signals SD_TXn_P, SD_TXn_N, SD_RXn_P and
SD_RXn_N each have a peak-to-peak swing of A - B volts. This is also referred to as each signal
wire's single-ended swing.
Differential Output The differential output voltage (or swing) of the transmitter, VOD, is defined as the difference of the
Voltage, VOD (or two complementary output voltages: VSD_TX n_P - VSD_TXn_N. The VOD value can be either positive or
Differential Output negative.
Swing)
Differential Input The differential input voltage (or swing) of the receiver, VID, is defined as the difference of the two
Voltage, V ID (or complementary input voltages: VSD_RXn_P- VSD_RXn_N. The VID value can be either positive or
Differential Input negative.
Swing)
Differential Peak The peak value of the differential transmitter output signal or the differential receiver input signal is
Voltage, V DIFFp defined as the differential peak voltage, VDIFFp = |A - B| volts.
Differential Peak-to- Because the differential output signal of the transmitter and the differential input signal of the receiver
Peak, V DIFFp-p each range from A - B to -(A - B) volts, the peak-to-peak value of the differential transmitter output
signal or the differential receiver input signal is defined as differential peak-to-peak voltage, VDIFFp-p =
2 x VDIFFp = 2 x |(A - B)| volts, which is twice the differential swing in amplitude, or twice the
differential peak. For example, the output differential peak-to-peak voltage can also be calculated as
VTX-DIFFp-p = 2 x |VOD|.
Differential The differential waveform is constructed by subtracting the inverting signal (SD_TXn_N, for example)
Waveform from the non-inverting signal (SD_TXn_P, for example) within a differential pair. There is only one
signal trace curve in a differential waveform. The voltage represented in the differential waveform is
not referenced to ground. See Figure 42. on page 130 as an example for differential waveform.
Common Mode The common mode voltage is equal to half of the sum of the voltages between each conductor of a
Voltage, V cm balanced interchange circuit and ground. In this example, for SerDes output, Vcm_out = (VSD_TXn_P +
VSD_TXn_N) ÷ 2 = (A + B) ÷ 2, which is the arithmetic mean of the two complementary output voltages
within a differential pair. In a system, the common mode voltage may often differ from one
component's output to the other's input. It may be different between the receiver input and driver
output circuits within the same component. It is also referred to as the DC offset on some occasions.
To illustrate these definitions using real values, consider the example of a current mode logic (CML) transmitter that has a common
mode voltage of 2.25 V and outputs, TD and TD_B. If these outputs have a swing from 2.0 V to 2.5 V, the peak-to-peak voltage
swing of each signal (TD or TD_B) is 500 mV p-p, which is referred to as the single-ended swing for each signal. Because the
differential signaling environment is fully symmetrical in this example, the transmitter output's differential swing (VOD) has the
same amplitude as each signal's single-ended swing. The differential output signal ranges between 500 mV and -500 mV. In
other words, VOD is 500 mV in one phase and -500 mV in the other phase. The peak differential voltage (VDIFFp) is 500 mV. The
peak-to-peak differential voltage (VDIFFp-p) is 1000 mV p-p.
Notes:
1. At recommended operating conditions. See Recommended Operating Conditions.
2. Only down-spreading is allowed.
50 Ω
SDn_REF_CLKn_P
Input
amp
SDn_REF_CLKn_N
50 Ω
• For an external DC-coupled connection, as described in SerDes reference clock receiver characteristics on page 125, the
maximum average current requirements sets the requirement for average voltage (common mode voltage) as between 100
mV and 400 mV. Figure 39. on page 127 shows the SerDes reference clock input requirement for DC-coupled connection
scheme.
• For an external AC-coupled connection, there is no common mode voltage requirement for the clock driver. Because the
external AC-coupling capacitor blocks the DC level, the clock driver and the SerDes reference clock receiver operate in
different common mode voltages. The SerDes reference clock receiver in this connection scheme has its common mode
voltage set to GND. Each signal wire of the differential inputs is allowed to swing below and above the common mode voltage
(GND). Figure 40. on page 127 shows the SerDes reference clock input requirement for AC-coupled connection scheme.
Vcm
Single-ended mode:
• The reference clock can also be single-ended. The SDn_REF_CLKn_P input amplitude (single-ended swing) must be
between 400 mV and 800 mV peak-to-peak (from VMIN to VMAX) with SDn_REF_CLKn_N either left unconnected or tied to
ground.
• The SDn_REF_CLKn_P input average voltage must be between 200 and 400 mV. Figure 41. on page 128 shows the SerDes
reference clock input requirement for single-ended signaling mode.
• To meet the input amplitude requirement, the reference clock inputs may need to be DC- or AC-coupled externally. For the
best noise performance, the reference of the clock could be DC- or AC-coupled into the unused phase (SDn_REF_CLKn_N)
through the same source impedance as the clock input (SDn_REF_CLKn_P) in use.
SDn_REF_CLKn_P
0V
SDn_REF_CLKn_N
1. Caution: Only 100, 125, and 156.25 have been tested. In-between values do not work correctly with the rest of the system.
2. For PCI Express (2.5, 5 and 8 GT/s).
3. For SGMII, 2.5G SGMII and QSGMII.
4. Measurement taken from differential waveform.
5. Limits from PCI Express CEM Rev 2.0.
6. For PCI Express 5 GT/s, per PCI Express base specification Rev 3.0.
7. Measured from -150 mV to +150 mV on the differential waveform (derived from SD1_REF_CLKn_P minus
SD1_REF_CLKn_N). The signal must be monotonic through the measurement region for rise and fall time. The 300 mV
measurement window is centered on the differential zero crossing.
8. See Figure 42. on page 130.
9. For PCI Express 8 GT/s, per PCI Express base specification Rev. 3.0.
10. Measurement taken from single-ended waveform.
11. Matching applies to rising edge for SD1_REF_CLKn_P and falling edge rate for SD1_REF_CLKn_N. It is measured using
a ±75 mV window centered on the median cross point where SD1_REF_CLKn_P rising meets SD1_REF_CLKn_N falling. The
median cross point is used to calculate the voltage thresholds that the oscilloscope uses for the edge rate calculations. The
rise edge rate of SD1_REF_CLKn_P must be compared to the fall edge rate of SD1_REF_CLKn_N, the maximum allowed
difference should not exceed 20% of the slowest edge rate.
12. See Figure 43. on page 131.
This figure shows the differential measurement points for rise and fall time.
VIH = + 150 mV
0.0 V
VIL = - 150 mV
SDn_REF_CLKn_P
SDn_REF_CLKn_N
Figure 42. Differential measurement points for rise and fall time
This figure shows the single-ended measurement points for rise and fall time matching.
SDn_REF_CLKn_N SDn_REF_CLKn_N
TFALL TRISE
VCROSS MEDIAN + 75 mV
VCROSS MEDIAN - 75 mV
SDn_REF_CLKn_P SDn_REF_CLKn_P
Figure 43. Single-ended measurement points for rise and fall time matching
For protocols with data rates greater than 8 Gb/s where there is no reference clock jitter specification (ex:USXGMII-10.3125G),
use the PCIe 8G clock jitter requirements.
This table defines the AC requirements for SerDes reference clocks for USXGMII-10.3125G SerDes reference clocks need to
be verified by the customer’s application design.
Table 63. SD1_REF_CLKn_P and SD1_REF_CLKn_N input clock requirements for USXGMII
Table 63. SD1_REF_CLKn_P and SD1_REF_CLKn_N input clock requirements for USXGMII (continued)
1. Caution: Only 156.25 have been tested. Inbetween values do not work correctly with the rest of the system.
2. Measurement taken from differential waveform.
3. Per XFP specification, Rev 4.5, the Module Jitter Generation spec at XFI optical output is 10mUI (RMS) and 100 mUI (p-p).
In the CDR mode, the host is contributing 7 mUI (RMS) and 50 mUI (p-p) jitter.
SDn_TXn_P SDn_RXn_P
50 Ω
Transmitter 100 Ω Receiver
SDn_TXn_N SDn_RXn_N 50 Ω
The DC and AC specifications of the SerDes data lanes are defined in each interface protocol section below based on the
application usage:
• PCI Express
• SATA
• SGMII
• USXGMII
Note that an external AC-coupling capacitor is required for the above serial transmission protocols with the capacitor value defined
in the specification of each protocol section.
Table 64. PCI Express 2.0 (2.5 GT/s) differential transmitter output DC electrical characteristics 1
This table defines the DC electrical characteristics for the PCI Express 2.0 (2.5 GT/s) differential input at all receivers. The
parameters are specified at the component pins.
Table 65. PCI Express 2.0 (2.5 GT/s) differential receiver input DC electrical characteristics 1
Table 65. PCI Express 2.0 (2.5 GT/s) differential receiver input DC electrical characteristics 1 (continued)
This table defines the PCI Express 2.0 (5 GT/s) DC electrical characteristics for the differential output at all transmitters. The
parameters are specified at the component pins.
Table 66. PCI Express 2.0 (5 GT/s) differential transmitter output DC electrical characteristics 1
This table defines the DC electrical characteristics for the PCI Express 2.0 (5 GT/s) differential input at all receivers. The
parameters are specified at the component pins.
Table 67. PCI Express 2.0 (5 GT/s) differential receiver input DC electrical characteristics 1
This table defines the PCI Express 3.0 (8 GT/s) DC electrical characteristics for the differential output at all transmitters. The
parameters are specified at the component pins.
Table 68. PCI Express 3.0 (8 GT/s) differential transmitter output DC electrical characteristics 1
Table 68. PCI Express 3.0 (8 GT/s) differential transmitter output DC electrical characteristics 1 (continued)
This table defines the DC electrical characteristics for the PCI Express 3.0 (8 GT/s) differential input at all receivers. The
parameters are specified at the component pins.
Table 69. PCI Express 3.0 (8 GT/s) differential receiver input DC electrical characteristics 1
Table 69. PCI Express 3.0 (8 GT/s) differential receiver input DC electrical characteristics 1 (continued)
Table 70. PCI Express 2.0 (2.5 GT/s) differential transmitter output AC timing specifications
Table 70. PCI Express 2.0 (2.5 GT/s) differential transmitter output AC timing specifications (continued)
1. Each UI is 400 ps ± 300 ppm. UI does not account for spread-spectrum clock dictated variations.
2. The maximum transmitter jitter can be derived as TTX-MAX-JITTER = 1 -TTX-EYE = 0.25 UI. Does not include spread-spectrum
or REFCLK jitter. Includes devices random jitter at 10 -12.
3. Specified at the measurement point into a timing and voltage test load and measured over any 250 consecutive transmitter
Uis.
4. A TTX-EYE - 0.75 UI provides for a a total sum of deterministic and random jitter budget of TTX-JITTER-MAX = 0.25 UI for the
transmitter collected over any 250 consecutive transmitter Uis. The TTX-EYE-MEDIAN-to-MAX-JITTER median is less than half of the
total transmitter budget collected over any 250 consecutive transmitter UIs. It must be noted that the median is not the same
as the mean. The jitter median describes the point in time where the number of jitter points on either side is approximately equal
as opposed to the averaged time value.
5. See Figure 46. on page 143.
6. Jiiter is defined as the measurement variation of the crossing points (VTX-DIFFp-p = 0 V) in relation to a recovered transmitter
UI. A recovered transmitter UI is calculated over 3500 consecutive unit intervals of sample data. Jitter is measured using all
edges of the 250 consecutive UI in the center of the 3500 UI used for calculating the transmitter UI.
7. All transmitters must be AC coupled. The AC coupling is required either within the media or within the transmitting component
itself.
8. The chip's SerDes transmitter does not have CTX built-in. An external AC coupling capacitor is required.
This table defines the AC timing specifications for the PCI Express 2.0 (2.5 GT/s) differential input at all receivers. The parameters
are specified at the component pins. The AC timingspecifications do not include RefClk jitter.
Table 71. PCI Express 2.0 (2.5 GT/s) differential receiver input AC timing specifications
Table 71. PCI Express 2.0 (2.5 GT/s) differential receiver input AC timing specifications (continued)
1. Each UI is 400 ps ± 300 ppm. UI does not account for spread-spectrum clock dictated variations.
2. The maximum interconnect media and transmitter jitter that can be tolerated by the receiver can be derived as TRX-MAX-JITTER
= 1 - TRX-EYE = 0.6 UI.
3. Jitter is defined as the measurement variation of the crossing points (VRX-DIFFp-p = 0 V) in relation to a recovered transmitter
UI. A recovered transmitter UI is calculated over 3500 consecutive unit intervals of sample data. Jitter is measured using all
edges of the 250 consecutive UI in the center of the 3500 UI used for calculating the transmitter UI.
4. A TRX-EYE = 0.40 UI provides for a total sum of 0.60 UI deterministic and random jitter budget for the transmitter and
interconnect collected any 250 consecutive UIs. The TRX-EYE-MEDIAN-to-MAX-JITTER specification ensures a jitter distribution in
which the median and the maximum deviation from the median is less than half of the total. UI jitter budget collected over any
250 consecutive transmitter UIs. It must be noted that the median is not the same as the mean. The jitter median describes the
point in time where the number of jitter points on either side is approximately equal as opposed to the averaged time value. If
the clocks to the receiver and transmitter are not derived from the same reference clock, the transmitter UI recovered from 3500
consecutive UI must be used as the reference for the eye diagram.
5. It is recommended that the recovered transmitter UI is calculated using all edges in the 3500 consecutive UI interval with a
fit algorithm using a minimization merit function. Least squares and median deviation fits have worked well with experimental
and simulated data.
This table defines the PCI Express 2.0 (5 GT/s) AC specifications for the differential output at all transmitters. The parameters
are specified at the component pins. The AC timing specifications do not include RefClk jitter.
Table 72. PCI Express 2.0 (5 GT/s) differential transmitter output AC timing specifications
Table 72. PCI Express 2.0 (5 GT/s) differential transmitter output AC timing specifications (continued)
1. Each UI is 200 ps ± 300 ppm. UI does not account for spread-spectrum clock dictated variations.
2. The maximum transmitter jitter can be derived as TTX-MAX-JITTER = 1 -TTX-EYE = 0.25 UI. Does not include spread-spectrum
or REFCLK jitter. Includes devices random jitter at 10 -12.
3. Specified at the measurement point into a timing and voltage test load and measured over any 250 consecutive transmitter
Uis.
4. A TTX-EYE - 0.75 UI provides for a a total sum of deterministic and random jitter budget of TTX-JITTER-MAX = 0.25 UI for the
transmitter collected over any 250 consecutive transmitter Uis. The TTX-EYE-MEDIAN-to-MAX-JITTER median is less than half of the
total transmitter budget collected over any 250 consecutive transmitter UIs. It must be noted that the median is not the same
as the mean. The jitter median describes the point in time where the number of jitter points on either side is approximately equal
as opposed to the averaged time value.
5. See Figure 46. on page 143.
6. Reference input clock RMS jitter (< 1.5 MHz) at pin < 1 ps.
7. All transmitters must be AC coupled. The AC coupling is required either within the media or within the transmitting component
itself.
8. The chip's SerDes transmitter does not have CTX built-in. An external AC coupling capacitor is required.
This table defines the AC timing specifications for the PCI Express 2.0 (5 GT/s) differential input at all receivers. The parameters
are specified at the component pins. The AC timing specifications do not include RefClk jitter.
Table 73. PCI Express 2.0 (5 GT/s) differential receiver input AC timing specifications
1. Each UI is 200 ps ± 300 ppm. UI does not account for spread-spectrum clock dictated variations.
This table defines the PCI Express 3.0 (8 GT/s) AC specifications for the differential output at all transmitters. The parameters
are specified at the component pins. The AC timing specifications do not include RefClk jitter.
Table 74. PCI Express 3.0 (8 GT/s) differential transmitter output AC timing specifications
Table 74. PCI Express 3.0 (8 GT/s) differential transmitter output AC timing specifications (continued)
1. Each UI is 125 ps ± 300 ppm. UI does not account for spread-spectrum clock dictated variations.
2. All transmitters must be AC coupled. The AC coupling is required either within the media or within the transmitting component
itself.
3. The chip's SerDes transmitter does not have CTX built-in. An external AC coupling capacitor is required.
4. Measured with optimized preset value after de-embedding to transmitter pin.
5. PWJ parameters shall be measured after data-dependent jitter (DDJ) separation.
This table defines the AC timing specifications for the PCI Express 3.0 (8 GT/s) differential input at all receivers. The parameters
are specified at the component pins. The AC timingspecifications do not include RefClk jitter.
Table 75. PCI Express 3.0 (8 GT/s) differential receiver input AC timing specifications 5
Table 75. PCI Express 3.0 (8 GT/s) differential receiver input AC timing specifications 5 (continued)
1. Each UI is 125 ps ± 300 ppm. UI does not account for spreadspectrum clock dictated variations.
2. TRX-SV-8G is referenced to TP2P and is obtained after post-processing data is captured at TP2. TRX-SV-8G includes the effects
of applying the behavioral receiver model and receiver behavioral equalization.
3. Frequency = 2.1GHz. VRX-SV-DIFF-8G voltage may need to be adjusted over a wide range for the different loss calibration
channels.
4. Fixed at 100 MHz. The sinusoidal jitter in the total jitter tolerance may have any amplitude and frequency.
5. See Figure 45. on page 142.
6. Random jitter spectrally flat before filtering. Random jitter (Rj) is applied over the following range: The low frequency limit
may be between 1.5 and 10 MHz, and the upper limit is 1.0 GHz. Rj may be adjusted to meet the 0.3 UI value for TRX-SV-8G.
Sj sweep range
1.0 UI
20 dB
Rj (ps RMS)
Sj (UI PP)
decade
Sj
0.1 UI
Rj
~ 3.0 ps RMS
0.01 MHz 0.1 MHz 1.0 MHz 10 MHz 100 MHz 1000 MHz
The AC timing and voltage parameters must be verified at the measurement point. The package pins of the device must be
connected to the test/measurement load within 0.2 inches of that load, as shown in the following figure. Note that the allowance
of the measurement point to be within 0.2 inches of the package pins is meant to acknowledge that package/board routing may
benefit from D+ and D- not being exactly matched in length at the package pin boundary. If the vendor does not explicitly state
where the measurement point is located, the measurement point is assumed to be the D+ and Dpackage pins.
D + package pin
C = CTX
Transmitter
silicon
+ package
C = CTX
D - package pin
R = 50 Ω R = 50 Ω
This table provides the Gen1i/1m or 1.5 Gbits/s differential receiver input DC characteristics for the SATA interface.
Table 77. SATA Gen 1i/1m 1.5G receiver input DC electrical characteristics 1
Table 77. SATA Gen 1i/1m 1.5G receiver input DC electrical characteristics 1 (continued)
This table provides the differential transmitter output DC characteristics for the SATA interface at Gen2i/2m or 3.0 Gbits/s
transmission.
This table provides the Gen2i/2m or 3 Gbits/s differential receiver input DC characteristics for the SATA interface.
This table provides the differential transmitter output DC characteristics for the SATA interface at Gen 3i transmission.
This table provides the Gen 3i differential receiver input DC characteristics for the SATAinterface.
SDn_REF_CLKn_P/ tCLK_DUTY 40 50 60 % 2
SDn_REF_CLKn_N reference
clock duty cycle
1. Caution: Only 100 MHz and 125 MHz have been tested. In-between values do not work correctly with the rest of the system.
2. Measurement taken from differential waveform.
3. At RefClk input.
4. In a frequency band from 150 kHz to 15 MHz at BER of 10 -12.
5. Total peak-to-peak deterministic jitter must be less than or equal to 50 ps.
This table provides the differential transmitter output AC characteristics for the SATA interface at Gen 1i/1m or 1.5 Gbits/s
transmission. The AC timing specifications do not include RefClk jitter.
1. Measured at transmitter output pins peak-to-peak phase variation; random data pattern.
This table provides the Gen1i/1m or 1.5 Gbits/s differential receiver input AC characteristics for the SATA interface. The AC timing
specifications do not include RefClk jitter.
This table provides the differential transmitter output AC characteristics for the SATA interface at Gen 2i/2m or 3.0 Gbits/s
transmission. The AC timing specifications do not include RefClk jitter.
1. Measured at transmitter output pins peak-to-peak phase variation; random data pattern.
This table provides the differential receiver input AC characteristics for the SATA interface at Gen2i/2m or 3.0 Gbits/s transmission.
The AC timing specifications do not include RefClk jitter.
This table provides the differential transmitter output AC characteristics for the SATA interface at Gen 3i transmission. The AC
timing specifications do not include RefClk jitter.
This table provides the differential receiver input AC characteristics for the SATA interface at Gen 3i transmission The AC timing
specifications do not include RefClk jitter.
This figure shows an example of a 4-wire AC-coupled SGMII serial link connection.
SDn_TXn_P SDn_RXn_P
CTX
50 Ω
CTX
SDn_TXn_N SDn_RXn_N
50 Ω
SGMII
SerDes Interface
SDn_RXn_P SDn_TXn_P
CTX
50 Ω
Receiver Transmitter
100 Ω
CTX
SDn_RXn_N SDn_TXn_N
50 Ω
SGMII
SerDes Interface
SDn_TXn_P
50 Ω
50 Ω
SDn_TXn_N
This table defines the SGMII 2.5G transmitter DC electrical characteristics for 3.125 GBaud.
Notes:
1. For recommended operating conditions, see Recommended Operating Conditions.
This table lists the SGMII DC receiver electrical characteristics. Source synchronous clocking is not supported. Clock is recovered
from the data.
This table defines the SGMII 2.5G receiver DC electrical characteristics for 3.125 GBaud.
Notes:
1. For recommended operating conditions, see Recommended Operating Conditions.
Transmitter and receiver AC characteristics are measured at the transmitter outputs (SDn_TXn_P and SDn_TXn_N) or at the
receiver inputs (SDn_RXn_P and SDn_RXn_N) respectively, as shown in this figure.
D + package pin
C = CTX
Transmitter
silicon
+ package
C = CTX
D - package pin
R = 50 Ω R = 50 Ω
This table provides the SGMII and SGMII 2.5G receiver AC timing specifications. TheAC timing specifications do not include
RefClk jitter. Source synchronous clocking is notsupported. Clock is recovered from the data.
1. Measured at receiver.
2. Total jitter is composed of three components: deterministic jitter, random jitter, and single frequency sinusoidal jitter. The
sinusoidal jitter may have any amplitude and frequency in the unshaded region of the Single-frequency sinusoidal jitter limits
figure shown below. The sinusoidal jitter component is included to ensure margin for low frequency jitter, wander, noise,
crosstalk and other variable system effects.
3. See Figure 50. on page 154.
The sinusoidal jitter in the total jitter tolerance may have any amplitude and frequency in the unshaded region of this figure.
8.5 UI p-p
Sinuosidal
Jitter 20 dB/dec
Amplitude
0.10 UI p-p
1. The jitter (RCBHPJ) and amplitude have to be correlated, for example, by a PCB trace.
2. See Figure 51. on page 156.
The sinusoidal jitter may have any amplitude and frequency in the unshaded region of this figure.
5 UI p-p
Sinuosidal
Jitter
Amplitude
0.05 UI p-p
3.16.8 1000Base-KX
1. The receiver interference tolerance level of this parameter shall be measured as described in Annex 69A of the IEEE Std
802.3ap-2007.
2. Random jitter is specified at a BER of 10 -12.
3. The AC specifications do not include Refclk jitter.
Transmitter baud rate TBAUD 10.3125 - 100 ppm 10.3125 10.3125 + 100 ppm GBd
This table defines the 10G-SXGMII receiver AC timing specifications. RefClk jitter is not included.
Receiver baud rate RBAUD 10.3125 - 100 10.3125 10.3125 + 100 GBd -
ppm ppm
3.17 I2C
Noise margin at the LOW level for each VNL 0.1 x OVDD - V -
connected device (including hysteresis)
Noise margin at the HIGH level for each VNH 0.2 x OVDD - V -
connected device (including hysteresis)
1. As a transmitter, the chip provides a delay time of at least 300 ns for the SDA signal (referred to the VIHmin of the SCL signal)
to bridge the undefined region of the falling edge of SCL to avoid unintended generation of a START or STOP condition. When
the chip acts as the I 2C bus master while transmitting, it drives both SCL and SDA. As long as the load on SCL and SDA are
balanced, the chip does not generate an unintended START or STOP condition. Therefore, the 300 ns SDA output delay time
is not a concern.
2. The maximum tI2OVKL has to be met only if the device does not stretch the LOW period (tI2CL) of the SCL signal.
3. The symbols used for timing specifications herein follow these patterns: t(first two letters of functional block)(signal)(state)(reference)(state)
for inputs and t(first two letters of functional block)(reference)(state)(signal)(state) for outputs. For example, tI2DVKH symbolizes I 2C timing (I2)
with respect to the time data input signals (D) reaching the valid state (V) relative to the tI2C clock reference (K) going to the
high (H) state or setup time. Also, tI2SXKL symbolizes I2C timing (I2) for the time that the data with respect to the START condition
(S) went invalid (X) relative to the tI2C clock reference (K) going to the low (L) state or hold time. Also, tI2PVKH symbolizes I2C
timing (I2) for the time that the data with respect to the STOP condition (P) reaches the valid state (V) relative to the tI2C clock
reference (K) going to the high (H) state or setup time.
4. See Figure 52. on page 162.
5. See Figure 53. on page 162.
RL = 50 Ω
SDA
3.18 JTAG
This section describes the DC and AC electrical specifications for the JTAG (IEEE 1149.1) interface.
JTAG external clock rise and fall times tJTGR/tJTGF 0.0 2.0 ns -
1. TRST_B is an asynchronous level sensitive signal. The setup time is for test purposes only.
2. All outputs are measured from the midpoint voltage of the falling edge of tTCLK to the midpoint of the signal in question. The
output timings are measured at the pins. All output timings assume a purely resistive 50-Ω load. Time-of-flight delays must be
added for trace lengths, vias, and connectors in the system.
3. The symbols used for timing specifications follow these patterns: t(first two letters of functional block)(signal)(state)(reference)
(state) for inputs and t(first two letters of functional block)(reference)(state)(signal)(state) for outputs. For example, tJTDVKH
symbolizes JTAG device timing (JT) with respect to the time data input signals (D) reaching the valid state (V) relative to the
tJTG clock reference (K) going to the high (H) state or setup time. Also, tJTDXKH symbolizes JTAG timing (JT) with respect to
the time data input signals (D) reaching the invalid state (X) relative to the tJTG clock reference (K) going to the high (H) state.
Note that, in general, the clock reference symbol representation is based on three letters representing the clock of a particular
function. For rise and fall times, the latter convention is used with the appropriate letter: R (rise) or F (fall).
4. See Figure 54. on page 164.
5. See Figure 55. on page 165.
6. See Figure 56. on page 165.
7. See Figure 57. on page 165.
This figure shows the AC test load for TDO and the boundary-scan outputs of the device.
RL = 50 Ω
VM VM VM
JTAG external clock
tJTGR
tJTKHKL
tJTGF
tJTG
TRST_B
VM VM
tTRST
VM VM
tJTDVKH
tJTDXKH
tJTKLDV
tJTKLDX
tSAIC
tSAIL
SAIn_Rx_BCLK tSAIH
tSAISFSLOV tSAISFSXKH
SAIn_Tx_SYNC
tSAISFSVKH tSAISXKH
tSAISFSLOV
SAIn_Rx_SYNC
tSAISLOX
tSAISFSLOV tSAISLOX
SAIn_Tx_DATA
tSAISVKH tSAISXKH
SAIn_Rx_DATA
1. Master mode
2. Refer the CTARx register in QorIQ LS1028ARM for more details
3. tp is the input clock period for the SPI controller.
4. Slave mode
5. See Figure 59. on page 169.
6. See Figure 60. on page 170.
7. See Figure 61. on page 171.
8. See Figure 62. on page 172.
tCSC tASC
CSx
t SDC
t SCK
SCK Output
(CPOL = 0) t SDC
SCK Output
(CPOL = 1)
t NIIXKH
t NIIVKH
t NIKHOX
t NIKHOV
SOUT
CSx
SCK Output
(CPOL = 0)
tNIIXKH
SCK Output
(CPOL = 1)
tNIIVKH
t NIKHOX
t NIKHOV
SOUT
t ASC
t CSC
SS
t SCK
t SDC
SCK Input
(CPOL = 0) t SDC
SCK Input
(CPOL = 1)
tA tDI
t
NEKHOV
t
NEKHOX
tNEIVKH
tNEIXKH
SS
SCK Input
(CPOL = 0)
SCK Input
(CPOL = 1)
tNEKHOV
t DI
tA
tNEKHOX
t NEIVKH
t NEIXKH
Table 119. USB 3.0 PHY transceiver supply DC voltage (USB_HV DD = 3.3V) 1
This table provides the USB 3.0 transmitter DC electrical characteristics at package pins.
This table provides the USB 3.0 receiver DC electrical characteristics at the Rx package pins.
This table provides the USB 3.0 receiver AC timing specifications at the Rx package pins.
This table provides the key LFPS electrical specifications at the transmitter.
1. Measured at compliance TP1. See the Transmit normative setup figure below for details.
2. See Figure 63. on page 176.
This figure shows the transmit normative setup with reference channel as per USB 3.0 specifications.
TP1
Core cluster group PLL 600 800 600 1000 600 1300 600 1500 MHz 1, 3, 4
frequency
Core frequency 300 800 300 1000 300 1300 300 1500 MHz 1, 3, 4
Platform clock frequency 300 300 300 400 300 400 300 400 MHz 1
GPU and LCD controller 400 400 400 500 400 650 400 700 MHz 5
frequency
Memory bus clock frequency 650 650 650 800 650 800 650 800 MHz 1, 2
ENETC frequency 400 400 400 400 400 400 400 400 MHz 6
Notes:
1. Caution:The platform clock to SYSCLK ratio and core to SYSCLK ratio settings must be chosen such that the resulting core
frequency, and platform clock frequency do not exceed their respective maximum or minimum operating frequencies.
2. The memory bus clock speed is half the DDR3L/DDR4 data rate.
3. For supported voltage/frequency options, see the orderable part list of QorIQ LS1028A Multicore Communications Processors
at www.nxp.com.
4. The core cluster can run at cluster group PLL/1, PLL/2 and PLL/4. For the PLL/1 case, the minimum frequency is 600 MHz.
For PLL/2 case, the minimum frequency is 400 MHz. The minimum frequency provided to the core cluster after any dividers
must always be greater than or equal to the platform frequency. For the case of the minimum platform frequency = 300 MHz,
the minimum core cluster frequency is 300 MHz.
5. GPU will run on CGA_PLL2 for 700MHz.
6. For the case of the minimum platform frequency = 300 MHz, ENETC frequency will be a divide by option of CGA PLLn
5 Thermal
This table shows the thermal characteristics for the chip. Note that these numbers are based on design estimates.
Notes:
1. Junction-to-Case thermal resistance is determined using an isothermal cold plate heat extraction model. Case temperature
is the surface temperature at the package lid top side centre.
Adhesive or
Die lid
thermal interface material
Die
Lid adhesive
Printed circuit-board
The system board designer can choose between several types of heat sinks to place on the device. There are several
commercially-available thermal interfaces to choose from in the industry. Ultimately, the final selection of an appropriate heat
sink depends on many factors, such as thermal performance at a given air velocity, spatial volume, mass, attachment method,
assembly, and cost.
6 Package information
Notes:
1. All dimensions are in millimeters.
2. Dimensioning and tolerancing per ASME Y14.5M - 1994.
3. Pin A1 feature shape, size and location may vary.
4. Maximum solder ball diameter measured parallel to datum C.
5. Datum C, the seating plane, is determined by the spherical crowns of the solder balls.
6. Parallelism measurement shall exclude any effect of mark on top surface of package.
7. Lid overhang on substrate not allowed.
NOTE
Users not implementing the QorIQ platform's trust architecture features should connect TA_PROG_SFP to GND.
8 Ordering information
Contact your local NXP sales office or regional marketing team for order information.
p ls n nn n x t e n c d r
Qual Status
Generation
Performance Level
Number of Virtual cores
Unique ID
Core Type
Temperature Range
Encryption
Package Type
CPU Speed1
Die Revision
P="Pre-qual" LS = 1 02 = 8 A= S = Standard E = Export 7 = H = 800 N= A=
Layersc Two = ARM temp controlled FCPBGA MHz 1300 Rev
Blank="Qualifi
ape Cores G crypto C4 PbFree MT/s 1.0
ed" X = Extended K = 1000
P hardware
01 = temp MHz Q=
U enabled
One 1600
Core Y = High N = Export N = 1300 MT/s
Extended temp controlled MHz
C = AEC Q100 crypto P = 1500
Grade 3 hardware MHz
Stresses disabled
1. For the LS1028A family of devices, parts marked with "H" require 0.9 V operating voltage.
2. For the LS1028A family of devices, parts marked with "Y" are available with CPU speed 800MHz only.
3. For the LS1028A family of devices, parts marked with "C" require 1.0 V operating voltage.
LS1028XXXXXXX
AWLYYWW
MMMMM CCCCC
YWWLAZ
Legend:
LS1028XXXXXXX is the orderable part number
AWLYYWW is the test traceability code
MMMMM is the mask number
CCCCC is the country code
YWWLAZ is the assembly traceability code
9 Revision history
This table summarizes revisions to this document.
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