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Experiment 1, Logic Function Test of Gate Circuit

The document outlines a laboratory course focused on digital logic circuits, detailing the purpose, content, and requirements of the experiments conducted. It includes a schedule of experiments, expectations for preparation and conduct, and guidelines for reporting results. Additionally, it specifies the evaluation criteria and format for experimental reports.

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Ryan Murangariri
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0% found this document useful (0 votes)
3 views28 pages

Experiment 1, Logic Function Test of Gate Circuit

The document outlines a laboratory course focused on digital logic circuits, detailing the purpose, content, and requirements of the experiments conducted. It includes a schedule of experiments, expectations for preparation and conduct, and guidelines for reporting results. Additionally, it specifies the evaluation criteria and format for experimental reports.

Uploaded by

Ryan Murangariri
Copyright
© © All Rights Reserved
We take content rights seriously. If you suspect this is your content, claim it here.
Available Formats
Download as PPT, PDF, TXT or read online on Scribd
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Laboratory

seating chart
The experiment
of digital logic
The purpose of the course
 1 The function, parameter and basic
application of the integrated circuit are
mastered by experiment, and the
theoretical knowledge is consolidated
and supplemented.
 2 Mastering the design methods and
integrated applications of digital logic
circuits.
 3 Training experimental skills and
improving practical ability.
Contents and requirements
of the course
 A total of 16 class hours in the
course, and 8 experiments are
conducted, of which 6
experiments are confirmatory, 2
experiments are designing.
Time Allocation
 Experiment 1, logic function test of
gate circuit (confirmatory ,2 hours)
 Experiment 2, design and test of
combinational logic circuit (designing,
2 class hours)
 Experiment 3, adder design (designing,
2 class hours)
 Experiment 4, data selector application
(designing, 2 class hours)
 Experiment 5, decoder application
(designing, 2 class hours)
 Experiment 6, flip flop function test
(confirmatory, 2 class hours)
 Experiment 7, counter application
(designing, 4 class hours)
Experimental requirements
 Preview the experiment instruction book and
related books before class, and write preview
report. (failing to prepare for cancellation of the
experimental qualification)
 Don't be late or leave early. If you are sick, you
should ask for leave in advance. Skipping
classes without doing experiments. Those who
are 10 minutes later are required to cancel the
experimental qualification and do not do it
 According to the number of seats, relative to the
fixed seat after each experiment.
 Before the experiment, register the experimenter
information on the record book, and check the
tools and equipment before the experiment, if
there is lack or damage should be promptly
reported 。
 Without permission, the tools and equipment
are not allowed to be taken away.
 In the experiment, the correct operation should
be carried out in strict accordance with the
experimental procedures. If the instrument is
damaged due to improper personal operation,
the individual shall be responsible for it.
 Caution! In case of abnormal situation, the
power should be cut off first.
 Keep indoor sanitation, don't spit and throw
rubbish. At the end of each experiment, the
students should tidy up the equipment of the
group, and finally arrange the cleaning for the
students on duty.
Course examination method
 The experimental results are included in
the course of digital logic, accounting
for 20% of the course.
 The experimental results were
composed of experiment preparation
(10%), usual score (50%) and experiment
report (40%). Usually failing grades or
truancy amounts to 30%, the
experimental results are not passed.
Experimental report
 The experiment report must be
handed in the next experiment. The
results of the experiment are
calculated by passing the experiment
without reason.
 Those who fail in the experiment
report must be redone.
 The missing report failed in the
experiment.
Experimental report format
 1 Preview part:
 1.1 Experimental purpose
 1.2 Experimental principle (including
principle, circuit design steps, diagram of
the circuit )
 1.3 Experimental equipment and devices
 2 Experimental part:
 2.1 Experiment contents and steps
 2.2 Experimental results and analysis
 2.3 Experimental summary
Experiment 1, logic
function test of gate circuit
一、 Experimental Purpose
 1. Familiar with logic function of gate
circuit.
 2. Familiar with the use of electronic
technology experiment box and
digital multi-meter.
二、 Experimental equipment
and devices
 1. Electronic technology experiment box
 2. Digital multi-meter
 3. Devices: 74LS00 2 chips
 74LS20 1 chip
 74LS86 1 chip
三、 Experiment content:
 Before the experiment, the power supply of the
test box is checked, and then the integrated
circuit is selected. The wiring is connected
according to the experimental wiring diagram
designed by ourselves.
 Pay particular attention to the Vcc and the
ground can not take the wrong line, then after
the teachers check before electricity
experiment. In the experiment, it is necessary to
disconnect the power source before changing
the wiring, and then connect the line and then
electrify the experiment.
1. testing logic function of gate circuit
 with a chip of four input NAND gate 74LS20, wiring
according to figure 1.1, The input terminal is connected
with the data switch socket, and the output end is
connected with the light emitting diode.
 fill the table with the results.
Vcc
Input Output
14
A B C D Y Voltage
1 A
1 1 1 1
2 B
Y 6
4 0 1 1 1
C
5 D 0 0 1 1
74LS20 V 0 0 0 1
7
0 0 0 0
图 1.1
2. XOR gate logic function test
 (1) select two input four
XOR gate 74LS86, 1
3
according to Figure 1.2 2
9
8
wiring, the input end of 1, 10
4
2, 4, 5 connected to the 5
6
V
data switch, output A, B,
图 1.2
Y to light emitting diode.
 (2) Set the data switch, and fill the
table with the results.
Table1-2
Input Output
Y voltage
A B Y
0 0 0 0
1 0 0 0
1 1 0 0
1 1 1 0
1 1 1 1
0 1 0 1
3. Logical relations of logic circuits

 1
Using 74LS00, 3 9
connecting the input 2
10
8

pins and logic switch 1


3
socket according to 2

figure 1.3, setting 12


11
4
input level according 5
6 13

to table 1.3. Test


output. 图 1.3
Table1-3
Input Output
A B Y
0 0
0 1
1 0
1 1
四 . Experimental report requirements
 1. Fill in the form and draw the logical diagram
according to each step.
 2. Answer the questions:
 (1) How to judge whether the logic function of
gate circuit is normal?
 (2) a continuous pulse input NAND gate. Allow
pulse through the remaining end what state?
What state prohibits the pulse passing?
Attached: foot codes and models
of digital integrated circuits
Attachment: pin diagram and
package diagram
Such as TTL gate circuit chip (four
input NAND gate 2, type 74LS00)

VCC
(+5V)

Power ground GND


Introduction of electronic technology experiment box
Nixie
Second
CP pulse tube
signal

Data
switch

+5V Binary
powe display

Logic
switch
Experimental
Area
Pin diagram of 74LS20
Pin diagram of 74LS86 Pin diagram of 74LS00

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