Expirement - 1: Name-Dev Summi SAP ID-1000014710 ROLL NO. - 200103900
Expirement - 1: Name-Dev Summi SAP ID-1000014710 ROLL NO. - 200103900
NAME-DEV SUMMI
SAP ID- 1000014710
ROLL NO.- 200103900
•
• AIM- To Study VI Charecterstics of a diode
• THEORY –
Structure of P-N junction diode
The diode is a device formed from a junction of n-type and p-type semiconductor material.
The lead connected to the p-type material is called the anode and the lead connected to the n-
type material is the cathode. In general, the cathode of a diode is marked by a solid line on
the diode.
Figurer:1
The positive terminal of battery is connected to the N side(cathode) and the negative terminal
of battery is connected to the P side(anode) of a diode, the 'holes' in the p-type material are
pulled away from the junction, leaving behind charged ions and causing the width of the
depletion region to increase. Likewise, because the n-type region is connected to the positive
terminal, the electrons will also be pulled away from the junction, with similar effect. This
increases the voltage barrier causing a high resistance to the flow of charge carriers, thus
allowing minimal electric current to cross the p–n junction. The increase in resistance of the
p–n junction results in the junction behaving as an insulator.
The strength of the depletion zone electric field increases as the reverse-bias voltage increases.
Once the electric field intensity increases beyond a critical level, the p–n junction depletion
zone breaks down and current begins to flow, usually by either the Zener or the avalanche
breakdown processes. Both of these breakdown processes are non-destructive and are
reversible, as long as the amount of current flowing does not reach levels that cause the
semiconductor material to overheat and cause thermal damage.
In reverse biasing, the positive terminal of battery is connected to the N side and the negative
terminal of battery is connected to the P side of a diode. In reverse biasing, the diode does not
conduct electricity, since reverse biasing leads to an increase in the depletion region width;
hence current carrier charges find it more difficult to overcome the barrier potential. The diode
will act like an open switch and there is no current flow.
Diode Equation
In the forward-biased and reversed-biased regions, the current (IfIf), and the voltage (VfVf),
of a semiconductor diode are related by the diode equation:
If=Is×(expVfn×VT−1)If=Is×(expVfn×VT−1)
where,
IsIs is reverse saturation current or leakage current,
IfIf is current through the diode(forward current),
VfVf is potential difference across the diode terminals(forward voltage)
VTVT is thermal voltage, given by
VT=k×TqVT=k×Tq
and
k is Boltzmann’s constant = 1.38x10−23 J /°Kelvin,
q is the electronic charge = 1.6x10−19 joules/volt(Coulombs),
T is the absolute temperature in °Kelvin(°K = 273 + temperature in °C),
At room temperature (25 °C), the thermal voltage is about 25.7 mV,
n is an empirical constant between 0.5 and 2
The empirical constant, n, is a number that can vary according to the voltage and current
levels. It depends on electron drift, diffusion, and carrier recombination in the depletion
region. Among the quantities affecting the value of n are the diode manufacture, levels of
doping and purity of materials.
PROCEDURE
• Forward Bias-Si Diode
1. Set DC voltage to 0.2 V .
2. Select the diode.
3. Set the resistor.
4. Voltmeter is placed parallel to Silicon diode and ammeter series with resistor.
5. The positive side of battery to the P side(anode) and the negative of battery to
the N side(cathode) of the diode.
6. Now vary the voltage upto 5V and note the Voltmeter and Ammeter reading for
particular DC voltage .
7. Take the readings and note Voltmeter reading across Silicon diode and
Ammeter reading.
8. Plot the V-I graph and observe the change.
9. Calculate the dynamic resistance of the diode. rd=ΔV/ΔI
10.Therefore from the graph we see that the diode starts conducting when the
forward bias voltage exceeds around 0.6 volts (for Si diode). This voltage is
called cut-in voltage.
SIMULATION
2/11/2021 Forward Biased-Silicon Diode
2 0.526 0.155 0 2
3 0.529 0.232 V 0.574
4 0.535 0.387
5 0.539 0.542 Print It Check for Reverse Bias
6 0.541 0.619
7 0.543 0.696
8 0.546 0.851 VDC 5
9 0.550 1.08
10 0.553 1.24
11 0.555 1.39
12 0.558 1.63
13 0.561 1.86
14 0.563 2.09
15 0.565 2.24
GRAPH PLOT
Print
vlabs.iitkgp.ernet.in/be/exp5/forwardbiaseddiode_si.html 1/1
2/11/2021 Forward Biased-Silicon Diode
4.61
Select Diode: 1N4001
7 8
EXPERIMENTAL TABLE DC volt :
Resistance :
3 4 1
Serial Forward Forward 10
954
No. Voltage(Volt) Current(mAmp) 0 2
1 0 0 Add to Table Plot
2 0.531 0.105 5 6
3 0.534 0.210 0.582
4 0.543 0.524
Check
5 0.549 0.838 connection
11
6 0.554 1.15
7 0.557 1.36 Print It Check for
1 9
8 0.561 1.68 5
9 0.564 1.99 12
10 0.567 2.31
11 0.569 2.62
12 0.572 2.93
13 0.574 3.25
14 0.576 3.56
15 0.578 3.88
GRAPH PLOT
Print
vlabs.iitkgp.ernet.in/be/exp5/forwardbiaseddiode_si_ver1.html 1/1
2/11/2021 Reverse Biased
2 1.57 0.100 0 2
3 3.17 0.100 V 29.0
4 4.80 0.100
5 6.31 0.100 Print It
6 7.97 0.100
7 9.54 0.100
8 11.2 0.100 VDC 30.2
9 13.2 0.100
10 14.9 0.100
11 16.6 0.100
12 18.2 0.100
13 19.9 0.100
14 21.3 0.100
15 23.2 0.100
GRAPH PLOT
Print
vlabs.iitkgp.ernet.in/be/exp5/reversebiaseddiode_si.html 1/1
2/11/2021 Reverse Biased
GRAPH PLOT
Print
vlabs.iitkgp.ernet.in/be/exp5/reversebiaseddiode_si_ver1.html 1/1
2/11/2021 Forward Biased-Ge Diode
2 0.278 1.60 0 2
3 0.288 3.95 V 0.314
4 0.294 6.15
5 0.297 7.75 Print It
6 0.300 10.1
7 0.303 12.5
8 0.305 14.6 VDC 29.85
9 0.307 17.1
10 0.308 19.1
11 0.309 20.8
12 0.310 23.3
13 0.312 25.3
14 0.314 29.6
GRAPH PLOT
Print
vlabs.iitkgp.ernet.in/be/exp5/diodefrwge.html 1/1
2/11/2021 Reverse Biased-Ge Diode
2 2.20 0 0 2
3 4.50 0 V 30.0
4 6.30 0
5 7.90 0 Print It
6 10.1 0
7 11.7 0
8 13.4 0 VDC 30
9 14.9 0
10 16.8 0
11 18.9 0
12 20.9 0
13 22.9 0
14 25.6 0
15 27.9 0
GRAPH PLOT
Print
vlabs.iitkgp.ernet.in/be/exp5/dioderevrge.html 1/1
RESULT
The study has been successfully completed.