Application Report

SLUA734A – March 2015 – Revised March 2015

bq40zxx Manufacture, Production, and Calibration

Thomas Cosby

ABSTRACT
This application note details manufacture testing, cell voltage calibration, BAT voltage calibration, PACK
voltage calibration, current calibration (CC), and temperature calibration for the bq40zxx devices.

Contents
1 Manufacture Testing ......................................................................................................... 1
2 Calibration .................................................................................................................... 2
2.1 Cell Voltage Calibration ............................................................................................ 3
2.2 BAT Voltage Calibration ........................................................................................... 4
2.3 PACK Voltage Calibration ......................................................................................... 5
2.4 Current Calibration.................................................................................................. 6
2.5 Temperature Calibration ........................................................................................... 9

1 Manufacture Testing
To improve the manufacture testing flow, the gas gauge device allows certain features to be toggled on or
off through ManufacturerAccess() commands. For example, the PRE-CHG FET(), CHG FET(), DS FET(),
Lifetime Data Collection(), Calibration() features. Enabling only the feature under test can simplify the test
flow in production by avoiding any feature interference. These toggling commands will only set the RAM
data, meaning the conditions set by the these commands will be cleared if a reset or seal is issued to the
gauge. The ManufacturingStatus() keeps track of the status (enabled or disabled) of each feature.
The data flash ManufacturingStatus provides the option to enable or disable individual features for normal
operation. Upon a reset or a seal command, the ManufacturingStatus() will be re-loaded from data flash
ManufacturingStatus(). This also means if an update is made to ManufacturingStatus() to enable or
disable a feature, the gauge will only take the new setting if a reset or seal command is sent.

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2 Calibration
The device has integrated routines that support calibration of current, voltage, and temperature readings,
accessible after writing 0xF081 or 0xF082 to ManufacturerAccess() when the ManufacturingStatus()[CAL]
bit is ON. While the calibration is active, the raw ADC data is available on ManufacturerData(). The device
stops reporting calibration data on ManufacturerData() if any other MAC commands are sent or the device
is reset or sealed.

NOTE: The ManufacturingStatus())[CAL] bit must be turned OFF after calibration is completed. This
bit is cleared at reset or after sealing.

ManufacturerAccess() Description
0x002D Enables/Disables ManufacturingStatus() [CAL]
0xF080 Disables raw ADC data output on ManufacturerData()
0xF081 Outputs raw ADC data of voltage, current, and temperature on ManufacturerData()
0xF082 Outputs raw ADC data of voltage, current, and temperature on ManufacturerData(). This mode
enables an internal short on the coulomb counter inputs (SRP, SRN).

The ManufacturerData() output format is: ZZYYaaAAbbBBccCCddDDeeEEffFFggGGhhHHiiIIjjJJkkKK,

where:

Value Format Description

ZZ byte 8-bit counter, increments when raw ADC values are refreshed (every 250 ms)
YY byte Output status
ManufacturerAccess() = 0xF081: 1
ManufacturerAccess() = 0xF082: 2
AAaa 2's comp Current (coulomb counter)
BBbb 2's comp Cell voltage 1
CCcc 2's comp Cell voltage 2
DDdd 2's comp Cell voltage 3
EEee 2's comp Cell voltage 4
FFff 2's comp PACK voltage
Value Format Description
GGgg 2's comp BAT Voltage
HHhh 2's comp Cell current 1
IIii 2's comp Cell current 2
JJjj 2's comp Cell current 3
KKkk 2's comp Cell current 4

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2.1 Cell Voltage Calibration

Figure 1 illustrates cell voltage calibration.

VC4

RVC

VCELL4

VC3

RVC

VCELL3

VC2

RVC

VCELL2

VC1

RVC
VCELL1

VSS

Figure 1. Cell Voltage Calibration

1. Apply known voltages in mV to the cell voltage inputs:

• VCELL1 between VC1 pin and VSS pin
• VCELL2 between VC2 pin and VC1 pin
• VCELL3 between VC3 pin and VC2 pin
• VCELL4 between VC4 pin and VC3 pin
2. If ManufacturerStatus()[CAL] = 0, send 0x002D to ManufacturerAccess() to enable the [CAL] flag.
3. Send 0xF081 or 0xF082 to ManufacturerAccess() to enable raw cell voltage output on
ManufacturerData().
4. Poll ManufacturerData() until the 8-bit counter value increments by 2 before reading data.
5. Read the ADC conversion readings of cell voltages from ManufacturerData():
ADCCELL1 = BBbb of ManufacturerData()
Is ADCCELL1 < 0x8000? If yes, use ADCCELL1; otherwise, ADCCELL1 = –(0xFFFF – BBbb + 0x0001).
6. Average several readings for higher accuracy. Poll ManufacturerData() until ZZ increments, to indicate
that updated values are available:
ADCCELL1 = [ADCCELL1(reading n) + … + ADCCELL1(reading 1)]/n
7. Calculate gain value:
VCELL1
Cell Gain = ´ 216
ADCCELL1 (1)
8. Write the new Cell Gain value to data flash.
9. Re-check voltage readings and if they are not accurate, repeat steps 4 – 6.
10. Send 0x002D to ManufacturerAccess() to clear the [CAL] flag if all calibration is complete.

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2.2 BAT Voltage Calibration

BAT Voltage Calibration is shown in Figure 2.

BAT

VBAT

VSS

Figure 2. BAT Voltage Calibration

1. Apply known voltages in mV to the voltage input:

• VBAT between VC4 pin and VSS pin
2. If ManufacturerStatus()[CAL] = 0, send 0x002D to ManufacturerAccess() to enable the [CAL] flag.
3. Send 0xF081 or 0xF082 to ManufacturerAccess() to enable raw cell voltage output on
ManufacturerData().
4. Poll ManufacturerData() until the 8-bit counter value increments by 2 before reading data.
5. Read ADC conversion readings of cell stack voltage from ManufacturerData():
• ADCBAT = GGgg of ManufacturerData(),
6. Average several readings for higher accuracy. Poll ManufacturerData() until ZZ increments to indicate
that updated values are available:
• ADCBAT = [ADCBAT(reading n) + … + ADCBAT(reading 1)]/n
7. Calculate gain value:
VBAT
BAT Gain = ´ 216
ADCBAT (2)
8. Write the new BAT Gain value to data flash.
9. Re-check voltage readings and if they are not accurate, repeat steps 4 – 6.
10. Send 0x002D to ManufacturerAccess() to clear the [CAL] flag if all calibration is complete.

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2.3 PACK Voltage Calibration

PACK voltage calibration is illustrated in Figure 3.

PACK

VPACK
VSS

Figure 3. PACK Voltage Calibration

1. Apply known voltages in mV to the voltage input:

• VPACK between PACK pin and VSS pin
2. If ManufacturerStatus()[CAL] = 0, send 0x002D to ManufacturerAccess() to enable the [CAL] flag.
3. Send 0xF081 or 0xF082 to ManufacturerAccess() to enable raw cell voltage output on
ManufacturerData().
4. Poll ManufacturerData() until the 8-bit counter value increments by 2 before reading data.
5. Read ADC conversion readings of pack voltage from ManufacturerData() :
• ADCPACK = FFff of ManufacturerData()
6. Average several readings for higher accuracy. Poll ManufacturerData() until ZZ increments to indicate
that updated values are available:
• ADCPACK = [ADCPACK(reading n) + … + ADCPACK(reading 1)]/n
7. Calculate gain value:
VPACK
PACK Gain = ´ 216
ADCPACK (3)
8. Write the new PACK Gain value to data flash.
9. Re-check voltage readings and if they are not accurate, repeat steps 4 – 6.
10. Send 0x002D to ManufacturerAccess() to clear the [CAL] flag if all calibration is complete.

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2.4 Current Calibration

A diagram of current calibration is shown in Figure 4.

VCC

SRP SRN

ICC

Figure 4. Current Calibration

2.4.1 CC Offset Calibration

NOTE: Due to hardware improvements in this device, CC Offset calibration is not necessary. Only
run the CC Offset Calibration procedure if current is observed when no current should be
present.

1. Apply a known current of 0 mA, and ensure no current is flowing through the sense resistor connected
between the SRP and SRN pins.
2. If ManufacturerStatus()[CAL] = 0, send 0x002D to ManufacturerAccess() to enable the [CAL] flag.
3. Send 0xF082 to ManufacturerAccess() to enable raw cell voltage output on ManufacturerData().
4. Poll ManufacturerData() until ZZ increments by 2 before reading data.
5. Obtain the ADC conversion readings of current from ManufacturerData():
• ADCCC = AAaa of ManufacturerData()
Is ADCCC < 0x8000? If yes, use ADCCC; otherwise, ADCCC = –(0xFFFF – AAaa + 0x0001).
6. Average several readings for higher accuracy. Poll ManufacturerData() until ZZ increments to indicate
that updated values are available:
• ADCCC = [ADCCC(reading n) + … + ADCCC(reading 1)]/n
7. Read Coulomb Counter Offset Samples from data flash.
8. Calculate offset value:
• CC offset = ADCCC × (Coulomb Counter Offset Samples)
9. Write the new CC Offset value to data flash.
10. Re-check the current reading and if it is not accurate, repeat steps 1 – 10.
11. Send 0x002D to ManufacturerAccess() to clear the [CAL] flag if all calibration is complete.

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2.4.2 Board Offset Calibration

NOTE: Due to hardware improvements in this device, Board Offset calibration is not necessary.
Only run the Board Offset Calibration procedure if board offset current is observed.

1. Ensure that Offset Calibration was performed first.

2. Apply a known current of 0 mA, and ensure no current is flowing through the sense resistor connected
between the SRP and SRN pins.
3. If ManufacturerStatus()[CAL] = 0, send 0x002D to ManufacturerAccess() to enable the [CAL] flag.
4. Send 0xF081 to ManufacturerAccess() to enable raw cell voltage output on ManufacturerData().
5. Poll ManufacturerData() until ZZ increments by 2 before reading data.
6. Obtain the ADC conversion readings of current from ManufacturerData():
• ADCCC = AAaa of ManufacturerData()
Is ADCCC < 0x8000? If yes, use ADCCC; otherwise, ADCCC = –(0xFFFF – AAaa + 0x0001).
7. Average several readings for higher accuracy. Poll ManufacturerData() until ZZ increments to indicate
that updated values are available:
• ADCCC = [ADCCC(reading n) + … + ADCCC(reading 1)]/n
8. Read Coulomb Counter Offset Samples from data flash.
9. Calculate offset value:
• Board offset = (ADCCC – CC Offset) × Coulomb Counter Offset Samples
10. Write the new Board Offset value to data flash.
11. Re-check the current reading. If the reading is not accurate, repeat steps 1 – 10.
12. Send 0x002D to ManufacturerAccess() to clear the [CAL] flag if all calibration is complete.

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2.4.3 CC Gain/Capacity Gain Calibration

1. Apply a known current (typically 1 A to 2 A), and ensure ICC is flowing through the sense resistor
connected between the SRP and SRN pins.
2. If ManufacturerStatus()[CAL] = 0, send 0x002D to ManufacturerAccess() to enable the [CAL] flag.
3. Send 0xF081 to ManufacturerAccess() to enable raw CC output on ManufacturerData().
4. Poll ManufacturerData() until ZZ increments by 2 before reading data.
5. Read the ADC conversion readings of current from ManufacturerData():
• ADCCC = AAaa of ManufacturerData()
Is ADCCC < 0x8000? If yes, use ADCCC; otherwise, ADCCC = –(0xFFFF – AAaa + 0x0001).
6. Average several readings for higher accuracy. Poll ManufacturerData() until ZZ increments to indicate
that updated values are available:
• ADCCC = [ADCCC(reading n) + … + ADCCC(reading 1)]/n
7. Read Coulomb Counter Offset Samples from data flash.
8. Calculate gain values:
ICC
CC Gain =
Board Offset + CC Offset
ADCCC -
Coulomb Counter Offset Samples

Capacity Gain = CC Gain ´ 298261.6178 (4)

9. Write the new CC Gain and Capacity Gain values to data flash.
10. Re-check the current reading. If the reading is not accurate, repeat steps 1 – 9.
11. Send 0x002D to ManufacturerAccess() to clear the [CAL] flag if all calibration is complete.

NOTE: There is a conversion factor for CC Gain and Capacity Gain parameters entered in bqStudio.

Name Data Type Data Flash Default bqStudio Default DF-to-Studio Conversion
CC Gain F4 3.58422 1.036 3.714528/DF
Capacity Gain F4 1069035.256 1.036 1107901.13/DF

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2.5 Temperature Calibration

Figure 5 illustrates temperature calibration.

TSx

VTSx
VSS

Figure 5. Temperature Calibration

2.5.1 Internal Temperature Sensor Calibration

1. Apply a known temperature in 0.1°C, and ensure that temperature TempTINT is applied to the device.
2. Read the TINT offsetold from Internal Temp Offset.
3. Read the reported temperature from DAStatus2():
• TINT = AAaa of DAStatus2()
Is TINT > 0? If yes, TINT = AAaa – 2732.
4. Calculate temperature offset:
TINT offset = TEMPTINT – TINT + TINT offsetold (5)
5. Write the new Internal Temp Offset value to data flash.
6. Re-check the DAStatus2() reading. If the reading is not accurate, repeat steps 1 – 5.

2.5.2 TS1–TS2–TS3–TS4 Calibration

1. Apply a known temperature in 0.1°C, and ensure that temperature TEMPTSx is applied to the thermistor
connected to the TSx pin. "TSx" refers to TS1, TS2, TS3, or TS4, whichever is applicable.
2. Read the TSx offsetold from External x Temp Offset, where x is 1, 2 ,3, or 4.
3. Read the appropriate temperature from the DAStatus2() block as TSx.
4. Calculate the temperature offset:
TSx offset = TEMPTSx – TSx + TSx offsetold (6)
Where x is 1, 2, 3, or 4.
5. Write the new External x Temp Offset (where x is 1, 2, 3, or 4) value to data flash.
6. Re-check the DAStatus2() reading. If the reading is not accurate, repeat steps 1 – 5.

Revision History

Changes from Original (March 2015) to A Revision ....................................................................................................... Page

• Added '+' sign to value of ADCCELL1 in number 5 in the Cell Voltage Calibration section. ....................................... 3
• Deleted factor 'VCELL1' from Equation 1. ................................................................................................. 3
• Added ' + J +' to '…' in step 6 of BAT Voltage Calibration section.................................................................. 4
• Changed ' + J +' to '…' in number 6 in the PACK Voltage Calibration section. ................................................... 5

NOTE: Page numbers for previous revisions may differ from page numbers in the current version.

SLUA734A – March 2015 – Revised March 2015 Revision History 9

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