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Afm Final

Atomic force microscopy (AFM) can achieve very high resolution imaging and manipulation of samples at the nanoscale. AFM works by raster scanning a probe tip across a sample surface while measuring the tip-sample interaction forces, allowing for imaging of three-dimensional surface topography with x-y resolution of 1nm and z-resolution of 0.1nm. AFM can also be used to manipulate samples by controlling interaction forces between the tip and sample. Common imaging modes include contact mode, non-contact mode, and intermittent/tapping mode.

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8 views15 pages

Afm Final

Atomic force microscopy (AFM) can achieve very high resolution imaging and manipulation of samples at the nanoscale. AFM works by raster scanning a probe tip across a sample surface while measuring the tip-sample interaction forces, allowing for imaging of three-dimensional surface topography with x-y resolution of 1nm and z-resolution of 0.1nm. AFM can also be used to manipulate samples by controlling interaction forces between the tip and sample. Common imaging modes include contact mode, non-contact mode, and intermittent/tapping mode.

Uploaded by

Aisha rana
Copyright
© © All Rights Reserved
We take content rights seriously. If you suspect this is your content, claim it here.
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Atomic Force Microscopy

Typical AFM resolution: x-y:


1nm; z: 0.1nm
Get to the
point!
• For imaging, the reaction of the probe to
the forces that the sample imposes on it
can be used to form an image of the
three-dimensional shape (topography)
of a sample surface at a high resolution.
This is achieved by raster scanning the
position of the sample with respect to
the tip and recording the height of the
probe that corresponds to a constant
probe-sample interaction
• In manipulation, the forces between tip
and sample can also be used to change
the properties of the sample in a
controlled way. Examples of this include
atomic manipulation, scanning probe
lithography and local stimulation of
cells.
Imaging mode
1.contact mode
2.non contact mode
3.intermittent / tapping mode
In contact mode, the tip is "dragged" across the surface of the sample and the
contours of the surface are measured either using the deflection of the cantilever
directly or, more commonly, using the feedback signal required to keep the
cantilever at a constant position.
Close to the surface of the sample, attractive forces can be quite strong, causing
the tip to "snap-in" to the surface. Thus, contact mode AFM is almost always done
at a depth where the overall force is repulsive, that is, in firm "contact" with the
solid surface.
In ambient conditions, most samples develop a liquid meniscus layer.
Because of this, keeping the probe tip close enough to the sample for
short-range forces to become detectable while preventing the tip from
sticking to the surface presents a major problem for contact mode in
ambient conditions.
In non-contact atomic force microscopy mode, the tip of the cantilever
does not contact the sample surface.

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