TechWeb E DL Si
TechWeb E DL Si
Agenda
•Si Diodes
•Si Transistors
• Si Diodes
• Types and Characteristics
• Rectifier Diode: Characteristics Comparison
• Schottky Barrier Diode: Types and Characteristics
• Fast Recovery Diode: Types and Characteristics
• Si Transistors
• Criteria for Selecting a Transistor
• Application Examples Utilizing the Merits
Types of Si Diode
PIN-Di
<Reverse> <Forward>
○
Current
・Forward (VF-IF)
IF:forward current Rectifier
Need small forward voltage to flow a Di
forward current.
× VF:forward voltage
Voltage
Flow small reverse current with a
reverse voltage.
IR:Reverse current
Break down (BV) ZD Leakage Current
Voltage
Voltage
Trr
VR VF Time VR VF
High Speed
Di
Other Di IR
IR IR
Use at hi
Metal VF IR Trr Suitable Applications
temp
Low VF & IR
(Balanced)
Mo × △ ○ △ DC/DC converters
IF Ti Mo Pt IR IR
Ti Ti
Mo
Other Di
Mo
Pt
Pt
Other Di
VF Other Di VR VF
Barrier Metal
Ti: Titanium
Mo:Molybdenum SBD characteristics are different
Chip (Si) by the barrier metal.
Pt: Platinum
Batt
control
③ TV
Junction box
RBxx5/RBxx0 series
Under RBR series
② Solar panel
Development NEW RBQ series
1μA RBxx7 series
①
Under
Development
DC/DC converter
Power supply(100V) NEW
Note PC
RBxx8 series
Automotive Junction box Automotive
Power supply(100V)
Automotive(EV, HIV)
Power supply(200V)
Power
1nA Supply
PFC
Ultra high speed × ◎ ○ ○
(Continuous current mode)
PFC
Ultra low VF ○ △ ○ ○
(Boundary current mode)
P
FRD characteristics
N depend on impurities in a semiconductor.
IF IF
Time
Trade-off
VF IR
Reverse Recovery Noises depend on the amount of IRp and dir/dt to recover.
IRp
dir/dt
For improving these noises, need to make IRp lower and dir/dt slow down.
Reverse Recovery Noises depend on the amount of IRp and dir/dt to recover.
⇒ Improve IRp with a wafer process technology
P P
N- Epi N- Epi
Decrease surface
diffusive
concentration of
N+ Sub P diffusion layer N+ Sub
IRp
dir/dt
IRp
dir/dt
• trr can be faster but the noises remains if only IRp is improved.
• VF has to increases as an exclusive event of IRp improvement.
Current / A
Tj=125℃
M/標準
M/標準
RFNL series
Ultra low VF
RFN series
Standard Industrial module
Server
RFUH series
Lighting
Tablet
RFV series
Lap top PC
High Speed
LCD-TV
Air conditioning For high power products (200W to 300W and more)
VF
© 2017 ROHM Co.,Ltd. P. 19
Si Power Devices: Application Examples Utilizing the Merits
• Si Diodes
• Si Transistors
• Types, Characteristics, Comparison
- Bipolar, MOSFET, IGBT
• High Voltage MOSFETs
- Standard Super Junction MOSFET
- Low Noise Super Junction MOSFET
- High Speed Super Junction MOSFET
- Presto MOS High Speed trr Super Junction
MOSFET
- Hybrid MOS
• Criteria for Selecting a Transistor
• Application Examples Utilizing the Merits
Types of Transistor
General
High Speed
Small signal Switching
Power
100mA type
Transistor
Digital Transistor 500mA type
For muting
Small signal
MOSFET
Power
IGBT Power
Switching time Slow (Electron + hole) Slow (Electron + hole) High Speed (Electron or hole)
Average
Temp stability Good Good
hFE up & VBE down
Types of Transistor
Bipolar
Transistor
Non-connection
(Isolated)
Current flows
into Base No current flows
into Gate
Disappear
To Collector to
recombine
Emitter current
Base
by Gate voltage
Reverse Forward
voltage current voltage
© 2017 ROHM Co.,Ltd. P. 23
Si Transistor
Types of Transistor
IGBT
Non-connection
つながっていない Non-connection
(Isolated)
(絶縁されている) (C) (Isolated)
(G)
No GateにCurrentは
current flows (E) No current flows
流れない
into Gate into Gate
100k
10k
1k
Si MOS
(Planar /Super Junction)
100
pass
Current
Reduced Qg 40%
Low Noise
400V/500V 600V/650V
600V/800V 800V
600V
Note : Products under development may be included in . Please contact us if you have any request.
pass
Current
N+ SUB Resistivity ratio = 5:1 N+ SUB
Drain Drain
Existing
•Combined low noise characteristics of planar MOS with low Ron of SJ MOS characteristics.
•Replace and improve planar MOS with lower Ron.
A x Ron 100
Reduced Gate resistance Rg Reduced gate-drain charge Qgd Keep low noise performance
M/標準
Rg[Ω]
5
M/標準
EN series
KN series
M/標準
0
M/標準
M/標準
M/標準
M/標準
M/標準
M/標準
M/標準
M/標準
M/標準
M/標準
M/標準
0 20 40 60 80 100
ID[A] Qg[nC]
Target of KN series
■ Operations of high Vin inverter circuit with a power supply ■ Comparisons with existing devices
Forward Regenerated
current current
Emitter Source
Id Is
Reduced IGBT FRD
60% of loss
IF
PrestoMOS
t
PrestoMOS
Regenerated Forward
current current
V V
Note : Products under development may be included in . Please contact us if you have any request.
Coverage
IGBT⇒Hybrid-MOS
MOSFET IGBT
Low Ron at high
High speed switching
current
100 IGBT MOSFET⇒Hybrid-MOS Low Ron at low
Tolerance for thermal
k current
runaway
Hybrid-MOS
Power(VA)
10k
1k
ROHM’s Proprietary, the Would First
100
MOSFET Hybrid MOSFET
The best of both MOSFET and IGBT
10k 100 1M
k
Frequency(Hz
)
14 SJ-MOS
R6020ANX
12 IGBT Off Wave Form Hybrid MOS Off Wave Form
Hybrid-MOS
Reduced R6035GNX Ic Id
10
62% of Ron
(Tj=125℃) Tj=125℃
8
VG VG
6 Vce Vds
4 Tj=25℃
G G
With tail current No tail current
2 Few Ron
fluctuations
0 ID(A)
0 10 20 30 40 50
97.00%
R6035GNX (Hybrid-
MOS600V/35A)
96.50% R6021ANZ
(SJ-MOS 600V/21A)
RGTH50TS65D
(IGBT 650V/50A)
96.00%
0 500 1000 1500 2000 2500
Input Power (W)
MN Presto MOS High Speed trr, Low Ron R6030MNX 600 30 0.11 45 92
Note : Products under development may be included in . Please contact us if you have any request.
800V Series
RDS(on) Qg
VDSS ID
Part No. PKG Typ.(Ω) Typ.(nC)
(V) (A)
Vgs=10V Vgs=10V
R8001CND CPT3 1 6.7 7.2
800
R8002CND D-pack 2 3.3 12.7
R8005AND3 TO252 5 1.6 21
800
R8007AND3 D-pack 7 1.05 28
R8002ANJ 2 3.3 12.7
LPT
R8005ANJ 800 5 1.6 21
D2-pack
R8008ANJ 8 0.79 39
R8002ANX 2 3.3 12.7
R8005ANX 5 1.6 21
TO220FM 800
R8008ANX 8 0.79 39
R8010ANX 10 0.43 62
R8012ANZ1 12 0.35 78
TO247 800
R8016ANZ1 16 0.23 115
Note : Products under development may be included in . Please contact us if you have any request.
Note : Products under development may be included in . Please contact us if you have any request.
Note : Products under development may be included in . Please contact us if you have any request.
© 2017 ROHM Co.,Ltd. P. 45
Si Transistors
Note : Products under development may be included in . Please contact us if you have any request.
Note : Products under development may be included in . Please contact us if you have any request.
• Si Diodes
• Si Transistors
• Criteria for Selecting a Transistor
- Application Criteria
① Measure actual current and voltage wave
form
② Always within absolute maximum ratings?
③ Within SOA?
④ Within SOA derated by the ambient
temperature at actual use?
⑤ Single pulse or continuous pules?
⑥ Is the average power dissipation within
the rated power at the ambient
temperature?
⑦ Is the junction temperature within 150℃?
⑧ Criteria for selecting a transistor
• Application Examples Utilizing the Merits
© 2017 ROHM Co.,Ltd. P. 48
Criteria for Selecting a Transistor
Yes
No
③ Within SOA (Safety Operating Area)?
Yes
④ Within SOA derated by the ambient temperature No
at actual use?
N
Yes Yes
⑤ Single pulse? ⑤ Continuous pules?
G
Yes
⑥ Is the average power
Yes dissipation within the rated No
power at the ambient
temperature?
Yes
OK
OFF to ON ON to OFF
Take magnified wave form of off to on and on to off to calculate switching power losses.
OFF to ON ON to OFF
Limited by secondary
breakdown
Drain side
ID=VDS/RDS(ON)
R6020EN:RDS(ON)=170mΩ
Ex.
0.588A=0.1V/170mΩ
5.88A=1V/170mΩ
Ta=25℃
Single Pulse
Limited by VDSS
・Temperature derating is required when the chip temperature is raised by self heating or the
ambient temperature is more than 25℃ because the SOA temperature condition is just 25℃.
Thermal
limited area Derating for max current
due to Ron raise
Secondary
breakdowm
area
Derated
Derated SOA line at 25℃
Derated SOA line
SOA Derating
・”Within the rated power at ambient temperature” means that the chip temperature is
less than 150℃ as the abs max rating.
・The rated power is defined as the power at 150℃ of chip temperature.
・Basically average power is that a value divided the integral of the product of current and
voltage with time by time.
Voltage
Current
Voltage loss at ON
(Ron, VCE(SAT))
ON period OFF
Period: T
ID:5A/div 100ns/ Sum of the integral (E) of each period from OFF
div
VDS:100V/div to ON to OFF and divide it by a period (T), them
VGS:5V/div
Power
the average power dissipation can be derived.
200ns/
ID:5A/div div
VDS:100V/div
VGS:5V/div
Power
Heat
Heat
Chip Ambient
: Case temperature Radiate to Chip
Temp
ambient
: Junction to case thermal resistance
: Power dissipation
Package Heat Sink
・Rth(j-c) is originally used for through-hole devices like TO-220 mounting on a heat sink.
・In this case, Tj can be precisely calculated to measure Tc at a main radiation path between
case to heat sink.
・Assuming to use an ideal heat sink (infinite heat sink), calculating with conditions such as
Tc=Ta=25℃ will be available.
・Thermal resistance of infinite heat sink: Rth(c-a)=0, therefore, Rth(j-a)=Rth(j-c).
• Si Diodes
• Si Transistors
• Criteria for Selecting a Transistor
• Application Examples Utilizing the Merits
• Active PFCs
- 2 types of PFC control mode (BCM/CCM)
- Efficiency improvement of BCM circuit
- Efficiency improvement of CCM circuit
- Reference: Interleave scheme
• LED lighting system: Efficiency Comparison by
MOSFETs
• Utilizing merits of the Hybrid MOS
MOSFET or
IGBT
Interleaved PFC
D7
FRD or SiC diode
47u D1
10m
L1 R13 SCS210AM
D2
Iin
R6007ENX Vo
BD8693 beta DRF051VA1S 10
VDD VDD1 U2
Vin VOUT 470 R10
MOSFET or IGBT
GNDNC1 D9
Q1
18 NC3 NC2 R6
V4 15k
D3
R15
V3
3.3Meg 125
R8 C4 R2
637k 560u IC=200
C6 R1
100n IC=100
D4 47m
R9
PFC CCM 200kHz
Iref Vcs1 U3
VOUT
REF 1e6
150k GND 2SK3018 LAP1
R7
D5
Q11
33k
R3
1T 5
R11 22k V1
R12
D1
10m
L1 R2 SCS210AM
10m
L2 R13
D7
D2 Vo
SCS210AM
BD8693 beta R6015ENX
DRB160M-30
VDD VDD1 U2
Vin VOUT R10
GNDNC1 D9
Q1
15 NC3 NC2 R6
V4 15k
D3
R15
5 Sine(0 141.421 50 0 0)
V3 3.3Meg
R8 R6015ENX C4 125
D4 637k 470u IC=250 R12
R1
82m
R9 Q6
C6
100n PFC inter
Iref Vcs1 U1
VOUT
REF
GND
Vcs2
VOUT2
150k
R7 13k
R3
1T
R11 DRB160M-30
D5 BD8693 beta
VDD VDD1 U3 R4
Vin VOUT D8
GNDNC1 R5
NC3 NC2 82m
15k R26
R31
MOSFET or IGBT
Current Current
Interleaved
BCM
CCM
BCM
Interleaved
CCM
P1
D1
Icoil 50m 390V
Vo
2Meg R5
R7
S1
V1 D3 C3 22k TX1
R12 D6
D4
C4 540k
3.3u R15 10k
R9 C2 1.6k
D5 C1
L6562A beta 154u IC=384 R1
1u IC=0
INV VCC U1 10
COMPGD
MULTGND R13 Q1
CS ZCD 10k 2.325Meg
R4 R11
15k
R2 1K 47m 15k
C5 R8 R3 R10
22u
100
R6
2.5V LAP1
1
NOTE:
Information here is just for you reference and you can use.
Actual evaluation and testing for products and circuits must be done on your own responsibility, if any product in this reference document is adopted to your design.
Regarding use of information here, ROHM shall have no liability for any damage of any kind including injures to any parties.
5
Icoil / A/ A
4
3
Icoil
2
1
0
-1
/ W/ W
50
40
(D1)
Power(D1)
30
20
Power
10
385 -1.057443
384
Vo Vo/ /VV
383 383.12296
382 382.06551
381
2 4 6 8 10 12 14 16
REF A
Time/mSecs 2mSecs/div
NOTE:
Information here is just for you reference and you can use.
Actual evaluation and testing for products and circuits must be done on your own responsibility, if any product in this reference document is adopted to your design.
Regarding use of information here, ROHM shall have no liability for any damage of any kind including injures to any parties.
2
-1
Power (D1) / W
40
20
0
386
384
Vo / V
382
380
2 4 6 8 10 12 14 16 18
Time/mSecs 2mSecs/div
NOTE:
Information here is just for you reference and you can use.
Actual evaluation and testing for products and circuits must be done on your own responsibility, if any product in this reference document is adopted to your design.
Regarding use of information here, ROHM shall have no liability for any damage of any kind including injures to any parties.
Trr(ns)
in case that a low VF FRD is used
for CCM
Conditions:
CCM
連続モード Po=300W swF=200kHz Vin=115Vrms Vo=390V
Diode Characteristics and Efficiency
Io (A) VF (V) trr (ns) Efficiency (%)
RFNL10TJ6S 10 1.1 100 89.10
RFV8TG6S 8 2.3 25 93.59
RFVS8TG6S 8 2.5 20 93.87
For CCM, Choosing a FRD with faster trr is significant to improve efficiency.
5
Affects of FRD Trr
Current(A)
0
I diode / A
-5
FRD
-10
-15
-20
Current(A)
20
Affects of FRD Trr
MOSFET
make losses at
I mosfet / A
15
10 MOSFET on increase
5
-0
4.12 4.13 4.14 4.15 4.16 4.17 4.18
Time/mSecs 10uSecs/div
Iin
D2
47u
L1
10m
R13
D1
SCS210AM
General PFC
Vo
R6024ENX
BD8693 beta R6007ENX
DRF051VA1S 10
VDD VDD1 U2
Vin VOUT 470 R10
GNDNC1 D9
Q1
18 NC3 NC2 R6
600V 24A
V4 15k
D3
MOSFET Loss
R15
V3
3.3Meg 125
R8 C4 R2
Rds(on) = 0.15Ω
637k 560u IC=200
13.5W
C6 R1
100n IC=100
D4 47m
R9
PFC CCM 200kHz
Iref Vcs1 U3
VOUT
REF 1e6
150k GND 2SK3018 LAP1
R7
D5
Q11
33k
R3
1T 5
R11 22k V1
R12
D6
Interleaved PFC
D1
10m
L1 R2 SCS210AM
10m
L2 R13
D7
R6015ENX x 2
D2 Vo
SCS210AM
BD8693 beta R6015ENX
DRB160M-30
VDD VDD1 U2
Vin VOUT R10
600V 15A
GNDNC1 D9
Q1
MOSFET Loss
15 NC3 NC2 R6
V4 15k
D3
R15
5 Sine(0 141.421 50 0 0)
V3 3.3Meg
R5207AND
L1 Q2 L3 L2
L4 R7
RG 100Ω
C4 C5
LED
TX1 D2
S1
R5207AND
C1 C3
Q1
P1
R5 R4 100 R2
R3
D3
C2
510m
R1
R6
R5207 R6004(RG=50Ω)
VDSS ID Rds(on) Qg R6004 R6004(RG=50Ω)
(V) (A) (Ω) (nC) R6007 R6007(RG=50Ω)
R5207 R6007(RG=50Ω)
Original 600 6.2 0.68 12
R5207
R5207AND 525 7 0.78 13 R6004(RG=100Ω)
R6007
R6004END 600 4 0.9 15 R5207(RG=100Ω)
R6004
R6007END3 600 7 0.57 20 R5207(RG=100Ω)
R5207
R6007(RG=100Ω)
Replace MOSFET with each of above.
Comparison of efficiency and noise with
changing RG value.
Input: Input:
100VAC 200VAC
Efficiency of Each SJ MOSFET
PFC Original R6004END R6007END3 R5207AND R5207AND R5207AND R5207AND R6004END R6007END3
Original R5207AND R5207AND R6004END R6007END3 R6004END R6007END3 R6004END R6007END3
DC/DC
(RG=100Ω) (RG=100Ω) (RG=100Ω) (RG=100Ω) (RG=100Ω) (RG=50Ω) (RG=50Ω) (RG=50Ω) (RG=50Ω)
Vin(rms) (V) Efficiency (%)
84.7 83.48 83.39 83.68 83.71 83.29 84.49 84.33 84.40 84.44
99.8 84.05 83.93 84.10 84.19 83.77 84.96 84.82 84.90 84.94
114.8 84.33 84.26 84.37 84.47 84.05 85.32 85.11 85.20 85.17
199.7 84.31 84.15 84.10 84.35 83.97 85.12 84.95 85.08 84.99
219.7 83.86 83.71 83.64 83.87 83.50 84.63 84.47 84.56 84.51
229.7 83.50 83.40 83.53 83.53 83.19 84.37 84.15 84.29 84.26
241.7 83.14 83.05 82.99 83.16 82.81 83.95 83.74 83.90 83.89
Larger RG was used to the original circuit for noise reduction. R6004END can use smaller RG and
the efficiency was improved as the result.
Original R6004END
R5207AND
1.03us 1.18us
R5207AND
1.12us
192ns 184ns
R5207AND
184ns
R5207AND R6004END
RG=100Ω RG=50Ω
105ns 99ns
R5207AND R6004END
RG=100Ω RG=50Ω
116ns 94ns
Original R6004END
RG=100Ω RG=100Ω
100ns
79ns
R5207AND R6004END
RG=100Ω RG=50Ω
94ns 76ns
D1
L1
AC200V~265V 340V
L2
BD8693 beta D6
D2 VDD VDD1 U2 Vo
10
Vin VOUT
GNDNC1 R4 Q1
d1n4007 NC3 NC2 15k
R15 C3
1u
d1n4007 18 10m
BD8693 beta 510m
V4 R13
VDD VDD1 U3 10 R14
D3 Vin VOUT
5 Sine(0 282.843 50 0 0) GNDNC1 R5 Q6 R2
V3 R8 NC3 NC2
D4 R1 C5
1u
1K
d1n4007 10m 15k C4
R18
C6 R9 R31 510m
100n PFC inter R17
Iref Vcs1 U1
VOUT
REF
GND 1K
Vcs2
VOUT2 R19
R7
10m R3
C1 C8 R26
330p 330p
D5
d1n4007
PFC Control IC
Interleaved CCM
Company A Company A
FRD FRD
Conditions:
200V
60Hz Reduced 4W
Vo=340V at 1kW
fsw=35kHz
Loss (W)
L=200μH
Diode:SCS112AM
Efficiency (W)
Po(W) IGBT R6035GN Reduction(W)
改善量(W)
500 15.86 12.54 3.32
750 22.37 18.64 3.73
1000 30.26 26.28 3.97
1500 44.56 41.13 3.43
Output Power (W)
• Lower loss at on
• Faster switching
Efficiency Comparison
Original
Efficiency (%)
Efficiency
Circuit
効
率
HybridMOS HybridMOS
Original SJ MOS+FRD +FRD +SiC SBD
Si Diodes Si Transistors